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www.ChineseStandard.net Database: 189760 (17 Jan 2026)
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Chinese National Standard: GB/T

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Std ID Description (Standard Title) Detail
GB/T 6711-1986 Method of the determination for the aqueous content of sodium ferrocyanide GB/T 6711-1986
GB/T 3050-1982 Inorganic chemical products for industrial use--General method for determination of chloride content--Potentiometric method GB/T 3050-1982
GB/T 3051-1982 Inorganic chemical products for industrial use--General method for determination of chloride content--Mercurimetric method GB/T 3051-1982
GB/T 45233-2025 Guidelines for comprehensive safety risk assessment of chemical industry park GB/T 45233-2025
GB/T 35925-2018 Determination of Impurity Fluorine Ion in Water Soluble Chemicals - Ion Chromatography Method GB/T 35925-2018
GB/T 21279-2007 Hydraulic test method for packaging of dangerous chemical products GB/T 21279-2007
GB/T 21280-2007 Test method of thermal stability for dangerous products GB/T 21280-2007
GB/T 21281-2007 Test method of fish acute toxicity for dangerous chemical products GB/T 21281-2007
GB/T 15956-2008 Calcium carbide steel drum for repeated use GB/T 15956-2008
GB/T 26571-2011 Specification for the shelf life of a specialty gas GB/T 26571-2011
GB/T 15956-1995 Calcium carbide steel drum for the home market GB/T 15956-1995
GB/T 40640.1-2021 Informationalized management of chemicals - Part 1: Data exchange GB/T 40640.1-2021
GB/T 40640.2-2021 Informationalized management of chemicals - Part 2: Information security GB/T 40640.2-2021
GB/T 40640.4-2021 Informationalized management of chemicals - Part 4: General specification for chemicals positioning system GB/T 40640.4-2021
GB/T 40640.5-2021 Informationalized management of chemicals - Part 5: Chemicals data center GB/T 40640.5-2021
GB/T 40640.3-2021 Informationalized management of chemicals - Part 3: Electronic label application GB/T 40640.3-2021
GB/T 14666-2025 Terms for analytical chemistry GB/T 14666-2025
GB/T 20725-2025 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry GB/T 20725-2025
GB/T 45459-2025 Microbeam analysis - Focused ion beam - Preparation of TEM specimens GB/T 45459-2025
GB/T 45468-2025 Microbeam analysis - FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample GB/T 45468-2025
GB/T 45469-2025 Microbeam analysis - Transmission electron microscopy - Preparation methods of ultrathin section of polymer composites GB/T 45469-2025
GB/T 28634-2025 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy GB/T 28634-2025
GB/T 19500-2025 Surface chemical analysis - General rules for X-ray photoelectron spectroscopic analysis method GB/T 19500-2025
GB/T 20175-2025 Surface chemical analysis - Sputter depth profiling - Optimization using layered systems as reference materials GB/T 20175-2025
GB/T 20176-2025 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials GB/T 20176-2025
GB/T 32996-2025 Surface chemical analysis - Analysis of metal oxide films by glow discharge optical emission spectrometry GB/T 32996-2025
GB/T 42658.3-2025 Surface chemical analysis - Sample handling, preparation and mounting - Part 3: Biomaterials GB/T 42658.3-2025
GB/T 45768-2025 Surface chemical analysis - Secondary ion mass spectrometry - Linearity of intensity scale in single ion counting time-of-flight mass analysers GB/T 45768-2025
GB/T 45769-2025 Surface chemical analysis - X-ray photoelectron spectroscopy - Estimating and reporting detection limits for elements in homogeneous materials GB/T 45769-2025
GB/T 45770-2025 Surface chemical analysis - Atomic force microscopy - Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement GB/T 45770-2025
GB/T 45772-2025 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy GB/T 45772-2025
GB/T 45773-2025 Surface chemical analysis - Near real-time information from the X-ray photoelectron spectroscopy survey scan - Rules for identification of, and correction for, surface contamination by carbon-containing compounds GB/T 45773-2025
GB/T 46057-2025 Microbeam analysis - Scanning electron microscopy - Method for evaluating critical dimensions by CD-SEM GB/T 46057-2025
GB/T 28892-2024 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters GB/T 28892-2024
GB/T 28893-2024 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results GB/T 28893-2024
GB/T 43661-2024 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes(ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes GB/T 43661-2024
GB/T 43663-2024 Surface chemical analysis - Secondary-ion mass spectrometry - Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry GB/T 43663-2024
GB/T 44007-2024 Nanotechnologies - Measurement of the hydrogen storage capacity of nanoporous materials - Gas adsorption method GB/T 44007-2024
GB/T 25187-2024 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters GB/T 25187-2024
GB/T 9008-2024 Terms for liquid chromatography GB/T 9008-2024
GB/T 42310-2023 Nanotechnology - Measurement for specific surface area of graphene powder - Static volumetric method by argon gas adsorption GB/T 42310-2023
GB/T 42360-2023 Surface chemical analysis - Total reflection X-ray fluorescence analysis of water GB/T 42360-2023
GB/T 22461.2-2023 Surface chemical analysis - Vocabulary - Part 2: Terms used in scanning probe microscopy GB/T 22461.2-2023
GB/T 42518-2023 Bismuth germinate (BGO) crystal - Chemical analysis of trace elements - Glow discharge mass spectrometry GB/T 42518-2023
GB/T 42543-2023 Surface chemical analysis - Scanning probe microscopy - Determination of cantilever normal spring constants GB/T 42543-2023
GB/T 22461.1-2023 Surface chemical analysis - Vocabulary - Part 1: General terms and terms used in spectroscopy GB/T 22461.1-2023
GB/T 42658.4-2023 Surface chemical analysis - Guidelines to sample handling, preparation and mounting - Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis GB/T 42658.4-2023
GB/T 42659-2023 Surface chemical analysis - Scanning probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems GB/T 42659-2023
GB/T 43088-2023 Microbeam analysis - Analytical electron microscopy - Measurement of the dislocation density in thin metals GB/T 43088-2023
GB/T 19502-2023 Surface chemical analysis - General rules for glow discharge optical emission spectrometry(GD-OES) GB/T 19502-2023
GB/T 6488-2022 Liquid chemicals - Determination of refractive index GB/T 6488-2022
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon GB/T 40109-2021
GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy GB/T 40110-2021
GB/T 40128-2021 Surface chemical analysis - Atomic force microscopy - Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets GB/T 40128-2021
GB/T 40129-2021 Surface chemical analysis - Secondary ion mass spectrometry - Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer GB/T 40129-2021
GB/T 40244-2021 Chemicals - Liquid or solid identification - Fluidity test method GB/T 40244-2021
GB/T 4930-2021 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials(CRMs) GB/T 4930-2021
GB/T 40300-2021 Microbeam analysis - Analytical electron microscopy - Vocabulary GB/T 40300-2021
GB/T 21636-2021 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary GB/T 21636-2021
GB/T 29732-2021 Surface chemical analysis - Medium resolution auger electron spectrometers - Calibration of energy scales for elemental analysis GB/T 29732-2021
GB/T 41064-2021 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films GB/T 41064-2021
GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis GB/T 41072-2021
GB/T 41073-2021 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy GB/T 41073-2021
GB/T 41074-2021 Microbeam analysis - Method of specimen preparation for analysis of general powders using WDS and EDS GB/T 41074-2021
GB/T 41076-2021 Microbeam analysis - Electron backscatter diffraction - Quantitative determination of austenite in steel GB/T 41076-2021
GB/T 38531-2020 Microbeam analysis - Computed tomography (CT) method for micro-and nano-pore structure analysis in tight rock samples GB/T 38531-2020
GB/T 38532-2020 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size GB/T 38532-2020
GB/T 37664.1-2019 Nanomanufacturing -- Key control characteristics -- Luminescent nanomaterials -- Part 1: Quantum efficiency GB/T 37664.1-2019
GB/T 35924-2018 Determination of moisture in solid chemical products -- Thermogravimetry method GB/T 35924-2018
GB/T 35930-2018 Determination of vapor pressure of chemical products -- Thermogravimetry method GB/T 35930-2018
GB/T 36052-2018 Surface chemical analysis -- Data transfer format for scanning probe microscopy GB/T 36052-2018
GB/T 36053-2018 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry -- Instrumental requirements, alignment and positioning, data collection, data analysis and reporting GB/T 36053-2018
GB/T 36065-2018 Nanotechnologies -- Analysis of amorphous carbon, ash and volatile of carbon nanotubes -- Thermogravimetry GB/T 36065-2018
GB/T 35097-2018 Microbeam analysis -- Scanning electron microscopy with energy dispersive X-ray spectrometry -- Determination of numeric concentration of inorganic fibrous particles in ambient air GB/T 35097-2018
GB/T 35098-2018 Microbeam analysis -- Transmission electron microscopy -- Morphological identification method of plant viruses by transmission electron microscopy GB/T 35098-2018
GB/T 35099-2018 Microbeam analysis -- Scanning electron microscopy with energy dispersive X-ray spectrometry -- Morphology and element analysis of single fine particles in ambient air GB/T 35099-2018
GB/T 36401-2018 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Reporting of results of thin-film analysis GB/T 36401-2018
GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination -- Auger electron spectroscopy GB/T 36504-2018
GB/T 36533-2018 Determination of the chemical state of micro-iron in silicate -- Auger electron spectroscopy GB/T 36533-2018
GB/T 33498-2017 Surface chemical analysis -- Characterization of nanostructured materials GB/T 33498-2017
GB/T 33502-2017 Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS) GB/T 33502-2017
GB/T 33834-2017 Microbeam analysis -- Scanning electron microscopy -- Scanning electron microscope analysis of biological specimens GB/T 33834-2017
GB/T 33838-2017 Microbeam analysis -- Scanning electron microscopy -- Methods of evaluating image sharpness GB/T 33838-2017
GB/T 33839-2017 Methods of transmission electron microscope for biological specimen containing carbon-based nanomaterials involving biological effect GB/T 33839-2017
GB/T 33893-2017 Determination of perfluorooctane sulfonates (PFOS) and perfluorooctanoic acid (PFOA) for separation membranes -- Liquid chromatography-tandem mass spectrometry method GB/T 33893-2017
GB/T 22571-2017 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales GB/T 22571-2017
GB/T 34002-2017 Microbeam analysis -- Analytical transmission electron microscopy -- Methods for calibrating image magnification by using reference materials having periodic structures GB/T 34002-2017
GB/T 34168-2017 Test method of gold and silver nanoparticle materials biological effect by transmission electron microscope GB/T 34168-2017
GB/T 34172-2017 Microbeam analysis -- Electron backscatter diffraction -- Phase analysis method of metal and alloy GB/T 34172-2017
GB/T 34174-2017 Surface chemical analysis -- Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation GB/T 34174-2017
GB/T 34326-2017 Surface chemical analysis -- Depth profiling -- Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS GB/T 34326-2017
GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy GB/T 34331-2017
GB/T 35158-2017 Verification method for Auger electron spectrometers GB/T 35158-2017
GB/T 32495-2016 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of arsenic in silicon GB/T 32495-2016
GB/T 32565-2016 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES) GB/T 32565-2016
GB/T 32996-2016 Surface chemical analysis -- Analysis of metal oxide films by glow-discharge optical emission spectrometry GB/T 32996-2016
GB/T 32997-2016 Surface chemical analysis -- General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry GB/T 32997-2016
GB/T 32998-2016 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction GB/T 32998-2016
GB/T 32999-2016 Surface chemical analysis -- Depth profiling -- Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer GB/T 32999-2016
GB/T 33236-2016 Polycrystalline silicon -- Determination of trace elements -- Glow discharge mass spectrometry method GB/T 33236-2016
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