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GB/T 33498-2017: Surface chemical analysis -- Characterization of nanostructured materials
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Surface chemical analysis -- Characterization of nanostructured materials
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GB/T 33498-2017
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Basic data | Standard ID | GB/T 33498-2017 (GB/T33498-2017) | | Description (Translated English) | Surface chemical analysis -- Characterization of nanostructured materials | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | G04 | | Classification of International Standard | 71.040.40 | | Word Count Estimation | 44,487 | | Date of Issue | 2017-02-28 | | Date of Implementation | 2018-01-01 | | Quoted Standard | ISO 18115-1; ISO 18115-2 | | Adopted Standard | ISO/TR 14187-2011, IDT | | Regulation (derived from) | National Standard Announcement No. 4 of 2017 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This standard specifies the types of information on nanostructured materials that can be obtained using surface analysis techniques and gives some examples (see Chapter 4). This standard not only identifies common problems or problems in characterizing nanostructured materials, but also points out the unique pathways or challenges when using specific methods (see Chapter 5). When the size of the object or material component is close to several nanometers, the difference between the "block" and "particle" and "particle" analyzes becomes blurred. In addition to defining some common problems in the characterization of nanostructured materials, this standard focuses on the specific aspects of surface chemical analysis of nanostructured materials. This standard covers a variety of analytical and characterization methods, but its focus is still within the scope of surface chemistry analysis, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary | GB/T 33498-2017: Surface chemical analysis -- Characterization of nanostructured materials---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Surface chemical analysis - Characterization of nanostructured materials
ICS 71.040.40
G04
National Standards of People's Republic of China
Surface chemistry analysis nanostructured material characterization
(ISO /T R14187..2011, IDT)
2017-02-28 released
2018-01-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
China National Standardization Management Committee released
Directory
Preface III
Introduction IV
1 Scope 1
2 normative reference document 1
3 terms, definitions, symbols and abbreviations 1
3.1 Terms and definitions 1
3.2 Symbols and Abbreviations 1
Surface characterization of nanostructured materials
4.1 Introduction 3
4.2 Electron Spectroscopy (AES and XPS) 5
4.3 Ion beam surface analysis methods (SIMS and LEIS) 11
4.4 Scanning Probe Microscopy 12
Characterization of Carbon Nanostructures
5 Analysis of nanostructured material considerations, questions and problems. Information for analysts 14
5.1 Introduction 14
5.2 Overall Considerations and Analysis Puzzles 14
5.3 Physical properties 15
5.4 Particle stability and damage. size, surface energy and energy scale convergence of the impact of 15
5.5 Sample Installation and Preparation 21
5.6 Specific Considerations for Analysis of Nanostructured Materials by XPS, AES, SIMS and SPM
6 nanostructured materials overall characterization needs and opportunities
Reference 28
Foreword
This standard is drafted in accordance with the rules given in GB/T 1.1-2009.
This standard uses the translation method equivalent to ISO /T R14187..2011 "Surface Chemistry Analysis of Nanostructured Materials Characterization".
Please note that some of the contents of this document may involve patents. The issuer of this document does not assume responsibility for the identification of these patents.
This standard is proposed by the National Microparraph Analysis Standardization Technical Committee (SAC/TC38).
The drafting of this standard. China Institute of Metrology, Chinese Academy of Sciences Institute of Chemistry.
The main drafters of this standard. Wang Hai, Wang Meiling, Liu Fen, Song Xiaoping, Zhao Zhijuan, Zhang Xiaoyu.
Introduction
As many types of engineering nanomaterials play an increasingly important role in many different technical fields [1], international organizations [including
International Organization for Standardization (ISO ), American Society for Testing and Materials (ASTM), International Bureau of Metrology/Substances Advisory Committee. Chemical Metrology
(BIPM/CCQM) and the Organization for Economic Co-operation and Development (OECD) [1] are committed to ensuring that the inherent nature of the materials used is fully
Recognize the key properties of materials that must be recognized [2] with measurements. Most of the material is related to the surface or interface, which is any nanostructured material (none
On the inherent properties of particles, fibers or other objects). Thus, the surface composition and chemistry have been identified as essential for the characterization of nanomaterials
Part of the chemical parameters, and many of the existing surface characterization techniques can of course be used or should often be applied to nanomaterials. But two
Different problems limit the role of traditional surface analysis techniques in certain fields of nanoscience and nanotechnology. First of all, many techniques are not enough
Enough three-dimensional spatial resolution, can not meet the needs of analyzing individual nanostructured materials (or equivalent to changes in material composition). So do it
These techniques often provide very important information, and some researchers still do not consider using them. Second, surface analysis (and its
He) technology is often used for the characterization of nanostructured materials, but without due consideration of these materials will bring some analytical problems or problems.
These problems include the ability of the nanoparticles to be altered by the environment (including the effects measured under vacuum conditions), the nanostructured material over time
The characteristics of the change, the effect of the particle shape on the analytical results, and the incident radiation (usually electrons, X-rays or ions) during the analysis
The possibility of a change in the structure or composition of the nanomaterials increases. This standard provides a lot of information about these important issues. First, the description
The types of information that can be obtained from nanostructured materials, including information that can be obtained using analytical methods other than these standard applications
Class; second, the analysis of the use of surface analysis technology (and other commonly used technology) characterization of nanostructured materials usually encountered technical problems to
And the use of each technology will encounter specific problems.
With the application of nanostructured materials in research, development and commerce, and their natural presence in air and groundwater,
The need to understand the properties and properties of nanostructured materials when they are synthesized or evolved in a particular environment. Nanostructure material is novel and unusual
Has attracted the attention of scientists, technical experts and the public. However, the amazing nature of many materials is sometimes also given to analysts, scientists
And product engineers bring unexpected analysis or characterization problems [3 ~ 5].
Materials with unusual or unique properties can cause potential health and environmental problems, and there is a growing need to understand that these materials are
Its chemical, physical and biological properties throughout its life cycle. It has been recognized that some of the properties of nanoparticles and other nanostructures
Quality (including toxicity and environmental stability) of the early reports based on the lack of characterization [6]. In some cases, the nanostructure material is of a material
Important representations have not been tried or reported [7,8]. March.2006 "SmalTimes" magazine published a text on a seminar
The seminar aims to clarify the obstacles to the commercialization of nanobotechnology [6]. At this seminar, several experts reported that.
Many of the important physical properties required for the physical and chemical properties of the rice particles have not been reported, and even apparently have not been measured,
Sex assessment process. This article further states that when these particles are exposed to their storage or use of the environment, the changes in these particles
Particularly important and often unrecognized. In many cases, the surface of the nanoparticles is covered with surfactants or contaminants, which are usually not available
To a good characterization, sometimes not fully confirmed. In this way, the validity of the conclusions may be problematic. The surface chemistry of nanoparticles is not obtained
Fully characterized, which has been identified as a field that often lacks proper characterization [4,8]. One definition of nanostructured material is an object or
The structure has at least one dimension of not more than 100 nm. At present, nanostructures (particles, rods or other shapes) that may be released into the environment
), While clarifying the minimum characterization requirements required for the use of nanoparticles for toxicological research [2]. On the computer
(As sensors), batteries or fuel cells, and many other applications of nanostructured materials, the same need for nano-materials
Characterization. Nevertheless, the minimum characterization required for nanoparticles can be extended to many of the materials and potential applications shown in Table 1.
Various surface analysis methods can provide information for the elements listed in Table 1, which include both obvious elements (such as surface composition and chemistry),
It also includes the size of particles or components, the presence of surface impurities, the nature of surface functionalization (including acidity), surface structure/morphology,
(Including transverse and depth directions), the thickness of the cover/film, and the electronic properties of the nanostructures/films.
Surface characterization is only part of the current nanomaterial analysis needs. This standard gives information that is available through such analysis
(And through which technology), and analyzes some of the problems and challenges faced by these analyzes.
Table 1 Physical and chemical properties of nanostructured materials
Nature Category Physical and chemical properties
The appearance of the material
Particles, grain, film, structural unit size and size distribution
Grain, particle, film morphology (shape, layer, roughness, topography)
Aggregate state, agglomeration (for example, whether particles are glued together)
Material composition
Body composition (including chemical composition and crystal structure)
Body purity (including impurities)
Elements, chemical and/or phase distribution (including surface composition and surface impurities)
Material and its surroundings
interaction
Influencing factors
Surface area
Surface chemistry, including reactivity, hydrophobicity
Surface charge
Characterization of engineering nanomaterials (for
Toxicological research and other applications)
The primary consideration
Stability - material properties (especially the surface composition, particle aggregation, etc.) how with the time (dynamic stability), storage, at
Management, preparation, transportation, etc., including the solubility of the material and the release rate of dissolution
Environment/medium - how the material properties change in different media or processes (environmental impact), for example,
The material is transformed into a material that is dispersed in different biological matrices (the "specified" characterization project is particularly important)
If possible, the material should be adequately characterized as if it were to explain its functional properties. For toxicological studies, request is obtained
Response information related to material usage (including possible relevant dose indices such as quality, surface area and quantity concentration)
Note 1. Boldface is a useful information that can be provided by surface chemistry analysis described in this standard.
Note 2. This table is adapted from reference [2]. The original form of the proposal is from October 28 to 28,.2008 in the United States Washington WoodrowWilson country
Which was designed to ensure that the material was properly characterized in the course of nanotoxicology research,
Surface chemistry analysis nanostructured material characterization
1 Scope
This standard describes the types of information on nanostructured materials that can be obtained using surface analysis techniques and gives some examples (see Chapter 4).
This standard not only identifies common problems or problems in characterizing nanostructured materials, but also points out the unique pathways when using specific methods or
Puzzle (see Chapter 5). When the size of an object or material component is close to several nanometers, the "block" between "surface" and "particle"
The difference becomes blurred. In addition to defining some common problems in characterizing nanostructured materials, this standard focuses on the
Structural material surface chemical analysis specific related issues. This standard covers a variety of analytical and characterization methods, but the focus is still surface chemistry points
Analysis of the range of expertise, including Auger electron spectroscopy, X-ray photoelectron spectroscopy, secondary ion mass spectrometry and scanning probe microscopy. Satisfied
Some types of measurements of surface properties (such as surface potential) of rice particles are often carried out in solution, and this standard does not cover this part.
Although nanoscale thin films and uniform nanoparticle sets have many similarities, they characterize them to face different problems. This standard
The method of characterization for both the film and the particle or nano object is illustrated. The properties that can be determined include the presence of contamination, coating
And the surface chemical properties before and after processing. In addition to the types of information that can be obtained, this standard also summarizes the pre-analysis or analysis process
Must include general issues and specific technical issues to be considered, including information to be identified, stability and probe effects, environmental impact, sample handling
And the interpretation of the data.
This standard describes the use of a range of specific surface analysis methods available for nanomaterial information, but this information is essentially not
May be complete. However, this standard provides important avenues, ideas and questions, and provides a lot of references to
To carry out a more in-depth analysis of these issues.
2 normative reference documents
The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article
Pieces. For undated references, the latest edition (including all modifications) applies to this document.
ISO 18115-1 Glossary of surface chemistry - Part 1. General terms and terminology (SurfaceChemical
analysis-Vocabulary-Part 1. Generaltermsandtermsusedinspectroscopy)
ISO 18115-2 Surface chemistry analysis vocabulary - Part 2. Scanning probe microscopy terms (Surfacechemical
analysis-Vocabulary-Part 2. Termsusedinscanning-probemicroscopy
3 terms, definitions, symbols and abbreviations
3.1 Terms and definitions
The terms and definitions defined in ISO 18115-1 and ISO 18115-2 apply to this document.
3.2 Symbols and abbreviations
The following symbols and abbreviations apply to this document.
AES. Auger Electron Spectroscopy (Augerelectronspectroscopy)
APT. atomic probe tomography (atomprobetomography)
AFM. Atomic Force Microscopy (atomicforcemicroscopy)
ARXPS. Variable angle X-ray photoelectron spectroscopy (angleresolvedX-rayphotoelectronspectroscopy)
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