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GB/T 41074-2021: Microbeam analysis - Method of specimen preparation for analysis of general powders using WDS and EDS
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Microbeam analysis - Method of specimen preparation for analysis of general powders using WDS and EDS
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GB/T 41074-2021
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Basic data | Standard ID | GB/T 41074-2021 (GB/T41074-2021) | | Description (Translated English) | Microbeam analysis - Method of specimen preparation for analysis of general powders using WDS and EDS | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | G04 | | Word Count Estimation | 14,170 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 41074-2021: Microbeam analysis - Method of specimen preparation for analysis of general powders using WDS and EDS
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Microbeam analysis -- Method of specimen preparation for analysis of general powders using WDS and EDS
ICS 71:040:99
CCSG04
National Standards of People's Republic of China
Microbeam Analysis for Spectroscopy and Energy Spectroscopy
Powder sample preparation method
(ISO 20720:2018, IDT)
Published on 2021-12-31
2022-07-01 Implementation
State Administration for Market Regulation
Released by the National Standardization Administration
directory
Preface III
Introduction IV
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Abbreviations 1
5 Sample preparation method 1
6 Conductive treatment 6
Appendix A (Informative) Example 7 of the Influence of Pressure on the Intensity of Tablet X-rays
Appendix B (Informative) Example 8 of the Effect of Particle Size on Tablet X-ray Intensity
Reference 9
foreword
This document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules of Standardization Documents"
Drafting:
This document is identical to ISO 20720:2018 "Microbeam Analysis Method for Preparation of Powder Samples for Spectroscopic and Energy Dispersive Analysis":
Please note that some content of this document may be patented: The issuing agency of this document assumes no responsibility for identifying patents:
This document is proposed and managed by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38):
This document is drafted by: Institute of Mineral Resources, Chinese Academy of Geological Sciences, Beijing Institute of Geology of Nuclear Industry, Chinese Academy of Sciences of Geology and Geology
Institute of Ball Physics:
The main drafters of this document: Chen Zhenyu, Fan Guang, Mao Qian:
Introduction
Although Electron Probe (EPMA) and Scanning Electron Microscopy (SEM) are widely used in powder analysis, there are some difficulties, especially in
In the case of single particle analysis, such as:
a) particle agglomeration during sample preparation;
b) fixation of the specimen, especially when a small amount of fine particles is present for surface analysis or cross-sectional analysis;
c) Cross-sectional preparation of small particles with a core-shell structure;
d) In the case that the particle surface is sensitive to electron beam, protect the particle surface from damage by electron beam irradiation;
e) neutralization of the charge of the sample under electron irradiation to prevent powder splashing or dispersion due to charge repulsion;
f) When the volume of X-rays generated is larger than the powder particles, the interpretation of qualitative and quantitative analysis results:
In the case of analyzing the elemental composition of powders, sample preparation can also affect the analytical results because of coarseness in particle aggregates or agglomerates
Degree, void space can affect X-ray intensity:
To overcome these difficulties, it is important to standardize sample preparation for particle analysis:
Microbeam Analysis for Spectroscopy and Energy Spectroscopy
Powder sample preparation method
1 Scope
This document specifies the use of an energy dispersive spectrometer (EDS) or spectrometer mounted on an electron probe (EPMA) or scanning electron microscope (SEM):
(WDS) Method of sample preparation when analyzing particles in powders: According to the purpose of analysis and particle size, the preparation method of powder particle samples
classified:
This document applies to inorganic particles with a particle size ranging from 100 nm to 100 μm:
This document is not suitable for some special applications, such as forensic analysis or trace analysis:
2 Normative references
There are no normative references in this document:
3 Terms and Definitions
There are no terms and definitions that need to be defined in this document:
4 Abbreviations
The following abbreviations apply to this document:
EDS: energy spectrometer (energy-dispersiveX-rayspectrometer)
EDX: energy-dispersiveX-rayspectroscopy
Energy-dispersiveX-rayspectrometry
EPMA: Electron Probe Microanalysis
Electron probe microanalyzer (electronprobemicroanalyzer)
SEM: Scanning Electron Microscopy
Scanning Electron Microscope
WDS: Spectrometer (wavelength-dispersiveX-rayspectrometer)
WDX: Wavelength-dispersiveX-rayspectroscopy
Wavelength-dispersiveX-rayspectrometry
5: Sample preparation method
5:1 Overview
Particle analysis mainly adopts the following sample preparation methods (see Figure 1): The specific steps of the preparation method are shown in 5:2: In some cases, no
The use of other more suitable sample preparation methods for particle analysis is excluded:
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