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www.ChineseStandard.net Database: 189760 (18 Oct 2025)

GB/T 45468-2025 English PDF

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GB/T 45468-2025: Microbeam analysis - FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample
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GB/T 45468-2025English439 Add to Cart 4 days [Need to translate] Microbeam analysis - FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample Valid GB/T 45468-2025

PDF similar to GB/T 45468-2025


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Basic data

Standard ID GB/T 45468-2025 (GB/T45468-2025)
Description (Translated English) Microbeam analysis - FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard G04
Classification of International Standard 71.040.99
Word Count Estimation 22,250
Date of Issue 2025-03-28
Date of Implementation 10/1/2025
Issuing agency(ies) State Administration for Market Regulation, China National Standardization Administration

GB/T 45468-2025: Microbeam analysis - FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample


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ICS 71.040.99 CCSG04 National Standard of the People's Republic of China Microbeam analysis of rock micropores Focused ion beam-scanning Electron Microscope Three-Dimensional Imaging Analysis Method Released on 2025-03-28 2025-10-01 Implementation State Administration for Market Regulation The National Standardization Administration issued

Table of contents

Preface III 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 Method Principle 2 5 Instruments, software and materials 3 6 Sample preparation 4 7 Analysis Step 4 8 Data Processing 6 9 Analysis Report 10 Appendix A (Informative) Example of automatic serial section imaging of shale samples 12 Appendix B (Informative) Report Example of Rock Micropore Focused Ion Beam-Scanning Electron Microscope Three-Dimensional Imaging Analysis 13 References 16

Foreword

This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents" Drafting. Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents. This document was proposed and coordinated by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38). This document was drafted by. China National Petroleum Corporation Exploration and Development Research Institute, China National Petroleum Corporation Regulatory Commission China Petroleum & Chemical Corporation,... Wuxi Institute of Petroleum Geology. The main drafters of this document are. Wang Xiaoqi, Jin Xu, Sun Liang, Chen Wenxia, Yang Jijin, Wu Jianguo, Zhu Rukai, Wu Songtao, Bao Fang, Zhang Lin, Ding Lihua, Jiao Hang. Microbeam analysis of rock micropores Focused ion beam-scanning Electron Microscope Three-Dimensional Imaging Analysis Method

1 Scope

This document specifies a method for three-dimensional imaging of microporosity in dense rocks using focused ion beam-scanning electron microscopy. This document is applicable to micro-nano pores of 50nm~20μm in rocks such as mudstone, shale, dense carbonate rock, dense sandstone and coal rock. Analysis of other geological samples shall be carried out in the same manner.

2 Normative references

The contents of the following documents constitute the essential clauses of this document through normative references in this document. For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to This document. GB/T 23414 Terminology for Microbeam Analysis Scanning Electron Microscopy GB/T 27788 Guidelines for calibration of image magnification for microbeam analysis scanning electron microscopes GB/T 38531-2020 Microbeam analysis of compact rock micro-nanoscale pore structure computer tomography (CT) analysis method JY/T 0583-2020 General rules for analysis methods of focused ion beam systems SY/T 5913 Rock slice preparation method

3 Terms and definitions

Terms and definitions defined in GB/T 23414, GB/T 27788, GB/T 38531-2020 and JY/T 0583-2020 and the following Applicable to this document. 3.1 The sample surface is bombarded with a focused ion beam, and the scanning or processing trajectory, step length, and dwell time of the ion beam are controlled by a computer. The system can reduce the time and cycle number to realize the analytical processing system for material imaging, etching, induced deposition and implantation. [Source. JY/T 0583-2020, 2.1, modified] 3.2 Micro-nano processing and imaging instrument with FIB and scanning electron microscopy imaging system. 3.3 Confocal distance coincidence distance The distance between the intersection point of the electron beam and the ion beam and the lower surface of the SEM objective pole piece. [Source. JY/T 0583-2020, 2.8, modified] 3.4 Gas injection system gasinjectionsystem;GIS A system used to inject a certain gas into the sample surface to assist in material deposition and enhance etching function. [Source. JY/T 0583-2020, 2.6, modified]

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