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Microbeam analysis - FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample
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GB/T 45468-2025
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Basic data Standard ID | GB/T 45468-2025 (GB/T45468-2025) | Description (Translated English) | Microbeam analysis - FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample | Sector / Industry | National Standard (Recommended) | Classification of Chinese Standard | G04 | Classification of International Standard | 71.040.99 | Word Count Estimation | 22,250 | Date of Issue | 2025-03-28 | Date of Implementation | 10/1/2025 | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration |
GB/T 45468-2025: Microbeam analysis - FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample ---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 71.040.99
CCSG04
National Standard of the People's Republic of China
Microbeam analysis of rock micropores Focused ion beam-scanning
Electron Microscope Three-Dimensional Imaging Analysis Method
Released on 2025-03-28
2025-10-01 Implementation
State Administration for Market Regulation
The National Standardization Administration issued
Table of contents
Preface III
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Method Principle 2
5 Instruments, software and materials 3
6 Sample preparation 4
7 Analysis Step 4
8 Data Processing 6
9 Analysis Report 10
Appendix A (Informative) Example of automatic serial section imaging of shale samples 12
Appendix B (Informative) Report Example of Rock Micropore Focused Ion Beam-Scanning Electron Microscope Three-Dimensional Imaging Analysis 13
References 16
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document was proposed and coordinated by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38).
This document was drafted by. China National Petroleum Corporation Exploration and Development Research Institute, China National Petroleum Corporation Regulatory Commission
China Petroleum & Chemical Corporation,...
Wuxi Institute of Petroleum Geology.
The main drafters of this document are. Wang Xiaoqi, Jin Xu, Sun Liang, Chen Wenxia, Yang Jijin, Wu Jianguo, Zhu Rukai, Wu Songtao, Bao Fang, Zhang Lin, Ding Lihua,
Jiao Hang.
Microbeam analysis of rock micropores Focused ion beam-scanning
Electron Microscope Three-Dimensional Imaging Analysis Method
1 Scope
This document specifies a method for three-dimensional imaging of microporosity in dense rocks using focused ion beam-scanning electron microscopy.
This document is applicable to micro-nano pores of 50nm~20μm in rocks such as mudstone, shale, dense carbonate rock, dense sandstone and coal rock.
Analysis of other geological samples shall be carried out in the same manner.
2 Normative references
The contents of the following documents constitute the essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
GB/T 23414 Terminology for Microbeam Analysis Scanning Electron Microscopy
GB/T 27788 Guidelines for calibration of image magnification for microbeam analysis scanning electron microscopes
GB/T 38531-2020 Microbeam analysis of compact rock micro-nanoscale pore structure computer tomography (CT) analysis method
JY/T 0583-2020 General rules for analysis methods of focused ion beam systems
SY/T 5913 Rock slice preparation method
3 Terms and definitions
Terms and definitions defined in GB/T 23414, GB/T 27788, GB/T 38531-2020 and JY/T 0583-2020 and the following
Applicable to this document.
3.1
The sample surface is bombarded with a focused ion beam, and the scanning or processing trajectory, step length, and dwell time of the ion beam are controlled by a computer.
The system can reduce the time and cycle number to realize the analytical processing system for material imaging, etching, induced deposition and implantation.
[Source. JY/T 0583-2020, 2.1, modified]
3.2
Micro-nano processing and imaging instrument with FIB and scanning electron microscopy imaging system.
3.3
Confocal distance coincidence distance
The distance between the intersection point of the electron beam and the ion beam and the lower surface of the SEM objective pole piece.
[Source. JY/T 0583-2020, 2.8, modified]
3.4
Gas injection system gasinjectionsystem;GIS
A system used to inject a certain gas into the sample surface to assist in material deposition and enhance etching function.
[Source. JY/T 0583-2020, 2.6, modified]
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