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 GB/T 34172-2017: Microbeam analysis -- Electron backscatter diffraction -- Phase analysis method of metal and alloy
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 Basic data             | Standard ID | GB/T 34172-2017 (GB/T34172-2017) |           | Description (Translated English) | Microbeam analysis -- Electron backscatter diffraction -- Phase analysis method of metal and alloy |           | Sector / Industry | National Standard (Recommended) |           | Classification of Chinese Standard | G04 |           | Classification of International Standard | 71.040.40 |           | Word Count Estimation | 14,175 |           | Date of Issue | 2017-09-07 |           | Date of Implementation | 2018-08-01 |           | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | GB/T 34172-2017: Microbeam analysis -- Electron backscatter diffraction -- Phase analysis method of metal and alloy---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
 Microbeam analysis - Electron backscatter diffraction - Phase analysis method of metal and alloy
ICS 71.040.40
G04
National Standards of People's Republic of China
Microbeam analysis electron backscatter diffraction
Metal and alloy phase analysis method
2017-09-07 Posted
2018-08-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
China National Standardization Administration released
Directory
Foreword Ⅲ
Introduction IV
1 Scope 1
2 Normative references 1
3 Terms and definitions 1
4 test parameters 3
4.1 Sample Requirements 3
4.2 Scanning electron microscope parameter setting
4.2.1 EBSD device 3
4.2.2 Acceleration voltage 3
4.2.3 Beam 3
4.3 EBSD parameter setting 3
4.3.1 EBSD System Calibration 3
4.3.2 exposure time 4
4.3.3 Step Selection 4
4.3.4 EBSD pattern pixel selection 4
4.3.5 EBSP background correction 4
4.3.6 Kikuchi detection 4
5 Analysis Process 5
5.1 Image Acquisition 5
5.2 Qualitative Analysis 5
5.2.1 Elemental chemical composition analysis 5
5.2.2 pattern collection and analysis 5
5.2.3 pattern matching 5
5.3 Quantitative Analysis 5
5.3.1 Phase Selection 5
5.3.2 Parameter Selection 5
5.3.3 Phase distribution collection 5
5.3.4 Phase distribution of the post-processing 6
6 results posted 6
Appendix A (Normative) EBSD sample preparation 7
References 8
 ForewordThis standard was drafted in accordance with the rules given in GB/T 1.1-2009.
This standard by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38) and focal point.
This standard was drafted unit. Shanghai Electric Power Equipment Design Institute, Tess Ken Trading Co., Ltd., Central Research Institute of Baosteel Group, China
Academy of Sciences Shanghai Institute of Ceramics.
The main drafters of this standard. Zhang Zuo Gui, Jiaohui wins, Yao Lei, Wang Zhe Zhe.IntroductionElectron Backscatter Diffraction (EBSD) is based on the analysis of electron beam in scanning electron microscopy (SEM) or focused ion beam (SEM-FIB)
The oblique sample surface is excited by backscattered electrons and analyzed by the Kikuchi band formed by atom diffraction on the sample surface to obtain the crystallographic information of the sample
Technology [1,2]. EBSD technology for the phase structure of similar crystal analysis, can be combined with the SEM (but also SEM-FIB or EPMA)
On the EDS elemental chemical composition analysis to improve the reliability of the EBSD phase analysis results.
EBSD data is statistically characteristic, so the phase distribution, orientation relationship and percentage content of multiphase materials can be analyzed simultaneously [3]. by
The EBSD phase analysis of metals and alloys can be obtained from the metal and alloy phase morphology, distribution and area percentage of related letters
Interest, the composition of the metal and alloy control, heat treatment process selection, the mechanism of alloying and component failure analysis are very heavy
The meaning of
Microbeam analysis electron backscatter diffraction
Metal and alloy phase analysis method1 ScopeThis standard specifies the use of electron backscatter diffraction (Electronbackscatterdiffraction, EBSD) technology in metals and alloys
Phase qualitative and quantitative analysis of parameters correction, data acquisition methods.
This standard applies to the EBSD on the metal and alloy sample phase analysis, other polycrystalline or single crystal material EBSD phase analysis can also refer to
carried out.2 Normative referencesThe following documents for the application of this document is essential. For dated references, only the dated version applies to this article
Pieces. For undated references, the latest edition (including all amendments) applies to this document.
GB/T 27025 General requirements for testing and calibration laboratories3 Terms and definitionsThe following terms and definitions apply to this document.
3.1
Alloy aloy
A substance that has a metallic character consisting of a variety of metallic elements, or metallic and non-metallic elements.
3.2
Phase
Materials in the crystal structure and chemical composition of the same part.
3.3
Crystal
Consists of spatially regular, repeatable atomic arrangements. Commonly used space group, crystal system, lattice constant (including the edge length and edge between
) And the location of atoms in the unit cell.
3.4
Single crystal singlecrystaline
Internal crystal lattice alignment and crystallographic orientation are consistent with the crystal material.
3.5
Grain grain
Areas with points of the same orientation (within allowable tolerances) that are completely closed by grain boundaries.
3.6
Polycrystalline polycrystaline
A crystalline material consisting of many different single crystals (grains).
 
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