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GB/T 40300-2021: Microbeam analysis - Analytical electron microscopy - Vocabulary
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Microbeam analysis - Analytical electron microscopy - Vocabulary
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Basic data | Standard ID | GB/T 40300-2021 (GB/T40300-2021) | | Description (Translated English) | Microbeam analysis - Analytical electron microscopy - Vocabulary | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | G04 | | Word Count Estimation | 34,312 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 40300-2021: Microbeam analysis - Analytical electron microscopy - Vocabulary---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Microbeam analysis - Analytical electron microscopy - Vocabulary
ICS 71.040.40
CCSG04
National Standards of People's Republic of China
Microbeam analysis, terminology of electron microscopy
(ISO 15932.2013,MOD)
Released on 2021-08-20
2022-03-01 implementation
State Administration of Market Supervision and Administration
Issued by the National Standardization Management Committee
Table of contents
Foreword Ⅰ
Introduction Ⅱ
1 Scope 1
2 Normative references 1
3 Abbreviations 1
4 Analyze basic terminology of electron microscopy physics 2
5 Analytical electron microscope instrument terminology 5
6 Common terminology of analytical electron microscopy specimen preparation 10
7 Analyze the terminology of electron microscopy imaging and image processing 11
8 Analyze the interpretation of electron microscopy images and analytical terms 13
9 Analyze the terminology of electron microscopy image magnification and resolution measurement and calibration 16
10 Analyze the terminology of electron diffraction in electron microscopy 18
Reference 20
Index 21
Foreword
This document is in accordance with GB/T 1.1-2020 "Guidelines for Standardization Part 1.Structure and Drafting Rules of Standardization Documents".
To be drafted.
This document is revised and adopted ISO 15932.2013 "Terms of Microbeam Analysis and Analysis of Electron Microscopy".
Compared with ISO 15932.2013, this document adds Chapter 2 normative references.
This document has made the following editorial changes.
---Chapter number 0 was changed to 1, and chapter numbers 1, 2, and 38 were changed to 3, 4, 5, and 610 respectively;
---9.9 is the same as 5.2.1.This document deletes 9.9 and changes 9.10 to 9.9;
---In the references, Chinese documents that have a consistent correspondence relationship with international documents are used instead of international documents, and the order of documents has been adjusted;
---The index has been added.
This document corrects the errors in ISO 15932.2013, the main corrections are as follows.
---Corrected the definitions of the acronyms "EDS" and "EDX";
---The definition of the acronym EPMA adds "microanalyzer";
--- "Scanning Electron Microscope" is added to the definition of the acronym SEM;
---4.2.1 deleted the meaning of "momentum conservation" in the definition;
---4.2.2 deleted "system" and "and/or momentum" in the definition;
---5.1.3.5 "Electrostatic field" in the definition is corrected to "potential difference";
--- Change the "ideal cylindrical lens" in the definition of 5.2.2.3 to "ideal lens";
---5.4.2 Deleted the "rotational symmetry around the optical axis" in the definition;
---5.7 The "sample and the plane forming the diffraction pattern" in the definition is corrected to "the plane where the sample and the diffraction pattern are observed (via the intermediate mirror and
Between the projection lens magnification)";
---The definition of 6.4 is changed to "Simultaneous injection to both sides or one side of the sample";
--- 6.10 "In TEM observation" in the definition is changed to "In electron microscope observation";
--- In the definition of 7.6, "receiving one diffracted beam with a ring-shaped dark-field detector" is corrected to "receiving one or more diffracted beams with a ring-shaped dark-field detector"
Diffracted beam";
---8.3 "Mass thickness" is added to the definition, and a note has been added;
--- 8.6.5 Amend "[Source. ISO 22493, modified]" to "[Source. ISO 23833, modified]";
--- 8.6.8 The EDS in the definition is corrected to EDX;
--- 8.6.9 The EDS in the definition is corrected to EDX;
---8.12.1 added a note;
--- 9.2.2 The "camera constant" in the definition is corrected to "magnification";
---9.7 "Probe size" in the definition is corrected to "point light source image";
---10.3.3.1 The definition of "two Bragg diffractions in two vertically stacked crystals" is corrected to "one diffraction in crystals"
Bragg diffraction occurs again in the beam";
---10.3.6 corrected the concept of convergent beam.
Please note that some of the contents of this document may involve patents. The issuing agency of this document is not responsible for identifying patents.
This document was proposed and managed by the National Standardization Technical Committee for Microbeam Analysis (SAC/TC38).
Drafting organizations of this document. University of Science and Technology Beijing, Nanchang University, Institute of Metal Research, Chinese Academy of Sciences.
The main drafters of this document. Liu Delu, Tang Binbing, He Lianlong.
Introduction
Analytical electron microscopy (AEM) is the application of transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) to solid objects
Techniques and related theories for the qualitative and quantitative determination of the crystal structure, element composition and electronic state of the tiny volume. AEM analysis
Based on the physical mechanism of electron-excited X-ray energy spectrum and electron energy loss spectrum (EELS), and provide structural information of the micro-region through micro-diffraction,
At the same time, it has high-resolution imaging capabilities.
As a major subfield of microbeam analysis (MBA), AEM is widely used in various industries (high-tech industry, basic industry, metallurgical industry).
Gold, geology, biology and medicine, environmental protection, trade, etc.), and has a wide range of business environments for standardization.
The standardization of terminology in a technical field is a prerequisite for the development of standards in other aspects of the field.
This document is of great significance to the international scientific and engineering communities that need to use AEM vocabulary, which includes MBA and TEM
Unified definition of terms used in practice combined with STEM.
This document is one of a series of standards developed by ISO /TC202 (Microbeam Analysis). These standards include scanning electron microscopy terminology
(ISO 22493), terminology of electron probe microanalysis (ISO 23833) and quantitative analysis of energy spectroscopy (ISO 22309), etc. Some of them have been posted
Some of them are still under development in order to fully cover the MBA field.
Microbeam analysis, terminology of electron microscopy
1 Scope
This document defines the terms used in AEM practice. The terms that contain general concepts and specific concepts are
Self-level classification.
This document applies to all standardized documents related to AEM practice. In addition, some parts of this document are applicable to related fields (e.g.
TEM, STEM, SEM, EPMA, EDX) definitions of general terms.
2 Normative references
There are no normative references in this document.
3 Abbreviations
AEM Analytical Electron Microscope/Analytical Electron Microscopy (analyticalelectronmicroscope/analyticalelectron
microscopy)
CBED convergent beam electron diffraction (convergentbeamelectrondiffraction)
CCD charge-coupled device (charge-coupled device)
CRT cathode ray tube (cathoderaytube)
EDS X-ray energy spectrometer (energy-dispersiveX-rayspectrometer)
EDX X-ray energy spectroscopy (energy-dispersiveX-rayspectroscopy)
EELS electron energy loss spectrometer/electron energy loss spectrometer (electronenergylossspectrometer/electronen-
ergylossspectroscopy)
EPMA electron probe microanalysis/electronprobe microanalysis instrument (electronprobemicroanalysis/electronprobe
microanalyser)
FFT fast Fourier transform (fastFouriertransform)
FIB focused ion beam (focusedionbeam)
FWHM (spectral peak) full width at half maximum (fulwidthathalfmaximum)
HAADF (high-angleannulardarkfield) (high-angleannulardarkfield)
HREM high-resolution transmission electron microscopy/high-resolution transmission electron microscopy (high-resolution transmission electron microscopy)
microscope/high-resolutiontransmissionelectronmicroscopy)
LAADF (low-angleannulardarkfield) (low-angleannulardarkfield)
MBA microbeamanalysis
SE secondary electron (secondaryelectron)
SEM scanning electron microscope/scanning electron microscopy (scanningelectronmicroscope/scanningelectronmi-
croscopy)
STEM Scanning Transmission Electron Microscope/Scanning Transmission Electron Microscope (scanningtransmissionelectronmicroscope/
scanningtransmissionelectronmicroscopy)
TEM Transmission electron microscope/transmission electron microscopy (transmissionelectronmicroscope/microscopy)
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