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GB/T 33502-2017 English PDF

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GB/T 33502-2017: Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
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GB/T 33502-2017English244 Add to Cart 3 days [Need to translate] Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS) Valid GB/T 33502-2017

PDF similar to GB/T 33502-2017


Standard similar to GB/T 33502-2017

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Basic data

Standard ID GB/T 33502-2017 (GB/T33502-2017)
Description (Translated English) Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard G04
Classification of International Standard 71.040.40
Word Count Estimation 13,168
Date of Issue 2017-02-28
Date of Implementation 2018-01-01
Quoted Standard ISO 18115-1
Adopted Standard ISO 16243-2011, IDT
Regulation (derived from) National Standard Announcement No. 4 of 2017
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies the minimum requirements for the analyst to report the information after analyzing the sample using X-ray photoelectron spectroscopy (XPS). Including information on original records and analytical records.

GB/T 33502-2017: Surface chemical analysis -- Recording and reporting data in X-ray photoelectron spectroscopy (XPS)


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Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS) ICS 71.040.40 G04 National Standards of People's Republic of China Surface Chemistry Analysis X-ray Photoelectron Spectroscopy (XPS) Data recording and reporting requirements photoelectronspectroscopy (XPS) (ISO 16243..2011, IDT) 2017-02-28 released 2018-01-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Management Committee released Directory Preface III Introduction IV 1 Scope 1 2 normative reference document 1 3 Terms and definitions 1 4 record and report the scope of 1 5 Send data to the user 4 Appendix A (informative) Spectrum Example 5 Reference 9

Foreword

This standard is drafted in accordance with the rules given in GB/T 1.1-2009. This standard uses the translation method equivalent to ISO 16243..2011 "Surface Chemistry Analysis X-ray Photoelectron Spectroscopy (XPS) data recording With the specification of the report ". This standard is proposed by the National Microparraph Analysis Standardization Technical Committee (SAC/TC38). This standard is responsible for drafting units. Xiamen love Lauder Optoelectronics Co., Ltd., Department of Chemistry, Tsinghua University. The main drafters of this standard. Shi Haiyan, Li Zhanping, Sun Haizhen, Yao Wenqing, Liu Fen, Wang Shuiju.

Introduction

X-ray photoelectron spectroscopy (XPS) is widely used in surface analysis of materials. The elements in the sample (except hydrogen and helium) are measured by photoelectron spectroscopy The core level combination can be compared to the list of elements of these energies. The chemical information of these elements can be measured by the optoelectronics chemistry Displacement and/or linear comparison of the reference state. This standard specifies the range of sample and experimental parameter information to be included in the analysis record. The results of the analysis should be recorded in standard format The style should be sufficiently detailed to make the experiment repeatable. The format is required to meet the reporting requirements. The report should include experimental conditions and data acquisition parameters to assess the quality of the data. Surface Chemistry Analysis X-ray Photoelectron Spectroscopy (XPS) Data recording and reporting requirements

1 Scope

This standard specifies the minimum requirements for analysts to report information after using X-ray photoelectron spectroscopy (XPS) to analyze the sample. Including the original Record and analyze the recorded information.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. ISO 18115-1 Glossary of surface chemistry - Part 1. General terms and terminology (SurfaceChemical analysis-Vocabulary-Part 1. Generaltermsandtermsusedinspectroscopy)

3 terms and definitions

ISO 18115-1 and the following terms and definitions apply to this document. 3.1 Outside system exsitu Analyze the outside of the system. 3.2 Internal system insitu Analyze the interior of the system.

4 record and report the scope

4.1 Overview This standard specifies the minimum requirements for analysts to record and report information when using XPS to analyze samples. The record and the report Divided into six main areas. a) an analyst's record or electronic document (such as a computer data storage system); b) Spectrum; c) Quantitative analysis of samples; d) component depth analysis; e) surface scanning; f) chemical shift data. 4.2 Analyst records 4.2.1 Sample labeling and preparation For each sample, the record or electronic document should contain the following information (sufficient information should be recorded to make the measurements repeatable in the future).

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