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Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
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GB/T 28893-2024
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| GB/T 28893-2012 | English | 639 |
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Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
| Obsolete |
GB/T 28893-2012
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PDF similar to GB/T 28893-2024
Basic data | Standard ID | GB/T 28893-2024 (GB/T28893-2024) | | Description (Translated English) | Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | G04 | | Classification of International Standard | 71.040.40 | | Word Count Estimation | 18,116 | | Date of Issue | 2024-03-15 | | Date of Implementation | 2024-10-01 | | Older Standard (superseded by this standard) | GB/T 28893-2012 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration |
GB/T 28893-2024: Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 71.040.40
CCSG04
National Standards of People's Republic of China
Replaces GB/T 28893-2012
Surface chemical analysis Auger electron spectroscopy and
X-ray photoelectron spectroscopy to measure the peak intensity
Methods and information needed to report results
(ISO 20903.2019, IDT)
Published on March 15, 2024, implemented on October 1, 2024
State Administration for Market Regulation
The National Standardization Administration issued
Table of Contents
Preface I
Introduction II
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Symbols and abbreviations 1
5 Method for determining direct peak intensity 1
5.1 General 1
5.2 Selection and subtraction of inelastic background 2
5.3 Measurement of peak intensity 3
5.4 Measurement of peak intensity using computer software 4
5.5 Peak intensity measurement of overlapping peak spectra 4
5.6 Measurement uncertainty of peak area 5
6 Method for determining peak intensity of Auger electron differential spectrum 5
6.1 General 5
6.2 Measurement of Auger Electron Differential Spectrum Intensity
6.3 Uncertainty in the measurement of the intensity of the Auger electron differential spectrum
7 Report on the method of measuring peak intensity 8
7.1 General requirements 8
7.2 Method for determining direct peak intensity 8
7.3 Methods for obtaining and measuring peak intensity of Auger electron differential spectrum 9
Appendix A (Informative) Effect of Instrument on Measurement Intensity 10
Appendix B (informative) Integration limits applicable when determining XPS peak intensities 11
Reference 12
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting is required.
This document replaces GB/T 28893-2012 "Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy for determination of peak intensity
Compared with GB/T 28893-2012, in addition to structural adjustments and editorial changes, the main technical
The changes are as follows.
a) The terms and definitions have been changed (see Chapter 3, Chapter 3 of the.2012 edition);
b) The content of 6.3 has been changed and replaced with a modern approach that includes the treatment of coexisting chemical states (see 6.3, 6.3 of the.2012 edition).
This document is equivalent to ISO 20903.2019 "Surface chemical analysis - determination of peaks by Auger electron spectroscopy and X-ray photoelectron spectroscopy"
Methods for determining the strength of a test and the information needed to report the results.
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document was proposed and coordinated by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38).
This document was drafted by. Xiamen Heqing Education Consulting Co., Ltd. and Xiamen University.
The main drafters of this document are. Xu Fuchun, Shi Haiyan, Cen Danxia, Tang Dingliang, Liu Fen and Wang Shuiju.
The previous versions of this document and the documents it replaces are as follows.
---First published in.2012 as GB/T 28893-2012;
---This is the first revision.
Introduction
The important feature of Auger electron spectroscopy and X-ray photoelectron spectroscopy is that they can obtain the surface area of solid samples (depth ≈ 1nm~10nm)
Such analysis requires the determination of the intensity of the spectral peaks.
Several peak intensity measurement methods are available for AES and XPS. In practice, the choice of method will depend on the type of sample being analyzed, the
The performance of the instruments used and the available data acquisition and processing methods.
Surface chemical analysis Auger electron spectroscopy and
X-ray photoelectron spectroscopy to measure the peak intensity
Methods and information needed to report results
1 Scope
This document specifies the necessary information required in the reporting of analytical results for peak intensity measurements of Auger electron spectroscopy and X-ray photoelectron spectroscopy.
Information is also provided on the peak intensity measurement method and the uncertainty of the derived peak areas.
2 Normative references
The contents of the following documents constitute the essential clauses of this document through normative references in this document.
For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to
This document.
Note. GB/T 22461.1-2023 Vocabulary for surface chemical analysis Part 1.General terms and spectral terms (ISO 18115-1.2013, IDT)
3 Terms and definitions
For the purpose of this document, the terms and definitions given in ISO 18115-1 apply.
4 Symbols and abbreviations
The following symbols and abbreviations apply to this document.
A. peak area
tainabaseline)
eV.electronvolts
ΔE. channel width, in electron volts (eV)
5 Method for determining direct peak intensity
5.1 General
Figure 1a) shows a portion of an X-ray photoelectron spectrum, with intensities indicated as kinetic energy increasing from left to right or binding energy increasing from right to left.
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