|
Std ID |
Description (Standard Title) |
Detail |
|
GB/T 12967.1-2008
|
Test Methods for anodic oxidation coatings of aluminium and aluminium alloys -- Part 1: Measurement of mean specific abrasion resistance of anodic oxidation coatings with an abrasive jet test Apparatus
|
GB/T 12967.1-2008
|
|
GB/T 12967.2-2008
|
Test Methods for anodic oxidation coatings of aluminium and aluminium alloys -- Part 2: measurement of wear resistance and wear index of anodic oxidation coatings with an abrasive wheel wear test apparatus
|
GB/T 12967.2-2008
|
|
GB/T 12967.3-2008
|
Test Methods for anodic oxidation coatings of aluminium and aluminium alloys -- Part 3: Copper accelerated acetic acid salt spray test (CASS test）
|
GB/T 12967.3-2008
|
|
GB/T 12967.6-2008
|
Test Methods for anodic oxidation coatings of aluminium and aluminium alloys -- Part 6: Determination of color differences and appearance of colored anodic oxide films by viewing method
|
GB/T 12967.6-2008
|
|
GB/T 22638.10-2008
|
Test methods for aluminium and aluminium alloy foils -- Part 10: Determination of mass per unit area (surface density) of coatings
|
GB/T 22638.10-2008
|
|
GB/T 22638.1-2008
|
Test methods for aluminium and aluminium alloy foils -- Part 1: Determination of thickness by gravimetric method
|
GB/T 22638.1-2008
|
|
GB/T 22638.2-2008
|
Test methods for aluminium and aluminium alloy foils -- Part 2: Determination of porosity
|
GB/T 22638.2-2008
|
|
GB/T 22638.3-2008
|
Test methods for aluminium and aluminium alloy foils -- Part 3: Determination of stickiness
|
GB/T 22638.3-2008
|
|
GB/T 22638.5-2008
|
Test methods for aluminium and aluminium alloy foils -- Part 5: Determination of wettability by brushing
|
GB/T 22638.5-2008
|
|
GB/T 22638.6-2008
|
Test methods for aluminium and aluminium alloy foils -- Part 6: Determination of direct current resistance
|
GB/T 22638.6-2008
|
|
GB/T 22638.7-2008
|
Test methods for aluminium and aluminium alloy foils -- Part 7: Determination of heat seal strength
|
GB/T 22638.7-2008
|
|
GB/T 22638.9-2008
|
Test methods for aluminium and aluminium alloy foils -- Part 9: Determination of hydrophilic property
|
GB/T 22638.9-2008
|
|
GB/T 20503-2006
|
Anodizing of aluminium and its alloys -- Measurement of specular reflectance and specular gloss at angles of 20-degree, 45-degree, 60-degreeor 85-degree, IDT
|
GB/T 20503-2006
|
|
GB/T 20504-2006
|
Anodizing of aluminium and its alloys -- Visual determination of image clarity of anodic oxidation coatings -- Chart scale method
|
GB/T 20504-2006
|
|
GB/T 20505-2006
|
Anodizing of aluminium and its alloys -- Measurement of reflectance characteristics of aluminium surfaces using integrating-sphere instruments
|
GB/T 20505-2006
|
|
GB/T 20506-2006
|
Anodizing of aluminium and its alloys -- Measurement of reflectivity characteristics of aluminium surfaces using abridged goniophotometer or goniophotometer
|
GB/T 20506-2006
|
|
GB/T 8752-2006
|
Anodizing of aluminium and its alloys -- Check of continuity of thin anodic oxide coating -- Copper sulphate test
|
GB/T 8752-2006
|
|
GB/T 8754-2006
|
Anodizing of aluminium and its alloys -- Insulation check by measurement of breakdown potential
|
GB/T 8754-2006
|
|
GB/T 2975-1998
|
Steel and steel products - Location and preparation of test pieces for mechanical testing
|
GB/T 2975-1998
|
|
GB/T 8013-1987
|
Anodizing of aluminium and aluminium alloys--General specifications for anodic oxidation coatings
|
GB/T 8013-1987
|
|
GB/T 8014-1987
|
Anodizing of aluminium and aluminium alloys--Definitions thickness of anodic oxidation coatings and conventions concerning the measurement of thickness
|
GB/T 8014-1987
|
|
GB/T 6803-1986
|
Standard method for conducting drop weight test to determine nil ductility transition temperature of ferritic steels
|
GB/T 6803-1986
|
|
GB/T 5058-1985
|
Steel--Determination of isothermal transformation diagram--Magnetic method
|
GB/T 5058-1985
|
|
GB/T 14140-2025
|
Test method for measuring diameter of semiconductor wafer
|
GB/T 14140-2025
|
|
GB/T 24582-2023
|
Test method for measuring surface metal impurity content of polycrystalline silicon - Acid extraction-inductively coupled plasma mass spectrometry method
|
GB/T 24582-2023
|
|
GB/T 35306-2023
|
Determination of carbon and oxygen content in single crystal silicon - Low temperature fourier transform infrared spectrometry method
|
GB/T 35306-2023
|
|
GB/T 1558-2023
|
Test method for substitutional carbon content in silicon by infrared absorption
|
GB/T 1558-2023
|
|
GB/T 24581-2022
|
Test method for III and Ⅴ impurities content in single crystal silicon - Low temperature FT-IR analysis method
|
GB/T 24581-2022
|
|
GB/T 37211.3-2022
|
Method for chemical analysis of metal germanium - Part 3: Determination of trace impurity elements content - Glow discharge mass spectrometry
|
GB/T 37211.3-2022
|
|
GB/T 42263-2022
|
Determination of nitrogen content in silicon single crystal - Secondary ion mass spectrometry method
|
GB/T 42263-2022
|
|
GB/T 42274-2022
|
Determination of the content and distribution of trace elements (magnesium, gallium) in aluminum nitride materials - Secondary ion mass spectrometry
|
GB/T 42274-2022
|
|
GB/T 42276-2022
|
Determination of fluorine ion and chloride ion in silicon nitride powder - Ion chromatography method
|
GB/T 42276-2022
|
|
GB/T 41153-2021
|
Determination of boron, aluminum and nitrogen impurity content in silicon carbide single crystal - Secondary ion mass spectrometry
|
GB/T 41153-2021
|
|
GB/T 14849.1-2020
|
Methods for chemical analysis of silicon metal - Part 1: Determination of iron content
|
GB/T 14849.1-2020
|
|
GB/T 14849.3-2020
|
Methods for chemical analysis of silicon metal - Part 3: Determination of calcium content
|
GB/T 14849.3-2020
|
|
GB/T 38976-2020
|
Test method for the oxygen concentration in silicon materials - Inert gas fusion infrared detection method
|
GB/T 38976-2020
|
|
GB/T 39144-2020
|
Test method for magnesium content in gallium nitride materials - Secondary ion mass spectrometry
|
GB/T 39144-2020
|
|
GB/T 39145-2020
|
Test method for the content of surface metal elements on silicon wafers - Inductively coupled plasma mass spectrometry
|
GB/T 39145-2020
|
|
GB/T 37385-2019
|
Test method for chloride content of silicon - Ion chromatography method
|
GB/T 37385-2019
|
|
GB/T 1557-2018
|
Test method for determining interstitial oxygen content in silicon by infrared absorption
|
GB/T 1557-2018
|
|
GB/T 4060-2018
|
Test method for boron content in polycrystalline silicon by vacuum zone-melting method
|
GB/T 4060-2018
|
|
GB/T 37049-2018
|
Test method for the content of metal impurity in electronic grade polysilicon -- Inductively coupled-plasma mass spectrometry method
|
GB/T 37049-2018
|
|
GB/T 37211.1-2018
|
Methods for chemical analysis of germanium metal -- Part 1: Determination of arsenic content -- Arsenic stain method
|
GB/T 37211.1-2018
|
|
GB/T 37211.2-2018
|
Methods for chemical analysis of germanium metal -- Part 2: Determination of aluminium, iron, copper, nickel, lead, cadmium, magnesium, cobalt, indium, zinc content -- Inductively coupled plasma mass spectrometry method
|
GB/T 37211.2-2018
|
|
GB/T 4059-2018
|
Test method for phosphorus content in polycrystalline silicon by zone-melting method under controlled atmosphere
|
GB/T 4059-2018
|
|
GB/T 34504-2017
|
Measurement method for surface metal contamination on sapphire polished substrate wafer
|
GB/T 34504-2017
|
|
GB/T 35306-2017
|
Test method for carbon and oxygen content of single crystal silicon -- Low temperature Fourier transform infrared spectrometry
|
GB/T 35306-2017
|
|
GB/T 35309-2017
|
Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies
|
GB/T 35309-2017
|
|
GB/T 17170-2015
|
Test method for the EL2 deep donor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy
|
GB/T 17170-2015
|
|
GB/T 19199-2015
|
Test methods for carbon acceptor concentration in semi-insulating gallium arsenide single crystals by absorption spectroscopy
|
GB/T 19199-2015
|
|
GB/T 24578-2015
|
Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy
|
GB/T 24578-2015
|
|
GB/T 32277-2015
|
Test method for instrumental neutron activation analysis (INAA) of silicon
|
GB/T 32277-2015
|
|
GB/T 32281-2015
|
Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock -- Secondary ion mass spectrometry
|
GB/T 32281-2015
|
|
GB/T 26067-2010
|
Standard test method for dimensions of notches on silicon wafers
|
GB/T 26067-2010
|
|
GB/T 26070-2010
|
Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method
|
GB/T 26070-2010
|
|
GB/T 26074-2010
|
Germanium monocrystal -- Measurement of resistivity -- DC linear four-point probe
|
GB/T 26074-2010
|
|
GB/T 14849.4-2008
|
Methods for chemical analysis of silicon metal -- Part 4: Determination of elements content Inductively coupled plasma atomic emission spectrometric method
|
GB/T 14849.4-2008
|
|
GB/T 11073-2007
|
Standard method for measuring radial resistivity variation on silicon slices
|
GB/T 11073-2007
|
|
GB/T 4059-2007
|
Polycrystalline silicon -- Examination method -- Zone-melting on phosphorus under controlled atmosphere
|
GB/T 4059-2007
|
|
GB/T 4060-2007
|
Polycrystalline silicon -- Examination method -- Vacuum zone-melting on boron
|
GB/T 4060-2007
|
|
GB/T 1557-2006
|
The method of determining interstitial oxygen content in silicon by infrared absorption
|
GB/T 1557-2006
|
|
GB/T 11068-2006
|
Gallium arsenide epitaxial layer -- Determination of carrier concentration voltage-capacitance method
|
GB/T 11068-2006
|
|
GB/T 4326-2006
|
Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
|
GB/T 4326-2006
|
|
GB/T 5252-2006
|
Germanium monocrystal -- Inspection of dislocation etch pit density
|
GB/T 5252-2006
|
|
GB/T 8757-2006
|
Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
|
GB/T 8757-2006
|
|
GB/T 8758-2006
|
Measuring thickness of epitaxial layers of gallium arsenide by infrared interference
|
GB/T 8758-2006
|
|
GB/T 8760-2006
|
Gallium arsenide single crystal-determination of dislocation density
|
GB/T 8760-2006
|
|
GB/T 19921-2005
|
Test method of particles on silicon wafer surfaces
|
GB/T 19921-2005
|
|
GB/T 19922-2005
|
Standard test methods for measuring site flatness on silicon wafers by noncontact scanning
|
GB/T 19922-2005
|
|
GB/T 4700.4-1998
|
Methods for chemical analysis of calcium-silicon The phosphomolybdenum blue photometric method for the determination of phosphorus content
|
GB/T 4700.4-1998
|
|
GB/T 4700.5-1998
|
Methods for chemical analysis of calcium-silicon The infrared absorption method for the determination of carbon content
|
GB/T 4700.5-1998
|
|
GB/T 4700.7-1998
|
Methods for chemical analysis of calcium-silicon The infrared absorption method and the combustion-potassium iodate titration method for the determination of sulfur content
|
GB/T 4700.7-1998
|
|
GB/T 14849.1-1993
|
Silicon metal. Determination of iron content. 1, 10-Phenanthroline spectrophotometric method
|
GB/T 14849.1-1993
|
|
GB/T 14849.2-1993
|
Silicon metal. Determination of aluminium content. Chrome azurol S spectrophotometric method
|
GB/T 14849.2-1993
|
|
GB/T 14849.3-1993
|
Silicon metal. Determination of calcium content
|
GB/T 14849.3-1993
|
|
GB/T 4298-1984
|
The activation analysis method for the determination of elemental impurities in semiconductor silicon materials
|
GB/T 4298-1984
|
|
GB/T 4373.1-1984
|
Methods for chemical analysis of arsenic--The potassium bromate volumetric method for the determination of arsenic content
|
GB/T 4373.1-1984
|
|
GB/T 4373.2-1984
|
Methods for chemical analysis of arsenic--The malachite green photometric method for the determination of antimony content
|
GB/T 4373.2-1984
|
|
GB/T 4373.3-1984
|
Methods for chemical analysis of arsenic--The barium sulphate gravimetric method for the determination of sulphur content
|
GB/T 4373.3-1984
|
|
GB/T 4373.4-1984
|
Methods for chemical analysis of arsenic--The dithio-diantipyrylmethane photometric method for the determination of bismuth content
|
GB/T 4373.4-1984
|
|
GB/T 4699.1-1984
|
Methods for chemical analysis of silicochromium--The gravimetric method for the determination of silicon content
|
GB/T 4699.1-1984
|
|
GB/T 4699.2-1984
|
Methods for chemical analysis of silicochromium--The alkaline fusion-ammonium persulfate oxidation volumetric method for the determination of chromium content
|
GB/T 4699.2-1984
|
|
GB/T 4699.3-1984
|
Methods for chemical analysis of silicochromium--The molybdenum blue photometric method for the determination of phosphorus content
|
GB/T 4699.3-1984
|
|
GB/T 4700.1-1984
|
Methods for chemical analysis of calcium-silicon--The perchloric acid dehydration-gravimetric method for the determination of silicon content
|
GB/T 4700.1-1984
|
|
GB/T 4700.3-1984
|
Methods for chemical analysis of calcium-silicon--The EDTA titrimetric method for the determination of aluminum content
|
GB/T 4700.3-1984
|
|
GB/T 45330-2025
|
Cathode materials for lithium ion batteries - Determination of water content - Carl fisher coulomb method
|
GB/T 45330-2025
|
|
GB/T 19396-2025
|
Terbium-dysprosium-iron magnetostrictive materials
|
GB/T 19396-2025
|
|
GB/T 9096-2025
|
Sintered metal materials, excluding hardmetals - Charpy impact test method
|
GB/T 9096-2025
|
|
GB/T 26050-2024
|
Hardmetals - Determination of contents of metallic elements - X-ray fluorescence spectrometry
|
GB/T 26050-2024
|
|
GB/T 23367.1-2024
|
Methods for chemical analysis of lithium cobalt oxide - Part 1: Determination of cobalt content - EDTA titration and potentiometric titration
|
GB/T 23367.1-2024
|
|
GB/T 5124.5-2024
|
Methods for chemical analysis of hardmetals - Part 5: Determination of tantalum and niobium content - Inductively coupled plasma emission spectrometry
|
GB/T 5124.5-2024
|
|
GB/T 42511-2023
|
Hardmetals - Determination of calcium, copper, iron, potassium, magnesium, manganese, sodium, nickel and zinc in cobalt metal powders - Flame atomic absorption spectrometric method
|
GB/T 42511-2023
|
|
GB/T 42515-2023
|
Metallic powders - Determination of acid-insoluble content in iron, copper, tin and bronze powders
|
GB/T 42515-2023
|
|
GB/T 11106-2022
|
Metallic powder - Determination of green strength by compression of cylinder compacts
|
GB/T 11106-2022
|
|
GB/T 41322-2022
|
Hardmetals - Determination of silicon in cobalt metal powders - Photometric method
|
GB/T 41322-2022
|
|
GB/T 41329-2022
|
Determination of flow rate of metallic powders - Calibrated funnel method (Gustavsson flowmeter)
|
GB/T 41329-2022
|
|
GB/T 1481-2022
|
Metallic powders, excluding powders for hardmetals - Determination of compressibility in uniaxial compression
|
GB/T 1481-2022
|
|
GB/T 41658-2022
|
Metallic powders, excluding hardmetals - Method for testing copper-base infiltrating powders
|
GB/T 41658-2022
|
|
GB/T 3488.4-2022
|
Hardmetals - Metallographic determination of microstructure - Part 4: Characterisation of porosity, carbon defects and eta-phase content
|
GB/T 3488.4-2022
|
|
GB/T 41704-2022
|
Test methods of cathode materials for lithium ion battery - Determination of magnetic impurities content and residual alkali content
|
GB/T 41704-2022
|