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Std ID |
Description (Standard Title) |
Detail |
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GB/T 14313-1993
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Rigid precision coaxial lines and their associated precision connectors, Generic specification of
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GB/T 14313-1993
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GB/T 14557-1993
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Electrical tests and measuring procedures for ridio-frequency connectors: Reflection factor
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GB/T 14557-1993
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GB/T 14865-1993
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R. F coaxial connectors of type SMB
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GB/T 14865-1993
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GB/T 13712-1992
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Fibre optic modulators. Part 1: Generic specification
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GB/T 13712-1992
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GB/T 13949-1992
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Application characteristics for 21-pin connector in video systems
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GB/T 13949-1992
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GB/T 12793-1991
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Generic specification for installing and removal tools for connectors electrical contact
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GB/T 12793-1991
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GB/T 12270-1990
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Electrical tests and measuring procedures for radio-frequency coaxial connectors screening effectiveness
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GB/T 12270-1990
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GB/T 12271-1990
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Measuring methods of RF insertion loss for radio-frequency coaxial connectors
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GB/T 12271-1990
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GB/T 12272-1990
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Measuring method of radio-frequency high potential withstanding voltage for radio-frequency coaxial connectors
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GB/T 12272-1990
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GB/T 12507-1990
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Connectors for optical fibres and cables--Part 1: Generic specification
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GB/T 12507-1990
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GB/T 9020-1988
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Visual-frequency coaxial connectors, Generic specification of
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GB/T 9020-1988
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GB/T 9538-1988
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General specification of flat cable connector
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GB/T 9538-1988
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GB/T 16514.2-2005
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Electromechanical switches for use in electronic equipment -- Part 5: Sectional specification for pushbutton switches -- Section 1: Blank detail specification
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GB/T 16514.2-2005
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GB/T 18496.2-2005
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Electromechanical switches for use in electronic equipment -- Part 4-1: Sectional specification for lever (toggle) switches -- Blank detail specification
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GB/T 18496.2-2005
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GB/T 18496-2001
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Electromechanical switches for use in electronic equipment -- Part 4: Sectional specification for lever (toggle) switches
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GB/T 18496-2001
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GB/T 13419-1998
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Electromechanical switches for use in electronic equipment. Part 6: Sectional specification for sensitive switches
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GB/T 13419-1998
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GB/T 13420-1998
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Electromechanical switches for use in electronic equipment. Part 6: Sectional specification for sensitive switches. Section 1: Blank detail specification
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GB/T 13420-1998
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GB/T 17209-1998
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Electromechanical switches for use in electronic equipment. Part 2: Sectional specification for rotary switches
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GB/T 17209-1998
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GB/T 17210-1998
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Electromechanical switches for use in electronic equipment. Part 2: Sectional specification for rotary switches. Section 1-Blank detail specification
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GB/T 17210-1998
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GB/T 16514-1996
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Electromechanical switches for use in electronic equipment. Part 5: Sectional specification for pushbutton switches
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GB/T 16514-1996
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GB/T 15461-1995
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Electromechanical switches for use in electronic equipments. Part 3: Sectional specification for in-line package switches
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GB/T 15461-1995
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GB/T 15462-1995
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Electromechanical switches for use in electronic equipments. Part 3-1: Blank detail specification for in-line package switches
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GB/T 15462-1995
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GB/T 9536-1995
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Electromechanical switches for use in electronic equipment. Part 1: Generic specification
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GB/T 9536-1995
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GB/T 14120-1993
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Dimensions for the mounting of single-hole, bush-mounted, spendle-operated electronic components
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GB/T 14120-1993
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GB/T 14280-1993
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Thermal time delay switch, Generic specification of
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GB/T 14280-1993
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GB/T 14281-1993
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Thermostatic switch, Generic specification of
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GB/T 14281-1993
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GB/T 13419-1992
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Electromechanical switches for electronic equipment--Part 6: sectional specification--Sensitive switches
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GB/T 13419-1992
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GB/T 13420-1992
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Electromechanical switches for electronic equipment Part 6: blank detail specification sensitive switches
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GB/T 13420-1992
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GB/T 9537-1988
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Keyboard switches for use in electronic equipment. Part 1: Generic specification
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GB/T 9537-1988
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GB/T 12274.401-2023
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Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
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GB/T 12274.401-2023
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GB/T 22317.401-2023
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Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
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GB/T 22317.401-2023
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GB/T 22317.4-2023
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Piezoelectric filters of assessed quality - Part 4: Sectional specification - Capability approval
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GB/T 22317.4-2023
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GB/T 22318.1-2023
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Surface acoustic wave (SAW) resonators - Part 1: Generic specification
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GB/T 22318.1-2023
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GB/T 22318.2-2023
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Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
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GB/T 22318.2-2023
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GB/T 22319.6-2023
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Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
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GB/T 22319.6-2023
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GB/T 27700.1-2023
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Surface acoustic wave(SAW) filters of assessed quality - Part 1: Generic specification
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GB/T 27700.1-2023
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GB/T 43023-2023
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Guidelines for the measurement method of nonlinearity for surface acoustic wave(SAW) and bulk acoustic wave(BAW) devices in radio frequency(RF)
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GB/T 43023-2023
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GB/T 43024.2-2023
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
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GB/T 43024.2-2023
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GB/T 43186.1-2023
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Surface acoustic wave (SAW) and bulk acoustic wave(BAW) duplexers of assessed quality - Part 1: Generic specification
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GB/T 43186.1-2023
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GB/T 43186.2-2023
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Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
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GB/T 43186.2-2023
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GB/T 8553-2023
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Generic specification for enclosures for crystal units
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GB/T 8553-2023
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GB/T 12274.4-2021
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Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional specification - Capability approval
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GB/T 12274.4-2021
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GB/T 22319.11-2018
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Measurement of quartz crystal unit parameters -- Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction
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GB/T 22319.11-2018
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GB/T 22319.9-2018
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Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units
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GB/T 22319.9-2018
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GB/T 12273.1-2017
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Quartz crystal units of assessed quality -- Part 1: Generic specification
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GB/T 12273.1-2017
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GB/T 32988-2016
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Synthetic quartz crystal wafer for optical low pass filter (OLPF)
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GB/T 32988-2016
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GB/T 15156-2015
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Generic specification for piezoelectric ceramic transducing elements
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GB/T 15156-2015
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GB/T 22319.7-2015
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Measurement of quartz crystal unit parameters -- Part 7: Measurement of activity dips of quartz crystal units
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GB/T 22319.7-2015
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GB/T 30118-2013
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Single crystal wafers for surface acoustic wave (SAW) device applications -- Specifications and measuring methods
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GB/T 30118-2013
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GB/T 11297.12-2012
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Test method for extinction ratio of optical crystal
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GB/T 11297.12-2012
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GB/T 12273.501-2012
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Quartz crystal units -- A specification in the quality assessment system for electronic components -- Part 5.1: Blank detail specification -- Qualification approval
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GB/T 12273.501-2012
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GB/T 12274.1-2012
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Quartz crystal controlled oscillators of assessed quality -- Part 1: Generic specification
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GB/T 12274.1-2012
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GB/T 12859.1-2012
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Piezoelectric ceramic resonators -- A specification in the IEC quality assessment System for electronic components (IECQ) -- Part 1: Generic specification -- Qualification approval
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GB/T 12859.1-2012
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GB/T 12859.201-2012
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Piezoelectric ceramic resonators -- A specification in the quality assessment System for electronic components (IECQ) -- Part 2-1: Blank detail specification -- Assessment level E
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GB/T 12859.201-2012
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GB/T 12859.2-2012
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Piezoelectric ceramic resonators -- A specification in the IEC quality assessment System for electronic components (IECQ) -- Part 2: Sectional specification -- Qualification approval
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GB/T 12859.2-2012
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GB/T 3352-2012
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Synthetic quartz crystal -- Specifications and guide to the use
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GB/T 3352-2012
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GB/T 9532-2012
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Designations for piezoelectric crystals
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GB/T 9532-2012
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GB/T 27700.1-2011
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Surface acoustic wave (SAW) filters of assessed quality -- Part 1: Generic specification
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GB/T 27700.1-2011
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GB/T 27700.2-2011
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Surface acoustic wave (SAW) filters of assessed quality -- Part 2: Guidance on use
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GB/T 27700.2-2011
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GB/T 22317.1-2008
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Piezoelectric filters of assessed quality -- Part 1: Generic specification
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GB/T 22317.1-2008
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GB/T 22318.1-2008
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Surface acoustic wave (SAW) resonators -- Part 1-1: General information and standard values
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GB/T 22318.1-2008
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GB/T 22318.2-2008
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Surface acoustic wave (SAW) resonators -- Part 1-2: Test conditions
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GB/T 22318.2-2008
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GB/T 22319.8-2008
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Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units
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GB/T 22319.8-2008
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GB/T 3389.6-1997
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Test methods for properties of piezoelectric ceramics. Thickness-shear vibration mode for rectangular plate
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GB/T 3389.6-1997
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GB/T 12273-1996
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Quartz crystal units. A specification in the quality assessment system for electronic components. Part 1: Generic specification
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GB/T 12273-1996
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GB/T 16516-1996
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Quartz crystal units. A specification in the quality assessment system for electronic components. Part 2: Sectional specification. Capability approval
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GB/T 16516-1996
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GB/T 16517-1996
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Quartz crystal units. A specification in the quality assessment system for electronic components. Part 3: Sectional specification. Qualification approval
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GB/T 16517-1996
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GB/T 15020-1994
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Quartz crystal units for use in electronic equipment. Bland detail specification for. Resistance welded quartz crystal units. Assessment level E
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GB/T 15020-1994
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GB/T 15156-1994
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Generic specification for piezoelectric ceramic transducing elements
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GB/T 15156-1994
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GB/T 14843-1993
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Lithium niobate single crystals
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GB/T 14843-1993
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GB/T 12859-1991
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Generic specification for piezoelectric ceramic resonators for use in electronic equipment
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GB/T 12859-1991
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GB/T 12860-1991
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Piezoelectric ceramic resonators for use in electronic equipment--Sectional specification for piezoelectric ceramic resonators for low frequency
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GB/T 12860-1991
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GB/T 12861-1991
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Piezoelectric ceramic resonators for use in electronic equipment--Blank detail specification for piezoelectric ceramic resonators for low frequency--Assessment level E
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GB/T 12861-1991
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GB/T 12862-1991
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Piezoelectric ceramic resonators for use in electronic equipment--Sectional specification for piezoeletric ceramic resonators for high frequency
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GB/T 12862-1991
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GB/T 12863-1991
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Piezoelectric ceramic resonators for use in electronic equipment--Blank detail specification for piezoelectric ceramic resonators for high frequency--Assessment level E
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GB/T 12863-1991
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GB/T 12274-1990
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Quartz crystal controlled oscillators--Generic specification for
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GB/T 12274-1990
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GB/T 12275-1990
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The rule of type designation for quarz crystal oscillators
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GB/T 12275-1990
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GB/T 9532-1988
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Designations for LiNbO3, LiTaO3, Bi12GeO20, Bi12SiO20 piezoelectric crystals
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GB/T 9532-1988
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GB/T 8553-1987
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Holders (Enclosures), crystal, General specification for
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GB/T 8553-1987
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GB/T 6429-1986
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The rule of type designation for quartz crystal units
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GB/T 6429-1986
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GB/T 6430-1986
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The rule of type designation for crystal holders (enclosures)
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GB/T 6430-1986
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GB/T 6627-1986
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Designation for lumbered synthetic quartz crystal
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GB/T 6627-1986
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GB/T 43795-2024
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Test method for the mechanical strength of cores made of magnetic oxides
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GB/T 43795-2024
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GB/T 43870.1-2024
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Measurement methods for Curie temperature of magnetic materials - Part 1: Permanent magnetic materials
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GB/T 43870.1-2024
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GB/T 43870.2-2024
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Measurement methods for Curie temperature of magnetic materials - Part 2: Soft magnetic materials
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GB/T 43870.2-2024
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GB/T 44058-2024
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Marking on ferrite cores
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GB/T 44058-2024
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GB/T 44069.4-2024
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Ferrite cores - Guidelines on dimensions and the limits of surface irregularities - Part 4: RM-cores
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GB/T 44069.4-2024
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GB/T 21219-2023
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Magnetic materials - Classification
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GB/T 21219-2023
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GB/T 28869.2-2023
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Cores made of soft magnetic materials - Measuring methods - Part 2: Magnetic properties at low excitation level
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GB/T 28869.2-2023
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GB/T 28869.3-2023
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Cores made of soft magnetic materials - Measuring methods - Part 3: Magnetic properties at high excitation level
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GB/T 28869.3-2023
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GB/T 43593-2023
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Ferrite cores - Standard inductance factor for gapped cores and its tolerance
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GB/T 43593-2023
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GB/T 40675.1-2021
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Noise suppression sheet for digital devices and equipment - Part 1: Definitions and general properties
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GB/T 40675.1-2021
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GB/T 40675.2-2021
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Noise suppression sheet for digital devices and equipment - Part 2: Measuring methods
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GB/T 40675.2-2021
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GB/T 40675.3-2021
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Noise suppression sheet for digital devices and equipment - Part 3: Characterization of parameters of noise suppression sheet
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GB/T 40675.3-2021
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GB/T 36103.1-2018
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Ferrite cores -- Dimensions -- Part 1: General specification
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GB/T 36103.1-2018
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GB/T 36103.14-2018
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Ferrite cores -- Dimensions -- Part 14: EFD-cores for use in power supply applications
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GB/T 36103.14-2018
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GB/T 36103.7-2018
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Ferrite cores -- Dimensions -- Part 7: EER-cores
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GB/T 36103.7-2018
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GB/T 9634.8-2018
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Ferrite cores -- Guideline on the limits of surface irregularities -- Part 8: PQ-cores
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GB/T 9634.8-2018
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GB/T 11436-2012
|
Chemical analysis methods for products and semi-finished products made of soft ferrite materials
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GB/T 11436-2012
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GB/T 12796.1-2012
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Permanent ferrite magnets -- Part 1: Generic specification
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GB/T 12796.1-2012
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