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GB/T 43024.2-2023: Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
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Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
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GB/T 43024.2-2023
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Basic data | Standard ID | GB/T 43024.2-2023 (GB/T43024.2-2023) | | Description (Translated English) | Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L21 | | Classification of International Standard | 31.140 | | Word Count Estimation | 22,278 | | Date of Issue | 2023-09-07 | | Date of Implementation | 2024-01-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 43024.2-2023: Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
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ICS 31.140
CCSL21
National Standards of People's Republic of China
Measurement techniques for piezoelectric, dielectric and electrostatic oscillators
Part 2.Phase Jitter Measurement Methods
(IEC 62884-2.2017,IDT)
Published on 2023-09-07
2024-01-01 Implementation
State Administration for Market Regulation
Released by the National Standardization Administration Committee
Table of contents
Preface III
Introduction IV
1 Scope 1
2 Normative reference documents 1
3 Terms and Definitions 1
4 Measurements and Measurement Procedures 2
4.1 Overview 2
4.2 Phase jitter measurement method 2
4.3 Measuring the input and output impedance of the system 6
4.4 Measuring equipment 6
4.5 Measuring fixture 6
4.6 Cables, tools and instruments, etc. 6
5 Measurement and Measurement Environment 7
5.1 Settings before measurement 7
5.2 Precautions during measurement 7
5.3 Processing after measurement 7
6 Measure 7
6.1 Reference temperature 7
6.2 Measurement of temperature characteristics 7
6.3 Measurement of vibration state 7
6.4 Measurement of impact state 7
6.5 Measurement of accelerated aging7
7 Other precautions 8
8 other 8
Appendix A (informative) Phase jitter calculation method 9
A.1 Overview 9
A.2 Note 9
A.3 Relationship between phase noise and phase jitter9
A.4 Introduction to the theoretical sources of phase jitter10
A.5 Note 10
A.6 Measurement Points 12
Reference 15
Figure 1 Measuring phase jitter with a sampling oscilloscope2
Figure 2 Jitter and drift analyzer block diagram 4 recommended by ITU-TO.172
Figure 3 Equivalent block diagram 5
Figure A.1 Conceptual diagram of single sideband phase noise10
Figure A.2 Voltage-time relationship 11
Figure A.3 Root mean square jitter diagram 13
Figure A.4 Schematic diagram of random jitter, deterministic jitter and total jitter13
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents"
Drafting.
This document is Part 2 of GB/T 43024 "Measurement Technology of Piezoelectric, Dielectric and Electrostatic Oscillators". GB/T 43024 has been released
The following sections are included.
---Part 2.Phase jitter measurement method.
This document is equivalent to IEC 62884-2.2017 "Measurement techniques for piezoelectric, dielectric and electrostatic oscillators Part 2.Phase jitter measurement"
Quantitative Methods".
Please note that some content in this document may be subject to patents. The publisher of this document assumes no responsibility for identifying patents.
This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China.
This document is under the jurisdiction of the National Technical Committee on Standardization of Piezoelectric Devices for Frequency Control and Selection (SAC/TC182).
This document was drafted by. Hebei Bowei Integrated Circuit Co., Ltd., Beijing Chenjing Electronics Co., Ltd., Tangshan Guoxin Jingyuan Electronics Co., Ltd.
company.
The main drafters of this document. Fang Xiucheng, Tang Yi, Zhang Liqiang.
Introduction
As a high-precision oscillation frequency source, crystal oscillator is widely used in electronic equipment, communication systems, measurement equipment and clock fields.
Recently, the digitization of electronic systems has developed rapidly. In this situation, the frequency of the crystal oscillator requires better accuracy and stability.
Swing noise also needs to be further reduced. Phase jitter is one of the oscillator noise characteristics, which needs to be accurately measured before product delivery.
Measurement.
In the latest application fields of electronic information and communication engineering (such as advanced satellite communications and electric vehicle control circuits), universal phase jitter
Guidelines on dynamic measurement methods are even more necessary. At present, from the perspective of electromagnetic interference (EMI), the measurement method of phase jitter has become more and more important.
wanted.
GB/T 43024 "Measurement Technology of Piezoelectric, Dielectric and Electrostatic Oscillators" aims to provide measurement and test methods for piezoelectric, dielectric and electrostatic oscillators.
The test method is intended to consist of the following parts.
---Part 1.Basic measurement methods. The purpose is to give the basic measurement methods of oscillators, including test conditions, appearance and dimensions
Procedures for inspection, basic electrical performance testing, mechanical and environmental testing.
---Part 2.Phase jitter measurement method. The purpose is to give a method of phase jitter measurement to accurately measure the root mean square
Jitter.
---Part 3.Test methods for frequency aging. The purpose is to provide aging test methods and provide information for prediction of frequency aging data.
in accordance with.
---Part 4.Test methods for short-term frequency stability. The purpose is to standardize the testing and evaluation methods of short-term frequency stability.
Measurement techniques for piezoelectric, dielectric and electrostatic oscillators
Part 2.Phase Jitter Measurement Methods
1 Scope
This document describes piezoelectric, dielectric and electrostatic oscillators, including oscillators using dielectric resonators (DRO) and those using thin film bulk acoustic waves.
Phase jitter measurement method for oscillators of resonators (FBAR), giving guidance on phase jitter measurements to accurately measure the root mean square
Jitter.
This measurement method uses phase noise measurement equipment or phase noise measurement system.
Note 1.Measurements of dielectric oscillators (DRO) and FBAR oscillators are under consideration.
Note 2.In the absence of confusion, "piezoelectric, dielectric and electrostatic oscillators" in this document are simply referred to as "oscillators".
2 Normative reference documents
The contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations
For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to
this document.
ISO 80000-1 Quantities and units Part 1.General (Quantitiesandunits-Part 1.General)
IEC 60050-561 International Electrotechnical Vocabulary Part 561.Piezoelectric, dielectric and electrostatic devices and phases for frequency control, selection and detection
IEC 60679-1.2017 Qualified piezoelectric, dielectric and electrostatic oscillators Part 1.General specification (Piezoelectric, die-
Note. GB/T 12274.1-2012 Quartz crystal oscillators with quality assessment Part 1.General specifications (IEC 60679-1.2007, MOD)
IEC 60469 Transformation terms, definitions and algorithms for pulses and related waveforms (Transitions, pulses and related
Note. GB/T 4728 Graphical symbols for electrical diagrams (IEC 60617 database, IDT)
IEC 62884-1.2017 Measurement techniques for piezoelectric, dielectric and electrostatic oscillators Part 1.Basic measurement methods
3 Terms and definitions
IEC 60027 (all parts), IEC 60050-561, IEC 60469, IEC 60617, IEC 60679-1.2017 and ISO 80000-1
Defined terms and definitions apply to this document.
The database of standardized terminology used by ISO and IEC can be consulted at.
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