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GB/T 32988-2016: Synthetic quartz crystal wafer for optical low pass filter (OLPF)
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| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| GB/T 32988-2016 | English | 279 |
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Synthetic quartz crystal wafer for optical low pass filter (OLPF)
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GB/T 32988-2016
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PDF similar to GB/T 32988-2016
Basic data | Standard ID | GB/T 32988-2016 (GB/T32988-2016) | | Description (Translated English) | Synthetic quartz crystal wafer for optical low pass filter (OLPF) | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L21 | | Classification of International Standard | 31.160 | | Word Count Estimation | 14,134 | | Date of Issue | 2016-10-13 | | Date of Implementation | 2017-09-01 | | Regulation (derived from) | National Standard Notice No.1716 of 2016 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | GB/T 32988-2016: Synthetic quartz crystal wafer for optical low pass filter (OLPF)---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Synthetic quartz crystal wafer for optical low pass filter (OLPF)
ICS 31.160
L21
National Standards of People's Republic of China
Artificial quartz optical low - pass filter chip
2016-10-13 released
2017-09-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
China National Standardization Management Committee released
Directory
Preface III
1 Scope 1
2 normative reference document 1
3 Terms and definitions 1
4 grading 3
5 requirements 4
5.1 chip 4
5.2 Size and angle 4
5.3 Chip surface flaws 5
5.4 Chip face deviation 6
6 Test Method 6
6.1 Inclusions and cracks 6
6.2 Stripes 6
6.3 Size 6
6.4 tangential and angular deviation 6
6.5 chamfer and chamfer 6
6.6 verticality 7
6.7 TV5 7
6.8 Surface flaws 7
6.9 Face deviation 7
7 Inspection rules 8
7.1 Sampling plan 8
7.2 Judgment Rule 8
7.3 Type test 8
8 Packaging, marking, delivery conditions 8
8.1 Packaging 8
8.2 Identification 8
8.3 Delivery conditions 8
Reference 9
Foreword
This standard is drafted in accordance with the rules given in GB/T 1.1-2009.
Please note that some of the contents of this document may involve patents. The issuer of this document does not assume responsibility for the identification of these patents.
This standard is proposed by the China Building Materials Federation.
This standard is under the jurisdiction of the National Committee for Standardization of Artificial Crystals (SAC/TC461).
This standard drafting unit. Shuo light special crystal Technology Co., Ltd., Zhejiang Crystal Optoelectronics Technology Co., Ltd.
The main drafters of this standard. Zhang Shaofeng, Zhang Xuan, Sun Zhiwen, Wang Baoxin, Shang Jiwu, Qiu Huan, Hua Dachen.
Artificial quartz optical low - pass filter chip
1 Scope
This standard specifies the artificial quartz optical low-pass filter chip terminology and definition, classification, requirements, test methods, inspection rules and packaging,
Logo, delivery conditions.
This standard applies to artificial quartz optical low-pass filter chips.
2 normative reference documents
The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article
Pieces. For undated references, the latest edition (including all modifications) applies to this document.
GB/T 1185 Optical parts surface flaws
GB/T 2828.1-2012 Count Sampling Inspection Procedures Part 1. Inspection by batch (AQL)
Plan (ISO 2859-1..1999)
GB/T 2831 Surface deviation of optical parts
Test method for thickness and total thickness variation of silicon wafers GB/T
GB/T 7895 artificial optics quartz crystal
Test method for artificial optics quartz crystal GB/T 7896-2008
3 terms and definitions
GB/T 7895, GB/T 1185 and GB/T 2831 and the following terms and definitions apply to this document. In order to facilitate
Use the following to repeat some of the above terms and definitions.
3.1
Optical low-pass filter chip opticallow-passfilterwafer; OLPFwafer
Made of quartz crystal and other materials, the monolithic or multi-chip combination and coating, so that a certain frequency below the optical signal components through, and inhibition
The frequency of the optical signal component above the optical substrate.
3.2
Effective area fixedqualityarea; FQA
Removing the crystal surface area of the wafer edge at a specific distance X. Refer to the area included in the dotted line in Figure 1.
Note. The boundary of the FQA usually refers to all points that are spaced from the edge of the wafer (including the reference edge).
[IEC 62276-2005, definition 3.7.1]
3.3
Inclusions
The crystal is immersed in the refractive index matching liquid, and the scattered light from the light source is used to observe the foreign matter visible in the artificial quartz crystal. The most common
The inclusions are pyroxene.
[GB/T 7895-2008, definition 3.6]
3.4
Stripe striae
In the artificial quartz crystal, the stripe-like defects observed in the local area of the crystal due to the change in the refractive index.
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