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GB/T 22319.9-2018: Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units
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Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units
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GB/T 22319.9-2018
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Basic data | Standard ID | GB/T 22319.9-2018 (GB/T22319.9-2018) | | Description (Translated English) | Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L21 | | Classification of International Standard | 31.140 | | Word Count Estimation | 14,139 | | Date of Issue | 2018-03-15 | | Date of Implementation | 2018-10-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 22319.9-2018: Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Measurement of quartz crystal unit parameters--Part 9. Measurement of spurious resonances of piezoelectric crystal units
ICS 31.140
L21
National Standards of People's Republic of China
Measurement of quartz crystal element parameters
Part 9. Quartz crystal elements
Parasitic resonance measurement
Part 9. Measurementofspuriousresonancesofpiezoelectriccrystalunits
(IEC 60444-9.2007, IDT)
Published by.2018-03-15
2018-10-01 implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
China National Standardization Administration released
Foreword
GB/T 22319 "Measurement of Quartz Crystal Element Parameters" is divided into the following parts.
--- Part 1. Basic method for measuring the resonant frequency and resonant resistance of a quartz crystal element using the π-network zero-phase method;
--- Part 2. The phase offset method for measuring the dynamic capacitance of a quartz crystal element;
---Part 4. Measurement methods for load resonance frequency and load resonance resistance RL for quartz crystal elements with frequency up to 30 MHz and others
The calculation of the derived parameter;
--- Part 5. Methods for determining equivalent electrical parameters using automatic network analysis techniques and error correction;
--- Part 6. Measurement of stimulus level correlation (DLD);
--- Part 7. Measurement of the activity jump of quartz crystal elements;
--- Part 8. Measurement fixtures for surface mounted quartz crystal components;
--- Part 9. Measurement of spurious resonance of a quartz crystal element;
---Part 11. Standard for Determining Load Resonance Frequency and Equivalent Load Capacitance Using Automatic Network Analysis Technique and Error Correction
method.
This part is Part 9 of GB/T 22319.
This section was drafted in accordance with the rules given in GB/T 1.1-2009.
This section uses the translation method equivalent to the use of IEC 60444-9.2007 "Quartz crystal element parameters measurement - Part 9. Quartz crystal element
Parasitic resonance measurement."
This section made the following editorial changes.
--- Chapter 1 Paragraph 1 "This part improves and improves the reproducibility and accuracy of measurement compared to earlier methods." and below
In the bridge measurement method specified in the “Early Quartz Resonator Response Measurement Method”, a method that cannot meet reproducibility requirements was used.
Components such as variable resistors and hybrid transformers. "Instead of a note, and removed the following"
Is no longer on sale";
--- The last "method of method B in Chapter 1 is an improvement of the "baseline method" in the early standard." Instead, it is given in the form of a note;
---3.1.1c) Chinese (14) The following "if the amplitude of these two data points are greater than Qmax" is replaced by "if the amplitude of these two data points are large
In Qmin".
Please note that some of the contents of this document may involve patents. The issuing agency of this document does not assume responsibility for identifying these patents.
This section was proposed by the Ministry of Industry and Information Technology of the People's Republic of China.
This part is under the jurisdiction of the National Standardization Technical Committee for Frequency Control and Selection of Piezoelectric Devices (SAC/TC182).
This section was drafted by. China Electronic Component Industry Association Piezoelectric Crystal Branch, Chengdu Tian Ao Electronics Co., Ltd., Wuhan Haichuang Electric
Subsidiary company.
The main drafters of this section. Zhang Yi, Huang Hao, Mao Jing.
Measurement of quartz crystal element parameters
Part 9. Quartz crystal elements
Parasitic resonance measurement
1 Scope
This part of GB/T 22319 specifies two methods of measuring the parasitic (useless) resonance of a quartz crystal element.
Note. Compared with earlier methods, this part improves and improves the reproducibility and accuracy of the measurement. In the early prescribed method of bridge measurement, the use of a
Components that require reproducibility, such as variable resistors and hybrid transformers.
Method A (all parameter measurement method)
The parametric measurement method can determine the equivalent electrical parameters of the spurious resonance. This method uses a measuring device with the same principle as IEC 60444-5.
This method is a preferred measurement method that can be used to measure low-to-medium impedance parasitic resonances up to several thousand ohms.
Method B (resistance measurement method)
Resistance measurements should be used to measure high-impedance spurious resonances as specified, such as certain filtered crystals. This method uses method A
The same measuring equipment is connected with the specified test fixture, which is composed of commercially available microwave components, such as having an accurate 50Ω
System impedance of 180° hybrid coupler and 10dB attenuator.
Note. This method is an improvement over the "benchmarking method" used in earlier standards.
2 Overview
Quartz crystal elements can exhibit multiple resonances, which can be represented in parallel with multiple series resonant circuits. Complete quartz crystal element single-ended
The equivalent circuit is shown in Figure 1 (derived from IEC 60444-5).
Figure 1 Multi-resonant single-ended equivalent circuit
Therefore, the total admittance Ytot of the equivalent circuit of n resonances is expressed by Equation (1) as.
Ytot=G0 jωC0 ∑
Yi (1)
In the formula.
Ytot --- total admittance of the equivalent circuit, the unit is Siemens (S);
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