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GB/T 22319.8-2008: Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units
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Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units
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GB/T 22319.8-2008
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Basic data | Standard ID | GB/T 22319.8-2008 (GB/T22319.8-2008) | | Description (Translated English) | Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L21 | | Classification of International Standard | 31.140 | | Word Count Estimation | 7,760 | | Date of Issue | 2008-08-06 | | Date of Implementation | 2009-01-01 | | Quoted Standard | IEC 60444-1-1986; IEC 60444-2-1980; IEC 60444-5-1995; IEC 61240-1994 | | Adopted Standard | IEC 60444-8-2003, IDT | | Regulation (derived from) | Announcement of Newly Approved National Standards No. 14 of 2008 (total 127) | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China | | Summary | This standard provides accurate measurements leadless surface mount quartz crystal components with resonant frequencies, resonant resistance and equivalent circuit parameters measuring jig, measurement method using IEC 60444-4-1988 and IEC 60444-5-1995 prescribed zero phase technologies. Using the equivalent circuit of the measuring jig and the applicable frequency range given in the subsequent clauses. In addition, this section also applies to IEC 61240-1994 leadless crystal element in the housing. Measuring jig and electrical equivalent circuit parameters are based on IEC 60444-1-1986 and IEC 60444-4-1988. 10pF load capacitance range or higher. This section also provides the measurement system and CL calibration sheet. This section applies to be able to accurately measure the resonant frequency of quartz crystal components, resonant resistance and capacitance C0, C1 and dynamic motional capacitance measuring jig inductor L1, the frequency range of 1MHz ~ 150MHz, auto- based IEC 60444-5-1995 network analyzer. | GB/T 22319.8-2008: Measurement of quartz crystal unit parameters -- Part 8: Test fixture for surface mounted quartz crystal units
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Measurement of quartz crystal unit parameters Part 8. Test fixture for surface mounted quartz crystal units
ICS 31.140
L21
National Standards of People's Republic of China
GB/T 22319.8-2008/IEC 60444-8.2003
Measurement of quartz crystal unit parameters
Part 8. SMD quartz crystal element
Test fixture
(IEC 60444-8.2003, IDT)
Posted 2008-08-06
2009-01-01 implementation
Administration of Quality Supervision, Inspection and Quarantine of People's Republic of China
Standardization Administration of China released
Foreword
GB/T 22319 "Measurement of quartz crystal unit parameters" is divided into the following sections.
--- Part 1. Basic method for quartz crystal element resonance frequency and resonance resistance was measured with type π - Network Zero Phase;
--- Part 2. Measurement of quartz crystal element dynamic phase offset circuit of law;
--- Part 3. use and have capacitive π-type phase network measurement frequency C0 compensation up to 200MHz quartz crystal element two
The basic method of end of network parameters;
--- Part 4. The frequency of 30MHz quartz crystal load resonant frequency of the element and measuring methods for the load resonance resistance RL and other
Export parameter calculation;
--- Part 5. automatic network analyzer techniques and error correction method to determine the equivalent electrical parameters;
--- Part 6. excitation level measurement correlation (DLD) of;
--- Part 7. quartz crystal element vigor and frequency drop measurement;
--- Part 8. SMD quartz crystal units measuring jig;
--- Part 9. Measurement of quartz crystal components parasitic resonances.
This is Part 8 GB/T 22319 of.
This section identical with IEC 60444-8.2003 "Measurement of quartz crystal unit parameters - Part 8. SMD quartz crystal element
Test fixture "(in English).
For ease of use, this section made the following editorial changes.
a) Remove the preface to international standards;
b) delete the introduction of international standards;
c) The figures in this section focus on the final text;
d) The second paragraph of the original 6.1 "50 ± 5%" to "50 × (1 ± 5%) Ω".
This section proposed by the People's Republic of China Ministry of Information Industry.
This part of the National Focal frequency control and selection piezoelectric device Standard Authority.
This section drafted by. China Electronic Components Industry Association Branch of the piezoelectric crystal.
The main drafters of this section. Zhang Yi, Jiang Liansheng.
GB/T 22319.8-2008/IEC 60444-8.2003
Measurement of quartz crystal unit parameters
Part 8. SMD quartz crystal element
Test fixture
1 Scope
This section GB/T 22319 requirements can accurately measure the leadless surface mount quartz crystal element of the resonant frequency, the resonant resistance and
Equivalent measuring jig circuit parameters, measurement methods IEC 60444-4. zero phase technique in 1995 stipulated. 1988 and IEC 60444-5.
Use the measuring jig equivalent circuit and the applicable frequency range given in the subsequent provisions.
In addition, this section also applies to IEC 61240.1994 in the leadless crystal element housing. Measuring jig and electrical equivalent circuit parameters
They are based on the IEC 60444-1. 1986 and IEC 60444-4. 1988. 10pF load capacitance range or higher. This section also specifies the test
CL system and the amount of the calibration sheet.
This section applies to accurately measure the resonant frequency of the quartz crystal element, resonance resistance, and capacitance C0, C1 and dynamic power dynamic capacitance
Inductance L1 measurement jig, the frequency range of 1MHz ~ 150MHz, based on IEC 60444-5.1995 automatic network analyzer.
2 Normative references
The following documents contain provisions which, through reference GB/T 22319 in this section constitute provisions of this section. For dated reference documents
Member, all subsequent amendments (not including errata content) or revisions do not apply to this section, however, encouraged to reach under this section
Parties to research agreement to use the latest versions of these documents. For undated reference documents, the latest versions apply to this
section.
IEC 60444-1. 1986 using technology π - Network Zero Phase Measurement of quartz crystal unit parameters - Part 1. The π - Network Zero Phase
The basic method of quartz crystal resonance frequency and resonance resistance of bit technology to measure
IEC 60444-2. 1980 using technology π - Network Zero Phase Measurement of quartz crystal unit parameters - Part 2. Phase offset method to measure
Dynamic capacitance of quartz crystal element
IEC 60444-5.1995 Measurement of quartz crystal unit parameters - Part 5. automatic network analyzer techniques and error correction correct
Equivalent electrical parameters of the given method
IEC 61240.1994 Piezoelectric devices for frequency control and selection using surface mount devices (SMD) Outline Drawing General
3 General
Measuring jig and measurement methods for measuring the resonant frequency, the resonant resistance and equivalent circuit parameters must be made by the supplier and crystal element
The user specified in the contract. Of leadless crystal element to be specially considered.
4 leadless surface mount quartz crystal element
4.1 shell
Type the housing without special provisions, we recommend using IEC 61240.1994 pattern shown.
4.2 overtone and frequency range
Since the measurement zero-phase technique, no special provisions for overtone. When no load capacitance, frequency range of 1 MHz ~
150MHz, a load capacitance, frequency range 1MHz ~ 30MHz.
5 measurement methods and technical requirements of the fixture
Technical requirements 5.1 Measurement Method
Methods of measurement in accordance with IEC 60444-5.1995 requirements, and the use of admittance circle method.
GB/T 22319.8-2008/IEC 60444-8.2003
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