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GB/T 22319.11-2018: Measurement of quartz crystal unit parameters -- Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction
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Measurement of quartz crystal unit parameters -- Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction
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GB/T 22319.11-2018
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Basic data | Standard ID | GB/T 22319.11-2018 (GB/T22319.11-2018) | | Description (Translated English) | Measurement of quartz crystal unit parameters -- Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L21 | | Classification of International Standard | 31.140 | | Word Count Estimation | 14,167 | | Date of Issue | 2018-03-15 | | Date of Implementation | 2018-10-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 22319.11-2018: Measurement of quartz crystal unit parameters -- Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Measurement of quartz crystal unit parameters--Part 11. Standard method for the determination of the load resonance frequency fL and the effective load capacitance C Leff using automatic network analyzer techniques and error correction
ICS 31.140
L21
National Standards of People's Republic of China
Measurement of quartz crystal element parameters
Part 11. Using Automatic Network Analysis Techniques and
Error correction determines the resonant frequency of the load and
Standard method for effective load capacitance
Part 11. Standard method forthedeterminationof theloadresonance
(IEC 60444-11.2010, IDT)
2018-03-15 Release.2018-10-01 Implementation
General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China
China National Standardization Administration released
Foreword
GB/T 22319 "Measurement of Quartz Crystal Element Parameters" is divided into the following parts.
--- Part 1. Basic method for measuring the resonant frequency and resonant resistance of a quartz crystal element using the π-network zero-phase method;
--- Part 2. The phase offset method for measuring the dynamic capacitance of a quartz crystal element;
---Part 4. Measurement methods for load resonance frequency and load resonance resistance RL for quartz crystal elements with frequency up to 30 MHz and others
The calculation of the derived parameter;
--- Part 5. Methods for determining equivalent electrical parameters using automatic network analysis techniques and error correction;
--- Part 6. Measurement of stimulus level correlation (DLD);
--- Part 7. Measurement of the activity jump of quartz crystal elements;
--- Part 8. Measurement fixtures for surface mounted quartz crystal components;
--- Part 9. Measurement of spurious resonance of a quartz crystal element;
---Part 11. Standards for Determining Resonance Frequency and Effective Load Capacities of Loads Using Automatic Network Analysis Techniques and Error Correction
method.
This part is Part 11 of GB/T 22319.
This section was drafted in accordance with the rules given in GB/T 1.1-2009.
This section uses the translation method identical to the use of IEC 60444-11.2010 "Measurement of Quartz Crystal Element Parameters. Part 11. Using Automatic
Network Analysis Techniques and Error Corrections Standard Methods for Determining Load Resonance Frequency fL and Effective Load Capacitor CLeff.
The Chinese documents that have a consistent correspondence with the normatively quoted international documents in this section are as follows.
--- GB/T 12273.1-2017 Qualified quartz crystal elements - Part 1. Generic specification (IEC 60122-1.2002,
MOD)
--- SJ/T 11210-1999 Measurement of Quartz crystal element parameters - Part 4. Quartz crystal elements up to 30 MHz
Calculation of load resonant frequency fL and load resonance resistance RL and calculation of other derived parameters (IEC 60444-4.1988,
IDT)
This section made the following editorial changes.
---3.1 "The load resonance frequency fL is the lower of the two frequencies" is replaced by "In practice, the load resonance frequency fL is two frequencies.
The lower frequency of the rate";
In the denominator of (5) in (a)-(4.2b), "Z3(V2-V2)" is replaced by "Z3(V1-V2)";
--- Illustration in Figure 2, the dashed line indicates that "XC (Ω)" is changed to "VC", and the solid line indicates that "VC" is changed to "XC (Ω)".
Please note that some of the contents of this document may involve patents. The issuing agency of this document does not assume responsibility for identifying these patents.
This section was proposed by the Ministry of Industry and Information Technology of the People's Republic of China.
This part is under the jurisdiction of the National Standardization Technical Committee for Frequency Control and Selection of Piezoelectric Devices (SAC/TC182).
This section was drafted by. China Electronic Component Industry Association Piezoelectric Crystal Branch, Nanjing Zhongdian Panda Crystal Technology Co., Ltd., Zhengzhou Original
Chuang Electronic Technology Co., Ltd.
The main drafters of this section. Zhang Yi, Gao Zhixiang, Zou Fei.
Measurement of quartz crystal element parameters
Part 11. Using Automatic Network Analysis Techniques and
Error correction determines the resonant frequency of the load and
Standard method for effective load capacitance
1 Scope
This part of GB/T 22319 specifies that when the figure of merit M of the quartz crystal element is greater than 4, the nominal load capacitance CL corresponds to the quartz crystal
The method of measuring the resonant frequency fL of the component load and the effective load capacitance CLeff at the nominal frequency.
According to the definition in Table 1 of IEC 60122-1.2002, M is characterized by formula (1).
M =
γ =
ωC0R1
(1)
In the formula.
M --- the merit of the quartz crystal element;
Q --- quality factor;
γ ---capacitance ratio;
ω --- angular frequency in radians per second (rad/s);
C0 --- parallel capacitor in equivalent circuit, unit Farah (F);
R1—dynamic resistance in the equivalent circuit in ohms (Ω).
When the frequency reaches.200MHz and below, this part can get good results, and can calculate the load resonance frequency offset ΔfL.
Traction sensitivities S are calculated according to the traction ranges ΔfL1, L2 and as defined in 2.2.31 of IEC 60122-1.2002. With IEC 60444-4
In contrast to the simple measurement, this measurement technique avoids the use of physical load capacitors and therefore has higher measurement accuracy, better reproducibility and
Application. This section also breaks through the upper frequency limit of 30 MHz for IEC 60444-4, with an upper limit of.200 MHz. This section is based on
SJ/T 11211-1999 error-corrected measurement technique, so no need to change the test fixture while determining fL and CLeff
Multiple equivalent electrical parameters of a British crystal element.
In this section, when the reactance XC of the quartz crystal and the reactance XCL of the load capacitor are equal in magnitude and opposite signs, the frequency fL is obtained.
[see equation (2)].
XC=-XCL=
ωLCL
(2)
In the formula.
XC --- reactance of quartz crystal in ohms (Ω);
XCL---The reactance of the load capacitance, in ohms (Ω);
ωL --- angular frequency with load capacitance in radians per second (rad/s);
CL --- Load capacitance in Farads (F).
In addition, this part can also measure the effective load capacitance CLeff at the nominal frequency fnom.
2 Normative references
The following documents are indispensable for the application of this document. For dated references, only dated versions apply to this article
Pieces. For undated references, the latest version (including all amendments) applies to this document.
SJ/T 11211-1999 Measurement of Quartz Crystal Element Parameters - Part 5. Use of Automatic Network Analysis Techniques and Error Correction
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