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Std ID |
Description (Standard Title) |
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GB/T 42970-2023
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Semiconductor integrated circuits - Measuring methods of video encoder and decoder circuits
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GB/T 42973-2023
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Semiconductor integrated circuits - Digital-analog(DA) converter
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GB/T 42974-2023
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Semiconductor integrated circuits - Flash memory(FLASH)
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GB/T 42975-2023
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Semiconductor integrated circuits - Test method of driver device
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GB/T 43034.3-2023
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Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
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GB/T 43452-2023
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Requirements for analog/mixed-signal intellectual property(IP) core deliverables
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GB/T 43453-2023
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Guideline for analog/mix-signal intellectual property(IP) core document structure
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GB/T 43454-2023
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Design requirements of integrated circuit intellectual property (IP) core
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GB/T 43455-2023
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Analog/mixed-signal intellectual property (IP) core quality evaluation
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GB/T 38258-2019
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Information technology - Virtual reality application software basic requirement and test method
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GB/T 38259-2019
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Information technology - General specification for virtual reality head mounted display device
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GB/T 36448-2018
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General specification for container data center infrastructure
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GB/T 29811.3-2018
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Information technology -- Learning, education and training -- Learning system architecture and services interfaces -- Part 3: Resource accessing services interfaces
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GB/T 32910.2-2017
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Data center -- Resource utilization -- Part 2: Setting requirement for key performance indicators
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GB/T 17971.1-2010
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Information technology -- Keyboard layouts for text and office systems -- Part 1: General principles governing keyboard layouts
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GB/T 17971.2-2010
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Information technology -- Keyboard layouts for text and office systems -- Part 2: Alphanumeric section
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GB/T 17971.3-2010
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Information technology -- Keyboard layouts for text and office systems -- Part 3: Complementary layouts of the alphanumeric zone of the alphanumeric section
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GB/T 17971.4-2010
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Information technology -- Keyboard layouts for text and office systems -- Part 4: Numeric section
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GB/T 17971.5-2010
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Information technology -- Keyboard layouts for text and office systems -- Part 5: Editing section
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GB/T 17971.6-2010
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Information technology -- Keyboard layouts for text and office systems -- Part 6: Function section
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GB/T 17971.7-2010
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Information technology -- Keyboard layouts for text and office systems -- Part 7: Symbols used to represent functions
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GB/T 17971.8-2010
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Information technology -- Keyboard layouts for text and office systems -- Part 8: Allocation of letters to the keys of a numeric keypad
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GB/T 25654-2010
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Embedded software API for handheld electronic product
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GB/T 5271.17-2010
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Information technology -- Vocabulary -- Part 17: Databases
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GB/T 5271.26-2010
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Information technology -- Vocabulary -- Part 26: Open systems interconnection
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GB/T 11460-2009
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Information technology -- Requirements and test method of the Chinese ideograms font
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GB/T 21364-2008
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Information technology - Learning, education and training - Rule-based XML binding techniques
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GB/T 21365-2008
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Information technology -- Learning, education and training -- Learning object metadata
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GB/T 21366-2008
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Information technology -- Learning, education and training -- Participant identifiers
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GB/T 5271.19-2008
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Information technology -- Vocabulary -- Part 19: Analog computing
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GB/T 5271.3-2008
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Information technology -- Vocabulary -- Part 3: Equipment technology
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GB/T 5271.5-2008
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Information technology -- Vocabulary -- Part 5: Representation of data
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GB/T 5271.29-2006
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Information technology -- Vocabulary -- Part 29: Artificial intelligence -- Speech recognition and synthesis
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GB/T 5271.31-2006
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Information technology -- Vocabulary -- Part 31: Artificial intelligence -- Machine learning
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GB/T 5271.32-2006
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Information technology -- Vocabulary -- Part 32: Electronic mail
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GB/T 5271.34-2006
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Information technology -- Vocabulary -- Part 34: Artificial intelligence -- Neural networks
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GB/T 11460-2000
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Information technology method for the detection of the character font data
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GB/T 17971.2-2000
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Information technology. Keyboard layouts for text and office systems. Part 2: Alphanumeric section
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GB/T 17971.3-2000
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The keyboard layout Information technology - Text and office systems - Part 3: alphanumeric alphanumeric partition supplemental layout
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GB/T 15312-1994
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Terminology of automation for manufacturing
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GB/T 11460-1989
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Test method of the dot matrix font data of Chinese ideograms for information processing equipment
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GB/T 9361-1988
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Safety requirements for computation center field
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GB/T 44513-2024
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Micro-electromechanical systems(MEMS) technology - Environmental test methods of MEMS piezoelectric thin films for sensor application
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GB/T 44514-2024
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Micro-electromechanical system(MEMS) technology - Four-point bending test method for interfacial adhesion energy of layered MEMS materials
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GB/T 44515-2024
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Micro-electromechanical system(MEMS) technology - Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
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GB/T 44517-2024
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Micro-electromechanical systems (MEMS) technology - Wafer curvature and cantilever beam deflection test methods for determining residual stresses of MEMS films
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GB/T 44529-2024
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Micro-electromechanical system(MEMS)technology - Radio frequency MEMS circulators and isolators
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GB/T 44531-2024
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Micro-electromechanical systems (MEMS) technology - Technical specification of automotive grade pressure sensor based on MEMS technology
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GB/T 44919-2024
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Micro-electromechanical systems(MEMS) technology - Bulge test method for measuring mechanical properties of thin films
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GB/T 44839-2024
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Micro-electromechanical systems(MEMS) technology - Micro-pillar compression test for MEMS materials
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GB/T 44842-2024
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Micro-electromechanical systems(MEMS) technology - Bend testing methods of thin film materials
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GB/T 44849-2024
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Micro-electromechanical systems (MEMS) technology - Forming limit measuring method of metallic film materials
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GB/T 42158-2023
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Micro-electromechanical systems technology(MEMS) - Description and measurement methods for micro trench and pyramidal needle structures
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GB/T 26111-2023
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Micro-electromechanical system technology - Terms
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GB/T 42191-2023
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Test methods of the performances for MEMS piezoresistive pressure-sensitive device
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GB/T 42597-2023
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Micro-electromechanical systems technology - Gyroscopes
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GB/T 42895-2023
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Micro-electromechanical systems(MEMS) technology - Bending strength test method for microstructures of silicon based MEMS
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GB/T 42896-2023
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Micro-electromechanical systems(MEMS) technology - Impact test method for nanostructures of silicon based MEMS
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GB/T 42897-2023
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Micro-electromechanical systems(MEMS) technology - Tensile strength test method for nano-scale membranes of silicon based MEMS
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GB/T 44766-2024
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Microwave circuits - Measuring methods for limiter
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GB/T 35001-2018
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Microwave circuits -- Measuring methods for noise source
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GB/T 35002-2018
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Microwave circuits -- Measuring methods for frequency source
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GB/T 35011-2018
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Microwave circuits -- Measuring methods for voltage-controlled oscillator
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GB/T 15295-1994
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Series and products of high frequency wideband amplifiers for hybrid integrated circuits used in cabled distribution systems
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GB/T 44797-2025
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Microwave hybrid integrated circuits - Synthesized frequency sources
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GB/T 23025-2024
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Integration of informatization and industrialization management systems - Classification and application guidelines for production equipment operation control information models
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GB/T 43035-2023
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Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination
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GB/T 43041-2023
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Hybrid integrated circuits - DC/DC converter
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GB/T 11498-2018
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Semiconductor devices -- Integrated circuits -- Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
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GB/T 13062-2018
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Semiconductor devices -- Integrated circuits -- Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
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GB/T 16465-1996
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Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
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GB/T 16466-1996
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Blank detailspecification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures
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GB/T 11498-1989
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Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure
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GB/T 2704-1981
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Thin film and thick film integrated circuits--Type designation
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GB/T 44635-2024
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Electrostatic discharge sensitivity testing - Transmission line pulse(TLP) - Component level
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GB/T 42968.4-2024
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Integrated circuits - Measurement of electromagnetic immunity - Part 4: Direct RF power injection method
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GB/T 44924-2024
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Semiconductor integrated circuits - Measuring methods for RF transmitter/receiver
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GB/T 44937.4-2024
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Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1Ω/150Ω direct coupling method
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GB/T 20870.4-2024
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Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
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GB/T 42968.2-2024
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Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
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GB/T 43034.2-2024
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Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method
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GB/T 44777-2024
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Guideline for intellectual property(IP) core protection
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GB/T 44795-2024
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General requirements for integral substrate of System in Package(SiP)
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GB/T 44798-2024
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Design assurance guidelines for complex integrated circuits
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GB/T 44801-2024
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Terminology of system in package(SiP)
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GB/T 44806.1-2024
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Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions
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GB/T 44807.1-2024
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EMC IC modelling - Part 1: General modelling framework
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GB/T 20870.10-2023
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Semiconductor devices - Part 16-10: Technology Approval Schedule for monolithic microwave integrated circuits
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GB/T 20870.2-2023
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Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
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GB/T 20870.5-2023
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Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
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GB/T 42744-2023
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Microwave circuit - Measuring methods for electrically controlled attenuator
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GB/T 42835-2023
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Semiconductor integrated circuits - System on chip(SoC)
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GB/T 42836-2023
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Microwave semiconductor integrated circuits - Frequency mixer
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GB/T 42837-2023
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Microwave semiconductor integrated circuits - Amplifier
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GB/T 42838-2023
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Semiconductor integrated circuits - Measuring method of Holzer circuit
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GB/T 42839-2023
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Semiconductor integrated circuits - Analog digital (AD) converter
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GB/T 42848-2023
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Semiconductor integrated circuits - Test method of direct digital frequency synthesizer
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GB/T 42968.1-2023
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Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
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GB/T 42968.8-2023
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Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
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GB/T 42969-2023
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Displacement damage test method for components
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