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GB/T 42968.2-2024 English PDF

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US$484.00 · In stock
Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email.
GB/T 42968.2-2024: Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 42968.2-2024	484	Add to Cart	4 days	Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method	Valid

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GB/T 43770 SAMR 76 SJ/T 11460.6.4 GB/T 42968.4 GB/T 42968.8 GB/T 42969

Basic data

Standard ID: GB/T 42968.2-2024 (GB/T42968.2-2024)
Description (Translated English): Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L56
Classification of International Standard: 31.200
Word Count Estimation: 24,290
Date of Issue: 2024-10-26
Date of Implementation: 2024-10-26
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 42968.2-2024: Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT42968.2-2024
ICS 31.200 CCSL56 National Standard of the People's Republic of China Integrated circuit electromagnetic immunity measurement Part 2.Radiated immunity measurements TEM cell and broadband TEM cell method TEMcel method (IEC 62132-2.2010, IDT) Released on October 26, 2024 Implementation on October 26, 2024 State Administration for Market Regulation The National Standardization Administration issued

Preface III Introduction IV 1 Scope 1 2 Normative references 1 3 Terms and Definitions 1 4 Overview 2 5 Test conditions 3 6 Test Equipment 3 6.1 General 3 6.2 Cable 3 6.3 RF disturbance sources 3 6.4 TEM chamber 3 6.5 GTEM Cell 4 6.6 50Ω terminal 4 6.7 DUT Monitoring Equipment 4 7 Test Arrangement 4 7.1 General Principles 4 7.2 Test Arrangement 4 7.3 EMC test board 6 8 Test Procedure 6 8.1 General 6 8.2 Immunity Measurement 6 9 Test Report 8 Appendix A (Normative) Field Strength Characteristics Measurement Procedure 9 Appendix B (Informative) Description of TEM Cell and GTEM Cell 16 Reference 17 Preface This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents" Drafting. This document is Part 2 of GB/T 42968 "Measurement of electromagnetic immunity of integrated circuits". GB/T 42968 has been published as follows part. --- Part 1.General conditions and definitions; --- Part 2.Radiated immunity measurement - TEM cell and broadband TEM cell method; --- Part 4.Radio frequency power direct injection method; --- Part 8.Radiated immunity measurement IC stripline method. This document is equivalent to IEC 62132-2.2010 "Integrated circuit electromagnetic immunity measurement Part 2.Radiated immunity measurement" TEM cell and broadband TEM cell method". Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents. This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This document is under the jurisdiction of the National Technical Committee for Standardization of Integrated Circuits (SAC/TC599). This document was drafted by. China Electronics Standardization Institute, China Automotive Engineering Research Institute Co., Ltd., Anhui Zhongren Beijia Technology Co., Ltd., Xiamen Hainoda Scientific Instrument Co., Ltd., Shenzhen Beice Standard Technology Service Co., Ltd., Beijing Zhixin Microelectronics Technology Co., Ltd. Technology Co., Ltd., Tianjin Advanced Technology Research Institute, the Fifth Electronic Research Institute of the Ministry of Industry and Information Technology, China Household Electrical Appliances Research Institute, Chongqing University of Posts and Telecommunications Beijing Xinghe Yihai Technology Co., Ltd., Zhejiang Nuoyi Technology Co., Ltd., China Academy of Information and Communications Technology, Chongqing Shiyi Product Quality Inspection Limited Liability Company, Beijing University of Posts and Telecommunications, Dongguan Vocational and Technical College. The main drafters of this document are. Fu Jun, Cui Qiang, Huang Xuemei, Qiao Yanbin, Wu Jianfei, Fang Wenxiao, Zhu Sai, Qi Xin, Li Yang, Liang Jiming, Xie Yuzhang, Zhang Hongsheng, Xiong Weijie, Zhang Yanyan, Zhou Xin, Zheng Yimin, Wang Xue, Xiong Pu, Zhang Jinling, Mai Qiang, Kang Zhineng, and Chen Meishuang.

introduction

To standardize the electromagnetic immunity measurement of integrated circuits and provide different electromagnetic immunity measurement methods for integrated circuit manufacturers and testing institutions GB/T 42968 specifies the general conditions, definitions, test procedures and test methods for electromagnetic immunity of integrated circuits. The test requirements are planned to consist of 7 parts. --- Part 1.General conditions and definitions. The purpose is to specify the general conditions and definitions for the measurement of electromagnetic immunity of integrated circuits. --- Part 2.Radiated immunity measurement TEM cell and broadband TEM cell method. The purpose is to specify the TEM cell and broadband Test procedures and test requirements with TEM chamber method. --- Part 3.Bulk current injection (BCI) method. The purpose is to specify the test procedures and test requirements of the bulk current injection method. --- Part 4.Radio frequency power direct injection method. The purpose is to specify the test procedures and test requirements for the radio frequency power direct injection method. --- Part 5.Bench Faraday cage method. The purpose is to specify the test procedures and test requirements of the bench Faraday cage method. --- Part 8.Radiated immunity measurement IC stripline method. The purpose is to specify the test procedures and test requirements of the stripline method. --- Part 9.Radiated immunity measurement - Surface scanning method. The purpose is to specify the test procedures and test requirements of the surface scanning method. Integrated circuit electromagnetic immunity measurement Part 2.Measurement of radiated immunity TEM cell and broadband TEM cell method 1 Scope This document describes a method for measuring the immunity of integrated circuits (ICs) to radio frequency (RF) radiated electromagnetic disturbances. This document applies to frequencies between 150kHz and 1GHz or frequencies determined by the characteristics of TEM cells and broadband TEM cells. scope. 2 Normative references The contents of the following documents constitute the essential clauses of this document through normative references in this document. For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to This document. (IEV)-Part 131.Circuit theory) Note. GB/T 2900.74-2008 Electrical terminology - Circuit theory (IEC 60050-131.2002, MOD) Note. GB/T 4365-2003 Electrical terminology - Electromagnetic compatibility (idtIEC 60050-161.1990) IEC 61967-2 Integrated circuit electromagnetic emission measurements (150 kHz to 1 GHz) Part 2.Radiated emission measurements using a TEM chamber IEC 62132-1.2006 Integrated circuits – Electromagnetic immunity test – 150kHz to 1GHz – Part 1.General conditions and definitions Note. GB/T 42968.1-2023 Integrated circuit electromagnetic immunity measurement Part 1.General conditions and definitions (IEC 62132-1.2015, IDT) 3 Terms and Definitions For the purposes of this document, the terms and definitions defined in IEC 62132-1, IEC 60050-131, IEC 60050-161 and the following apply. 3.1 A waveguide mode in which the electric and magnetic field components in the propagation direction are much smaller than the components in the main direction of the cross section. 3.2 TEM waveguide An open or closed transmission line system in which electromagnetic waves are transmitted in TEM wave (mode) to generate a specific field that meets the test needs. ......

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Question 1: How long will the true-PDF of GB/T 42968.2-2024_English be delivered?

Answer: Upon your order, we will start to translate GB/T 42968.2-2024_English as soon as possible, and keep you informed of the progress. The lead time is typically 2 ~ 4 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of GB/T 42968.2-2024_English with my colleagues?

Answer: Yes. The purchased PDF of GB/T 42968.2-2024_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

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