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GB/T 20870.4-2024 English PDF

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US$544.00 · In stock
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GB/T 20870.4-2024: Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Status: Valid

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
GB/T 20870.4-2024	544	Add to Cart	5 days	Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches	Valid

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Basic data

Standard ID: GB/T 20870.4-2024 (GB/T20870.4-2024)
Description (Translated English): Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Sector / Industry: National Standard (Recommended)
Classification of Chinese Standard: L56
Classification of International Standard: 31.080.01
Word Count Estimation: 27,249
Date of Issue: 2024-10-26
Date of Implementation: 2024-10-26
Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration

GB/T 20870.4-2024: Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches

---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT20870.4-2024
ICS 31.080.01 CCSL56 National Standard of the People's Republic of China semiconductor devices Part 16-4.Microwave integrated circuit switches (IEC 60747-16-4.2017, IDT) Released on October 26, 2024 Implementation on October 26, 2024 State Administration for Market Regulation The National Standardization Administration issued

Preface III Introduction IV 1 Scope 1 2 Normative references 1 3 Terms and Definitions 2 4 Basic Ratings and Characteristics 3 4.1 Circuit Identification and Type 3 4.2 Application Notes 4 4.3 Functional Specifications 4 4.4 Limiting Values (Absolute Maximum Ratings System) 6 4.5 Working conditions (within the specified working temperature range) 7 4.6 Electrical Characteristics 7 4.7 Mechanical and Environmental Ratings, Characteristics, and Data 8 4.8 Additional Information 8 5 Test Methods 9 5.1 Overview 9 5.2 Insertion Loss (Lins) 9 5.3 Isolation (Liso) 11 5.4 Return Loss (Lret) 12 5.5 Input power corresponding to 1dB compression point (Pi(1dB)) and output power corresponding to 1dB compression point (PO(1dB)) 14 5.6 On-time (ton), Off-time (toff), Rise time (tr(out)), Fall time (tf(out)) 15 5.7 Adjacent Channel Power Ratio (Padj/PO(mod)) 17 5.8 nth-order harmonic distortion ratio (Pnth/P1) 20 Preface This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents" Drafting. This document is Part 4 of GB/T 20870 "Semiconductor devices". GB/T 20870 has published the following parts. --- Part 16-1.Microwave integrated circuit amplifiers; --- Part 16-2.Microwave integrated circuit prescalers; --- Part 16-4.Microwave integrated circuit switches; --- Part 16-5.Microwave integrated circuit oscillators; --- Part 16-10.Acceptable procedures for monolithic microwave integrated circuit technology. This document is equivalent to IEC 60747-16-4.2017 "Semiconductor devices - Part 16-4.Microwave integrated circuit switches". For ease of use, the following minimal editorial changes have been made to this document. ---Corrected the figure numbers in the document and added figure introductions. Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents. This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This document is under the jurisdiction of the National Technical Committee for Standardization of Integrated Circuits (SAC/TC599). This document was drafted by. The 55th Research Institute of China Electronics Technology Group Corporation and Nanjing Guobo Electronics Co., Ltd. The main drafters of this document are. Chen Zhe, Da Ruiqi, Cai Chuantao, Xiang Hu, Shi Xiaoxiang, and Wu Weili.

introduction

Microwave integrated circuits are common basic products in the electronics industry chain and are the most basic units in electronic systems. GB/T 20870 "Semiconductor Device Microwave Integrated Circuits" is the basis for establishing parameters and test methods for microwave integrated circuits. It is intended to consist of 10 parts. --- Part 16-1.Microwave integrated circuit amplifiers. The purpose is to specify the terminology, basic ratings, and Values, characteristics, and test methods. --- Part 16-2.Microwave integrated circuit prescaler. The purpose is to define the terms and letters of microwave integrated circuit prescaler Symbols, basic ratings, characteristics, and test methods. --- Part 16-3.Microwave integrated circuit frequency converters. The purpose is to specify the terminology, basic ratings, and Values, characteristics, and test methods. --- Part 16-4.Microwave integrated circuit switches. The purpose is to specify the terminology, basic ratings, characteristics, properties and test methods. --- Part 16-5.Microwave integrated circuit oscillators. The purpose is to specify the terminology, basic ratings and Values, characteristics, and test methods. --- Part 16-6.Microwave integrated circuit frequency multipliers. The purpose is to specify the terminology, basic ratings and Values, characteristics, and test methods. --- Part 16-7.Microwave integrated circuit attenuators. The purpose is to specify the terminology, basic ratings, and Values, characteristics, and test methods. --- Part 16-8.Microwave integrated circuit limiters. The purpose is to specify the terminology, basic ratings, and Values, characteristics, and test methods. --- Part 16-9.Microwave integrated circuit phase shifters. The purpose is to specify the terminology, basic ratings and Values, characteristics, and test methods. --- Part 16-10.Monolithic microwave integrated circuit technology acceptance procedures. The purpose is to specify the design, Terms, definitions, symbols, quality systems, testing, evaluation, verification methods and other requirements for manufacturing and delivery. This series of standards is equivalent to the IEC 60747-16 series of standards, ensuring that the semiconductor device test methods are consistent with international standards. The establishment of this standard can determine unified test parameters, test methods and test procedures, which will have a great impact on the development, production, inspection and use of microwave integrated circuits. It is of great significance. semiconductor devices Part 16-4.Microwave integrated circuit switches 1 Scope This document defines terms and definitions, specifies ratings and characteristics, and describes test methods for microwave integrated circuit switches. The RF ports of the switch have various combinations, such as single-pole single-throw (SPST), single-pole double-throw (SPDT), single-pole three-throw (SP3T), double-pole double-throw (DPDT), and single-pole single-throw (SPST). (DPDT), etc. This document is based on SPDT type switches, and other types of switches are also applicable. 2 Normative references The contents of the following documents constitute the essential clauses of this document through normative references in this document. For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to This document. Cretedevices-Part 1.General) IEC 60747-1.2006/AMD1.2010 Note. GB/T 20516-2006 Semiconductor devices Discrete devices Part 4.Microwave devices (IEC 60747-4.2001, IDT) IEC 60747-16-1.2001/AMD1.2007 IEC 60747-16-1.2001/AMD2.2017 Note. GB/T 20870.1-2007 Semiconductor devices Part 16-1.Microwave integrated circuit amplifiers (IEC 60747-16-1.2001, IDT) Note. GB/T 17574-1998 Semiconductor device integrated circuits Part 2.Digital integrated circuits (idtIEC 748-2.1985) Note. GB/T 17940-2000 Semiconductor device integrated circuits Part 3.Analog integrated circuits (idtIEC 748-3.1986) Note. GB/T 18500-2001 Semiconductor device integrated circuits Part 4.Interface integrated circuits (IEC 60748-4.1993, IDT) IEC 61340-5-1.2016 Electrostatics Part 5-1.General requirements for protection of electronic equipment against electrostatic phenomena ments) Note. GB/T 37977.51-2023 Electrostatics Part 5-1.General requirements for electrostatic protection of electronic devices (IEC 61340-5-1.2016, IDT) IEC TR61340-5-2.2018 Electrostatics Part 5-2.Protection of electronic equipment against electrostatic phenomena User's guide ......

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Question 1: How long will the true-PDF of GB/T 20870.4-2024_English be delivered?

Answer: Upon your order, we will start to translate GB/T 20870.4-2024_English as soon as possible, and keep you informed of the progress. The lead time is typically 3 ~ 5 working days. The lengthier the document the longer the lead time.

Question 2: Can I share the purchased PDF of GB/T 20870.4-2024_English with my colleagues?

Answer: Yes. The purchased PDF of GB/T 20870.4-2024_English will be deemed to be sold to your employer/organization who actually pays for it, including your colleagues and your employer's intranet.

Question 3: Does the price include tax/VAT?

Answer: Yes. Our tax invoice, downloaded/delivered in 9 seconds, includes all tax/VAT and complies with 100+ countries' tax regulations (tax exempted in 100+ countries) -- See Avoidance of Double Taxation Agreements (DTAs): List of DTAs signed between Singapore and 100+ countries

Question 4: Do you accept my currency other than USD?

Answer: Yes. If you need your currency to be printed on the invoice, please write an email to Sales@ChineseStandard.net. In 2 working-hours, we will create a special link for you to pay in any currencies. Otherwise, follow the normal steps: Add to Cart -- Checkout -- Select your currency to pay.