GB/T 43034.3-2023 English PDFUS$534.00 ยท In stock
Delivery: <= 4 days. True-PDF full-copy in English will be manually translated and delivered via email. GB/T 43034.3-2023: Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method Status: Valid
Basic dataStandard ID: GB/T 43034.3-2023 (GB/T43034.3-2023)Description (Translated English): Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method Sector / Industry: National Standard (Recommended) Classification of Chinese Standard: L56 Classification of International Standard: 31.200 Word Count Estimation: 30,392 Date of Issue: 2023-09-07 Date of Implementation: 2024-01-01 Issuing agency(ies): State Administration for Market Regulation, China National Standardization Administration GB/T 43034.3-2023: Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order. ICS 31.200 CCSL56 National Standards of People's Republic of China Integrated circuit pulse immunity measurements Part 3.Non-synchronous transient injection method (IEC 62215-3.2013,IDT) Published on 2023-09-07 2024-01-01 Implementation State Administration for Market Regulation Released by the National Standardization Administration Committee Table of contentsPreface III Introduction IV 1 Scope 1 2 Normative reference documents 1 3 Terms and Definitions 1 4 Overview 3 5 Coupling network 3 5.1 General 3 5.2 Power injection network 4 5.3 Input pin injection 5 5.4 Output pin injection 5 5.5 Multiple pins injected simultaneously 6 6 IC Configuration and Evaluation 6 6.1 IC configuration and operating modes 6 6.2 IC monitoring 7 6.3 IC performance classification 7 7 Test conditions 7 7.1 General 7 7.2 Electromagnetic environment 7 7.3 Ambient temperature 7 7.4 IC supply voltage 8 8 Test equipment 8 8.1 General requirements for test equipment8 8.2 Cable 8 8.3 Shield 8 8.4 Transient Generator 8 8.5 Power 8 8.6 Monitoring and stimulation equipment8 8.7 Control unit 8 9 Test layout 8 9.1 General 8 9.2 EMC test board 9 10 Test Procedure 10 10.1 Pilot Plan 10 10.2 Test preparation 10 10.3 Coupled pulse characteristics 10 10.4 Pulse Immunity Measurement 11 10.5 Explanation and comparison of test results 11 10.6 Transient Immunity Acceptance Level11 11 Test report 11 Appendix A (informative) Test board requirements 12 Appendix B (Informative) Tips for Selecting Coupling and Decoupling Network Component Values 16 Appendix C (informative) Industrial environment and consumer environment tests 18 Appendix D (Informative) Vehicle Environmental Test 21ForewordThis document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents" Drafting. This document is Part 3 of GB/T 43034 "Measurement of Pulse Immunity of Integrated Circuits". GB/T 43034 has released the following part. ---Part 3.Non-synchronous transient injection method. This document is equivalent to IEC 62215-3.2013 "Measurement of pulse immunity of integrated circuits - Part 3.Non-synchronous transient injection method". Please note that some content in this document may be subject to patents. The publisher of this document assumes no responsibility for identifying patents. This document is proposed by the Ministry of Industry and Information Technology of the People's Republic of China. This document is under the jurisdiction of the National Semiconductor Device Standardization Technical Committee (SAC/TC78). This document was drafted by. China Electronics Technology Standardization Institute, Tianjin Advanced Technology Research Institute, Guangzhou Chengzhen Electronic Technology Co., Ltd. Company, Beijing Zhixin Microelectronics Technology Co., Ltd., the Fifth Research Institute of Electronics of the Ministry of Industry and Information Technology, Zhejiang Nuoyi Technology Co., Ltd., Guangzhou Hong Rui Electronics Co., Ltd., Shenzhen Beidian Standard Technical Service Co., Ltd., China National Accreditation Center for Conformity Assessment, Yangxin Technology (Shenzhen) have Co., Ltd., Beijing Radio Measurement and Testing Institute, Xiamen Hainuoda Scientific Instrument Co., Ltd., Beijing Xinkejian Technology Co., Ltd., Henan Kai Rui Vehicle Inspection and Certification Center Co., Ltd., Nanjing University of Information Science and Technology, Chongqing University of Posts and Telecommunications, Suzhou Taist Electronic Technology Co., Ltd., China Household Appliances Research Institute, Anhui Zhongbibeijia Technology Co., Ltd., Guangzhou Radio and Television Measurement and Testing Co., Ltd., Jiangsu Province Electronic Information Products Quality Supervision and Inspection Institute (Jiangsu Provincial Information Security Evaluation Center), Anhui Provincial Institute of Metrology. The main drafters of this document. Fu Jun, Cui Qiang, Wu Jianfei, Li Nan, Qiao Yanbin, Zhu Sai, Fang Wenxiao, Ye Chang, Zheng Yimin, Zeng Minxiong, Liu Xiaojun, Jin Dong, Liu Jia, Yang Hongbo, Liu Xingxun, Tang Yuangui, Liang Jiming, Chen Yanning, Bai Yun, Chu Rui, Wan Fayu, Zhang Hongsheng, Hu Xiaojun, Qi Xin, Li Yang, Zhu Chongming, Chen Jiasheng, Wang Shaoqi, Chen Meishuang.IntroductionIn order to standardize the pulse immunity measurement of integrated circuits and provide pulse immunity measurement methods for integrated circuit manufacturers and testing institutions. Method, GB/T 43034 specifies the general conditions, definitions and test procedures for different injection measurement methods of integrated circuit pulse immunity measurement. The test requirements are planned to consist of 2 parts. ---Part 2.Synchronous transient injection method. The purpose is to specify the test procedures and test requirements for the synchronous transient injection method. ---Part 3.Non-synchronous transient injection method. The purpose is to specify the test procedures and test requirements for the non-synchronous transient injection method. Integrated circuit pulse immunity measurements Part 3.Non-synchronous transient injection method1 ScopeThis document specifies methods for measuring the immunity of integrated circuits (ICs) to standard conducted electrical transient disturbances. Run with device under test (DUT) Asynchronous disturbance is applied to the IC pins through the coupling network. Regardless of whether the electrical transient disturbance is within the operating voltage range specified by the IC, this All methods can obtain and classify the correlation between conducted electrical transient disturbance and the IC performance degradation caused by it.2 Normative reference documentsThe contents of the following documents constitute essential provisions of this document through normative references in the text. Among them, the dated quotations For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document. GB/T 17626.4-2018 Electromagnetic compatibility test and measurement technology Electrical fast transient burst immunity test (IEC 61000- 4-4.2012,IDT) GB/T 17626.5-2019 Electromagnetic compatibility testing and measurement technology surge (impact) immunity test (IEC 61000-4-5. 2014,IDT) Note. There is no technical difference between the quoted content of GB/T 17626.5-2019 and the quoted content of IEC 61000-4-5.2005. ISO 7637-2.2011 Electrical disturbances due to conduction and coupling in road vehicles Part 2.Conducted electrical transients along power lines Note. GB/T 21437.2-2021 Test method for electrical disturbance caused by conduction and coupling from electrical/electronic components of road vehicles Part 2.Along power lines Electrical transient conducted emissions and immunity (ISO 7637-2.2011, MOD) (IEV)-Chapter131.Circuittheory] Note. GB/T 2900.74-2008 Electrical Terminology Circuit Theory (IEC 60050-131.2002, MOD) Note. GB/T 4365-2003 Electrical Terminology Electromagnetic Compatibility (IEC 60050-161.1990 A1.1997 A2.1998, IDT) IEC 62132-4.2006 Measurement of electromagnetic immunity of integrated circuits (150kHz~1GHz) Part 4.Radio frequency power direct injection3 Terms and definitionsThe terms and definitions defined in IEC 60050-131 and IEC 60050-161 and the following apply to this document. 3.1 auxiliary equipmentauxiliary equipment Non-EUT that is necessary to establish full functionality and determine correct performance (operation) of the device under test when exposed to disturbances. ......Tips & Frequently Asked Questions:Question 1: How long will the true-PDF of GB/T 43034.3-2023_English be delivered?Answer: Upon your order, we will start to translate GB/T 43034.3-2023_English as soon as possible, and keep you informed of the progress. The lead time is typically 2 ~ 4 working days. 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