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GBZ17626.33-2023: Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters
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Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters
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Basic data | Standard ID | GB/Z 17626.33-2023 (GB/Z17626.33-2023) | | Description (Translated English) | Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters | | Sector / Industry | National Standard | | Classification of Chinese Standard | L06 | | Classification of International Standard | 33.100.10, 33.100.20 | | Word Count Estimation | 56,523 | | Date of Issue | 2023-05-23 | | Date of Implementation | 2024-06-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GBZ17626.33-2023: Electromagnetic compatibility - Testing and measurement techniques - Part 33: Measurement methods for high-power transient parameters
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GB /Z 17626:33-2023: Electromagnetic Compatibility Test and Measurement Techniques Part 33: Measurement Methods of High Power Transient Parameters
ICS 33:100:01;33:100:20
CCSL06
National Standardization Guidance Technical Document of the People's Republic of China
Electromagnetic Compatibility Test and Measurement Technology
Part 33: Measurement methods of high power transient parameters
Released on 2023-05-23
2024-06-01 Implementation
State Administration for Market Regulation
Released by the National Standardization Management Committee
table of contents
Preface III
Introduction V
1 Scope 1
2 Normative references 1
3 Terms and Definitions 2
4 Measurement of High Power Transient Response 3
4:1 Overall measurement concept and requirements 3
4:2 Expression of measured responses5
4:3 Measuring instruments 5
4:4 Measurement procedure 16
5 Measurement of low frequency response 16
6 Calibration procedure 16
6:1 Calibration of the entire measuring channel 16
6:2 Individual calibration of measuring channel units 18
6:3 Approximate Calibration Techniques 22
Appendix A (Normative) Description of Measured Response Characteristics 25
Appendix B (Informative) Characteristics of Measuring Sensors 29
Appendix C (Normative) HPEM measurement procedure 40
Appendix D (informative) Two-port representation of measurement link unit 42
Reference 47
Figure 1 Example of a typical measurement chain for measuring high power transient response4
Figure 2 Example of a balanced sensor and cable connected to an unbalanced (coaxial) line8
Figure 3 Examples of several simple baluns9
Figure 4 Typical circuit for measuring in-line attenuators in a link9
Figure 5 Example of typical attenuation (as a function of frequency) of an attenuator rated at 20dB for a 50Ω system 10
Figure 6 Typical circuit diagram of series integrator 10
Figure 7 Transfer function of the integrating circuit11
Figure 8 Example of signal transmission characteristics per unit length of standard and semi-refined coaxial cables as a function of frequency12
Figure 9 Example of sensor cable routing in an area free of electromagnetic fields13
Fig: 10 Handling of sensor cables in areas with electromagnetic fields 14
Figure 11 Topology for adapting cables to partial shielding of the system15
Figure 12 Right and wrong way to route cables15
Figure 13 A double-ended TEM cell for sensor calibration providing uniform field illumination17
Figure 14 Schematic diagram of a single-ended TEM cell and its connected equipment 17
Figure 15 Dimensions of small-scale test equipment used to calibrate sensors Figure 18
Figure 16 Electrical schematic diagram of the measuring chain 19
Figure 17 Schematic diagram of a simple electric field sensor 20
Figure 18 The characteristic curve 21 of the real and imaginary parts of the input impedance of the electric field sensor given in Figure 17
Figure 19 The amplitude-frequency characteristic curves of the short-circuit current flowing into the sensor terminal for different incident angles calculated according to the antenna analysis program 21
Figure 20 The change curve of the amplitude of the equivalent height of the sensor to different incident angles 22
Figure 21 High frequency equivalent circuit of the attenuator 24
Figure A:1 Schematic diagram of different parameters used to define the impulse part of the transient response waveform R(t) 25
Figure A:2 Schematic diagram of oscillatory waves appearing in high-power transient electromagnetic measurements 26
Figure A:3 Calculated spectral magnitude of the waveform in Figure A:228
Figure B:1 Schematic diagram of a simple electric field sensor and its Norton equivalent circuit 29
Figure B:2 Amplitude-frequency phase-frequency characteristics of the normalized frequency function of the field sensor 30
Figure B:3 Schematic diagram of a simple magnetic field sensor and its Thevenin equivalent circuit 31
Figure B:4 Schematic diagram of an electric field sensor placed on the ground to measure the vertical electric field or surface charge density 33
Figure B:5 Schematic diagram of the sensor for measuring the tangential component of the magnetic field or the surface current density semi-ring magnetic induction intensity sensor 33
Figure B:6 Simplified schematic diagram for measuring line current 35
Figure B:7 Detailed construction of the current sensor 35
Figure B:8 Impedance amplitude characteristic curve of nominal 1Ω current sensor 36
Figure B:9 Geometry of embedded differential current sensors 37
Figure B:10 Coaxial cable current sensor design concept 37
Figure B:11 Shape and Dimensions of CIP-10 Coaxial Cable Current Sensor 38
Figure B:12 Schematic diagram of the structure of the differential coaxial cable current sensor 38
Figure D:1 The voltage-current relationship of a general two-port network 42
Figure D:2 Voltage and current definition of chain parameters 43
Figure D:3 Cascading of two two-port networks 43
Figure D:4 Simple measurement link represented by a matrix of link parameters44
Figure D:5 Simple equivalent circuit of the measurement chain 44
Figure D:6 Simple two-port network modeled by chain parameters44
Table A:1 Example of waveform P norm 26
Table A:2 Time-domain waveform norms for high-power transient waveforms 26
Table D:1 Chain parameters for simple circuits 45
foreword
This document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules for Standardization Documents"
drafting:
This document is part 33 of GB/T (Z) 17626 "Electromagnetic Compatibility Test and Measurement Technology": GB/T (Z) 17626 has been issued
the following sections:
---GB/T 17626:1-2006 Electromagnetic Compatibility Test and Measurement Technology Immunity Test General;
---GB/T 17626:2-2018 Electromagnetic Compatibility Test and Measurement Technology Electrostatic Discharge Immunity Test;
---GB/T 17626:3-2016 Electromagnetic Compatibility Test and Measurement Technology Radio Frequency Electromagnetic Field Radiation Immunity Test;
---GB/T 17626:4-2018 Electromagnetic Compatibility Test and Measurement Technology Electrical Fast Transient Burst Immunity Test;
---GB/T 17626:5-2019 Electromagnetic compatibility test and measurement technology surge (shock) immunity test;
---GB/T 17626:6-2017 Electromagnetic Compatibility Test and Measurement Technology Conducted Disturbance Immunity of Radio Frequency Field Induction;
---GB/T 17626:7-2017 Electromagnetic Compatibility Test and Measurement Technology Power Supply System and Connected Equipment Harmonics and Interharmonics Measurement
Guidelines for quantities and measuring instruments;
---GB/T 17626:8-2006 Electromagnetic Compatibility Test and Measurement Technology Power Frequency Magnetic Field Immunity Test;
---GB/T 17626:9-2011 Electromagnetic Compatibility Test and Measurement Technology Pulse Magnetic Field Immunity Test;
---GB/T 17626:10-2017 Electromagnetic Compatibility Test and Measurement Technology Damped Oscillating Magnetic Field Immunity Test;
---GB/T 17626:11-2023 Electromagnetic Compatibility Test and Measurement Technology Part 11: For each phase input current less than or equal
Immunity tests for voltage dips, short interruptions and voltage changes for 16A equipment;
---GB/T 17626:12-2023 Electromagnetic compatibility test and measurement technology Part 12: Ring wave immunity test;
---GB/T 17626:13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, interharmonics and power grid signal
No: low frequency immunity test;
---GB/T 17626:14-2005 Electromagnetic Compatibility Test and Measurement Technology Voltage Fluctuation Immunity Test;
---GB/T 17626:15-2011 Electromagnetic compatibility test and measurement technology scintillator function and design specifications;
---GB/T 17626:16-2007 Electromagnetic Compatibility Test and Measurement Technology 0Hz~150kHz Common Mode Conducted Disturbance Immunity
test;
---GB/T 17626:17-2005 Electromagnetic compatibility test and measurement technology DC power input port ripple immunity test;
---GB/T 17626:18-2016 Electromagnetic Compatibility Test and Measurement Technology Damped Oscillatory Wave Immunity Test;
---GB/T 17626:19-2022 Electromagnetic Compatibility Test and Measurement Technology Part 19: AC Power Port 2kHz~
150kHz differential mode conduction disturbance and communication signal immunity test
---GB/T 17626:20-2014 Electromagnetic Compatibility Test and Measurement Technique Transverse Electromagnetic (TEM) Waveguide Emission and Immunity
degree test;
---GB/T 17626:21-2014 Electromagnetic compatibility test and measurement technology mixing chamber test method;
---GB/T 17626:22-2017 Electromagnetic Compatibility Test and Measurement Technology Radiated Emission and Immunity in Fully Anechoic Chamber
Measurement;
---GB/T 17626:24-2012 Electromagnetic Compatibility Test and Measurement Technology HEMP Conducted Disturbance Protection Device Test
method;
---GB/T 17626:27-2006 Electromagnetic Compatibility Test and Measurement Technology Three-phase Voltage Unbalance Immunity Test;
---GB/T 17626:28-2006 Electromagnetic Compatibility Test and Measurement Technology Power Frequency Frequency Change Immunity Test;
---GB/T 17626:29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage sag, short-term
Immunity test for interruption and voltage change;
---GB/T 17626:30-2012 Electromagnetic compatibility test and measurement technology power quality measurement method;
---GB/T 17626:31-2021 Electromagnetic Compatibility Test and Measurement Technology Part 31: AC Power Port Broadband Conduction
Disturbance immunity test;
---GB/T 17626:34-2012 Electromagnetic compatibility test and measurement technology for equipment with main power supply current greater than 16A per phase
Voltage dips, short interruptions and voltage variations immunity tests:
This document is equivalent to IEC 61000-4-33:2005 "Electromagnetic Compatibility (EMC) Part 4-33: Test and measurement techniques for high power
Transient Parameter Measurement Methods”: The document type is adjusted from the IEC standard to the national standardization guiding technical document of our country:
The following minimal editorial changes have been made to this document:
--- In order to maintain unity with the name of the standard system, the name of the standard is changed to "Electromagnetic Compatibility Testing and Measurement Technology Part 33: High
Power Transient Parameter Measurement Method”:
Please note that some contents of this document may refer to patents: The issuing agency of this document assumes no responsibility for identifying patents:
This document is proposed and managed by the National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC246):
This document is drafted by: China Electric Power Research Institute Co:, Ltd:, State Grid Jiangsu Electric Power Co:, Ltd:, State Grid Co:, Ltd:
High Voltage Construction Branch, Shenzhen Power Supply Bureau Co:, Ltd:, North China Electric Power University:
The main drafters of this document: Zhang Jiangong, Gan Zheyuan, Xie Huichun, Zhao Jun, Li Ni, Zhao Zhibin, Liu Hao, Zheng Shuhai, Yu Peng, Zhou Bing, He Wei,
Wu Yongkang, Yang Bo, Miao Jin:
Introduction
Electromagnetic compatibility is the ability of electrical and electronic equipment or systems to function properly in their electromagnetic environment without causing adverse effects to anything in that environment:
Ability to withstand electromagnetic disturbances: Electromagnetic compatibility is one of the important factors affecting the environment and product quality, and its standardization work has
aroused widespread attention at home and abroad: In this regard, the IEC 61000 series of publications developed by the International Electrotechnical Commission (IEC )
Common standards in the fields of industry, electrical engineering and energy, transportation, social undertakings and health, quality and safety of consumer goods, etc:, divided into
There are 6 categories: generalization, environment, limit values, testing and measurement techniques, installation and mitigation guidelines, and general standards: my country has launched a series of publications
The domestic transformation work has been carried out, and the corresponding national standard system has been established:
In this standard system, GB/T (Z) 17626 "Electromagnetic Compatibility Test and Measurement Technology" is about the field of electromagnetic compatibility test and measurement
The basic standard in terms of technology, which aims to describe the immunity test of electromagnetic compatibility phenomena such as conduction disturbance and radiation disturbance, etc:, is proposed to be composed of 39
Partial composition:
--- Part 1: General remarks on immunity test: The purpose is to provide usability guidelines for testing and measurement techniques in EMC standards
guide and provide general advice on the selection of relevant tests:
--- Part 2: Electrostatic discharge immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic devices
performance of equipment subjected to electrostatic discharge:
--- Part 3: RF electromagnetic field radiation immunity test: The purpose is to establish when electrical and electronic equipment is radiated by radio frequency electromagnetic fields
Basis for immunity evaluation:
--- Part 4: Electrical fast transient burst immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical
Immunity of power supply ports, signal, control and ground ports of electronic equipment and electronic equipment when disturbed by electrical fast transient bursts
performance:
--- Part 5: Surge (shock) immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic
The immunity performance of the equipment when it is subjected to surge (shock):
--- Part 6: Immunity to conducted disturbances induced by radio frequency fields: The purpose is to establish a common and reproducible benchmark for evaluating electrical
and the immunity performance of electronic equipment when receiving conducted disturbances induced by radio frequency fields:
--- Part 7: Guidelines for measuring and measuring instruments for harmonics and interharmonics of power supply systems and connected equipment: The purpose is to specify the root
Test the equipment item by item according to the emission limits given by some standards, and measure the harmonic current and voltage in the actual power supply system
instrument:
--- Part 8: Power frequency magnetic field immunity test: The purpose is to establish a common and reproducible benchmark for evaluating household, commercial and
Immunity performance of industrial electrical and electronic equipment exposed to power frequency (continuous and short-duration) magnetic fields:
--- Part 9: Pulse magnetic field immunity test: The purpose is to establish common and reproducible benchmarks for evaluating residential, commercial and
Immunity of electrical and electronic equipment for industrial use in pulsed magnetic fields:
--- Part 10: Damped oscillating magnetic field immunity test: The purpose is to establish a general and reproducible benchmark for evaluating medium and high pressure
Immunity performance of electrical and electronic equipment in substations in damped oscillating magnetic fields:
--- Part 11: Immunity to voltage dips, short interruptions and voltage changes for devices with an input current of less than or equal to 16A per phase
test: The purpose is to establish a general and reproducible benchmark for evaluating the performance of electrical and electronic equipment subjected to voltage dips, short-term
Immunity performance against interruptions and voltage variations:
--- Part 12: Ring wave immunity test: The purpose is to establish a general and reproducible benchmark for evaluating
The immunity performance of residential, commercial and industrial electrical and electronic equipment is also applicable to equipment in power stations and substations:
--- Part 13: Low frequency immunity test of AC port harmonics, interharmonics and grid signals: The purpose is to establish a general and
Reproducible benchmark to evaluate the low frequency immunity performance of electrical and electronic equipment to harmonics, interharmonics and grid signal frequencies:
--- Part 14: Voltage fluctuation immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic
Immunity of equipment when subjected to positive and negative voltage fluctuations of low magnitude:
--- Part 15: Scintillator function and design specifications: The goal is to show the correct flicker for all actual voltage fluctuation waveforms
perceived level:
--- Part 16: 0Hz~150kHz common mode conducted disturbance immunity test: The purpose is to establish electrical and electronic equipment to withstand common
Generic and repeatable guidelines for mode-conducted disturbance testing:
--- Part 17: DC power input port ripple immunity test: The purpose is to establish a general and reproducible benchmark for
Superimposed on direct current when charging electrical and electronic equipment under laboratory conditions from e:g:
Immunity test for ripple voltage on source:
--- Part 18: Damped oscillatory wave immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electrical
Immunity performance of sub-equipment when subjected to damped oscillatory waves:
--- Part 19: AC power port 2kHz~150kHz differential mode conducted disturbance and communication signal immunity test: purpose is
Confirm that electrical and electronic equipment can withstand the power from power electronics and power line communication systems (PLC) when operating on the utility grid:
and other differential mode conducted disturbances:
--- Part 20: Emission and immunity tests in transverse electromagnetic (TEM) waveguides: The purpose is to give the performance of TEM waveguide,
Confirmation method of TEM waveguide for electromagnetic compatibility test, test for radiated emission and immunity test in TEM waveguide
Test layout, steps and requirements:
--- Part 21: Mixing chamber test methods: The purpose is to establish the use of mixing chambers to evaluate electrical and electronic equipment in radio frequency electromagnetic fields
General specification for the performance and determination of radiated emission levels for electrical and electronic equipment:
--- Part 22: Radiated emission and immunity measurements in a fully anechoic chamber: The purpose is to stipulate that in the same fully anechoic chamber
General confirmation procedures for radiated emission and radiated immunity, test layout requirements for equipment under test and full anechoic chamber measurement methods:
--- Part 23: Test methods for HEMP and other radiation disturbance protection devices: The purpose is to describe the HEMP test by
Basic principles, as well as the theoretical basis (test concept), test configuration, required equipment, test procedures, data processing
and other important concepts:
--- Part 24: Test methods for HEMP conducted disturbance protection devices: The purpose is to specify the HEMP conducted disturbance protection device
Test methods, including the test of voltage breakdown and voltage limiting characteristics, and the residual voltage when the voltage and current change rapidly
Measurement methods:
--- Part 25: Equipment and systems HEMP immunity test methods: The purpose is to establish a general and reproducible benchmark for
When evaluating exposure to HEMP radiation environments and their conducted transient disturbances on power supplies, antennas, I/O signal lines, and control lines
performance of electrical and electronic equipment:
--- Part 27: Three-phase voltage unbalance immunity test: The purpose is to provide electrical and electronic equipment for unbalanced power supply
Establish a reference for the immunity evaluation under pressure:
--- Part 28: Power frequency frequency variation immunity test: The purpose is to protect electrical and electronic equipment when they are subjected to changes in power frequency
Provide basis for immunity evaluation:
--- Part 29: Immunity test for voltage dips, short interruptions and voltage changes at the DC power input port: The purpose is to establish a
General guidelines for the immunity of DC electrical and electronic equipment to voltage dips, short interruptions and voltage variations:
--- Part 30: Power quality measurement methods: The purpose is to specify the measurement method of power quality parameters in 50Hz AC power supply system
and interpretation of measurement results:
--- Part 31: AC power port broadband conducted disturbance immunity test: The purpose is to establish a common benchmark for evaluating electrical
Immunity of electrical and electronic equipment AC power ports subjected to conducted disturbances from intentional and/or unintentional broadband signal sources:
--- Part 32: Overview of the high-altitude nuclear electromagnetic pulse (HEMP) simulator: The purpose is to provide international existing system-level HEMP
Simulators and their associated information required as immunity testing and verification equipment:
--- Part 33: High power transient parameter measurement methods: The purpose is to give the measurement method and method of high power electromagnetic transient response waveform
Information about the characteristic parameters:
--- Part 34: Voltage dips, short interruptions and voltage variations immunity tests for equipment with main power supply current greater than 16A per phase:
The purpose is to establish a general method for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage changes:
guidelines:
--- Part 35: Overview of high power electromagnetic (HPEM) simulators: The purpose is to provide the existing international system-level HPEM narrow
Band (narrow-spectrum) and broadband (broad-spectrum, sub-ultra-broadband and ultra-broadband) simulators and their use as immunity test and verification equipment
relevant information required:
--- Part 36: Intentional electromagnetic disturbance immunity test for equipment and systems: The purpose is to evaluate equipment and systems against intentional electromagnetic
The immunity of the source of interference provides a means of determining the test level:
--- Part 37: Harmonic emission test system calibration and verification protocol: The purpose is to provide manufacturers, end users, independent laboratories,
Other organizations provide systematic guidance to specify the applicable compliance status within a range of harmonic current emissions:
--- Part 38: Testing, verification and calibration protocols for voltage fluctuation and flicker compliance test systems: type test
The system of equipment provides guidelines and methods for periodic calibration and verification:
--- Part 39: Near-field radiation immunity test: The purpose is to establish a common benchmark for assessing exposure to radiation from close-in sources
Immunity requirements for electrical and electronic equipment in radio frequency electromagnetic fields:
--- Part 40: Digital measurement methods for modulated or distorted signal power: The purpose is to introduce two methods suitable for volatile or non-periodic negative
A digital algorithm for power quantity measurement is downloaded and the working principle of the proposed algorithm is explained:
Electromagnetic Compatibility Test and Measurement Technology
Part 33: Measurement methods of high power transient parameters
1 Scope
This document describes the basic method and main equipment for measuring high power electromagnetic transient response parameters: The main response parameters include the following
content:
--- Electric field (E) and magnetic field (H) (for example: the incident field of the system to be tested or the superposition field of the incident field and the scattered field);
--- Current I (for example: transient field induction or within the system under test);
--- Voltage U (for example: induced by transient field or in the system under test);
--- Induced charge Q on cables or other conductors:
Note: The charge Q on the conductor is a basic quantity with definite significance at any frequency: However, the voltage U is a constant only at low frequencies
A defined (subordinate) quantity: At high frequencies, the voltage cannot be determined from the line integral of the electric field, since this integral is path-dependent: so, yes
Due to the pulse with a fast rising edge (with a large number of high-frequency components), it is not appropriate to use voltage as the measurement quantity: In this case, it is necessary to measure the voltage
Load capacity:
These measurands are usually complex time-varying waveforms that can be approximately described by scalar parameters or "measurable parameters":
include:
--- the peak value of the response;
---Waveform rise time;
--- The falling time (or duration) of the waveform;
---Pulse Width;
--- The norm obtained from the waveform in the mathematical sense:
This document provides information on the measurement methods and characteristic parameters of these waveforms, but does not provide information on the specific level requirements for measurement:
information:
2 Normative references
The contents of the following documents constitute the essential provisions of this document through normative references in the text: Among them, dated references
For documents, only the version corresponding to the date is applicable to this document; for undated reference documents, the latest version (including all amendments) is applicable to
this document:
Note: GB/T 4365-2003 Electrotechnical Terminology Electromagnetic Compatibility (IEC 60050-161:1990, IDT)
IEC 61000-2-9 Electromagnetic Compatibility Part 2: Environment Part 9: HEMP Environment Description Radiated Disturbance [Electro-
magnetic compatibility (EMC)-Part 2:Environment-Section 9: Description of HEMP
environment-Radiated disturbance]
Note: GB/T 18039:10-2018 Electromagnetic Compatibility Environment HEMP Environment Description Radiation Disturbance (IEC 61000-2-9:1996, IDT)
IEC 61000-2-10 Electromagnetic compatibility Part 2-10: Description of the environment HEMP environment Conducted disturbances
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