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GB/T 17626.30-2023 English PDF

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GB/T 17626.30-2023: Electromagnetic compatibility - Testing and measurement techniques - Part 30: Power quality measurement methods
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GB/T 17626.30: Evolution and historical versions

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GB/T 17626.30-2023English1329 Add to Cart 8 days [Need to translate] Electromagnetic compatibility - Testing and measurement techniques - Part 30: Power quality measurement methods Valid GB/T 17626.30-2023
GB/T 17626.30-2012EnglishRFQ ASK 3 days [Need to translate] Electromagnetic compatibility -- Testing and measurement techniques -- Power quality measurement methods Obsolete GB/T 17626.30-2012

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Basic data

Standard ID GB/T 17626.30-2023 (GB/T17626.30-2023)
Description (Translated English) Electromagnetic compatibility - Testing and measurement techniques - Part 30: Power quality measurement methods
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard L06
Classification of International Standard 33.100.99
Word Count Estimation 66,617
Date of Issue 2023-12-28
Date of Implementation 2024-07-01
Older Standard (superseded by this standard) GB/T 17626.30-2012
Issuing agency(ies) State Administration for Market Regulation, China National Standardization Administration

GB/T 17626.30-2023: Electromagnetic compatibility - Testing and measurement techniques - Part 30: Power quality measurement methods


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 33:100:99 CCSL06 National Standards of People's Republic of China Replace GB/T 17626:30-2012 Electromagnetic compatibility test and measurement technology Part 30: Power quality measurement methods methods, MOD] Published on 2023-12-28 and implemented on 2024-07-01 State Administration for Market Regulation Released by the National Standardization Administration Committee

Table of contents

Preface Ⅶ IntroductionX 1 Scope 1 2 Normative references 1 3 Terms and Definitions 2 4 General provisions and requirements 6 4:1 Measurement classification 6 4:2 Organization of measurement 7 4:3 Electrical quantity to be measured 7 4:4 Measurement aggregation within a certain period of time 7 4:5 Measurement aggregation algorithm 8 4:5:1 Requirement 8 4:5:2 150-cycle aggregation 8 4:5:3 10min polymerization 9 4:5:4 2h aggregation 10 4:6 Clock uncertainty10 4:7 The concept of marking 10 5 Power quality parameters11 5:1 Grid frequency11 5:1:1 Measurement method 11 5:1:2 Measurement uncertainty and measurement range 11 5:1:3 Measurement evaluation11 5:1:4 Aggregation 11 5:2 Amplitude of supply voltage12 5:2:1 Measurement methods 12 5:2:2 Measurement uncertainty and measurement range12 5:2:3 Measurement evaluation12 5:2:4 Aggregation12 5:3 Flash 12 5:3:1 Measurement methods 12 5:3:2 Measurement uncertainty and measurement range12 5:3:3 Measurement evaluation 13 5:3:4 Aggregation 13 5:4 Supply voltage dips and swells13 5:4:1 Measurement methods 13 5:4:2 Detection and evaluation of voltage sag13 5:4:3 Detection and evaluation of voltage swells 14 5:4:4 Calculation of sliding mode reference voltage 15 5:4:5 Measurement uncertainty and measurement range15 5:5 Voltage interruption15 5:5:1 Measurement methods 15 5:5:2 Evaluation of voltage interruptions15 5:5:3 Measurement uncertainty and measurement range16 5:5:4 Aggregation 16 5:6 Transient voltage16 5:7 Unbalanced supply voltage16 5:7:1 Measurement methods 16 5:7:2 Measurement uncertainty and measurement range17 5:7:3 Measurement evaluation17 5:7:4 Aggregation 17 5:8 Voltage harmonics17 5:8:1 Measurement methods 17 5:8:2 Measurement uncertainty and measurement range18 5:8:3 Measurement evaluation18 5:8:4 Aggregation 18 5:9 Inter-voltage harmonics18 5:9:1 Measurement methods 18 5:9:2 Measurement uncertainty and measurement range19 5:9:3 Evaluation 19 5:9:4 Aggregation 19 5:10 Carrier signal voltage on supply voltage 19 5:10:1 General 19 5:10:2 Measurement methods 19 5:10:3 Measurement uncertainty and measurement range20 5:10:4 Aggregation 20 5:11 Rapid Voltage Change (RVC) 20 5:11:1 General 20 5:11:2 RVC event detection 20 5:11:3 Assessment of RVC events 21 5:11:4 Measurement uncertainty22 5:12 Negative and positive deviations 22 5:13 Current 23 5:13:1 General 23 5:13:2 Current amplitude 23 5:13:3 Current recording 24 5:13:4 Harmonic currents 24 5:13:5 Interharmonic currents 24 5:13:6 Current imbalance 25 6 Performance Verification 25 Appendix A (Informative) Power Quality Measurement---Questions and Guidelines 27 A:1 General 27 A:2 Installation Precautions 27 A:2:1 General 27 A:2:2 Test lead 27 A:2:3 Protection of live parts 28 A:2:4 Placement of monitoring instruments28 A:2:5 Grounding 28 A:2:6 Interference28 A:3 Sensor 28 A:3:1 General 28 A:3:2 Signal level29 A:3:3 Sensor frequency response30 A:3:4 Transient measurement sensors30 A:4 Transient voltages and currents 31 A:4:1 General 31 A:4:2 Terms and definitions 31 A:4:3 Frequency and amplitude characteristics of AC power grid transient signals 31 A:4:4 Transient voltage detection 32 A:4:5 Transient voltage evaluation 32 A:4:6 Impact of surge protectors on transient measurements 32 A:5 Voltage sag characteristics33 A:5:1 General 33 A:5:2 Quickly update the root mean square value 33 A:5:3 Phase angle/waveform starting angle 33 A:5:4 Voltage sag imbalance33 A:5:5 Phase shift in voltage sag33 A:5:6 Voltage loss34 A:5:7 Distortion of voltage sag process 34 A:5:8 Other features and references 34 Appendix B (Informative) Power Quality Measurement---Application Guide 35 B:1 Contractual applications of power quality measurement35 B:1:1 General 35 B:1:2 Basic considerations35 B:1:3 Special considerations36 B:2 Application of statistical surveys38 B:2:1 General 38 B:2:2 Considerations38 B:2:3 Power quality indicators38 B:2:4 Monitoring objectives39 B:2:5 Economic factors in power quality surveys39 B:3 Site and type of investigation40 B:3:1 Monitoring location 40 B:3:2 Pre-monitoring site survey40 B:3:3 Client location survey 40 B:3:4 Grid side investigation40 B:4 Connection and to be measured 41 B:4:1 Device connection options 41 B:4:2 Prioritization of measurements to be made 41 B:4:3 Current monitoring 41 B:5 Select monitoring threshold and monitoring period 42 B:5:1 Monitoring threshold 42 B:5:2 Monitoring cycle 42 B:6 Statistical analysis of measurement data 42 B:6:1 General 42 B:6:2 Indicators 42 B:7 Troubleshooting Application 43 B:7:1 General 43 B:7:2 Power quality characteristics 43 Appendix C (informative) Conducted emissions in the range of 2kHz~150kHz44 C:1 General 44 C:2 Measurement method (2kHz~9kHz) 44 C:3 Measurement method (9kHz~150kHz) 44 C:4 Measuring range and measurement uncertainty45 C:5 Aggregation 45 Appendix D (informative) Negative deviation and positive deviation 46 D:1 General 46 D:2 Measurement methods 46 D:3 Measurement uncertainty and measurement range46 D:4 Aggregation 46 Appendix E (informative) Category B measurement method 48 E:1 Background to Category B 48 E:2 Category B---Measurement aggregation time interval 48 E:3 Category B---Measurement aggregation algorithm 48 E:4 Category B---Real-time clock (RTC) uncertainty 48 E:4:1 General 48 E:4:2 Category B --- Frequency --- Measurement method 48 E:4:3 Category B --- Frequency --- Measurement Uncertainty 48 E:4:4 Category B --- Frequency --- Measurement Evaluation 48 E:4:5 Category B---Supply voltage amplitude---Measurement method 48 E:4:6 Category B---Supply voltage amplitude---Measurement uncertainty and measurement range 48 E:5 Category B---flash 49 E:5:1 General 49 E:5:2 Class B --- Supply voltage dips and swells --- Measurement method 49 E:6 Category B---Voltage Interruption 49 E:6:1 General 49 E:6:2 Category B---Unbalanced supply voltage---Measurement method 49 E:6:3 Category B---Unbalanced supply voltage---Uncertainty 49 E:6:4 Class B---Voltage Harmonics---Measurement Method 49 E:6:5 Category B --- Voltage Harmonics --- Measurement Uncertainty and Measurement Range 49 E:6:6 Class B---Voltage harmonics---Measurement method 49 E:6:7 Category B---Voltage harmonics---Measurement uncertainty and measurement range 49 E:6:8 Category B---Carrier signal voltage---Measurement method 49 E:6:9 Category B --- Carrier signal voltage --- Measurement uncertainty and measurement range 49 E:6:10 Class B---Current---Measurement method 50 E:6:11 Category B---Current---Measurement uncertainty and measurement range 50 Reference 51

Foreword

This document complies with the provisions of GB/T 1:1-2020 "Standardization Work Guidelines Part 1: Structure and Drafting Rules of Standardization Documents" Drafting: This document is Part 30 of GB/T (Z) 17626 "Electromagnetic Compatibility Testing and Measurement Technology": GB/T (Z)17626 has been released The following sections are included: ---GB/T 17626:1-2006 General introduction to electromagnetic compatibility testing and measurement technology immunity testing; ---GB/T 17626:2-2018 Electromagnetic compatibility testing and measurement technology electrostatic discharge immunity test; ---GB/T 17626:3-2023 Electromagnetic compatibility testing and measurement technology Part 3: Radio frequency electromagnetic field radiation immunity test; ---GB/T 17626:4-2018 Electromagnetic compatibility test and measurement technology Electrical fast transient pulse group immunity test; ---GB/T 17626:5-2019 Electromagnetic compatibility testing and measurement technology surge (impact) immunity test; ---GB/T 17626:6-2017 Electromagnetic compatibility test and measurement technology Conducted disturbance immunity induced by radio frequency fields; ---GB/T 17626:7-2017 Electromagnetic compatibility testing and measurement technology Testing of harmonics and interharmonics of power supply systems and connected equipment Guidelines for quantities and measuring instruments; ---GB/T 17626:8-2006 Electromagnetic compatibility testing and measurement technology power frequency magnetic field immunity test; ---GB/T 17626:9-2011 Electromagnetic compatibility testing and measurement technology pulse magnetic field immunity test; ---GB/T 17626:10-2017 Electromagnetic compatibility testing and measurement technology damped oscillating magnetic field immunity test; ---GB/T 17626:11-2023 Electromagnetic compatibility testing and measurement technology Part 11: For each phase input current less than or equal to Immunity test for voltage sag, short interruption and voltage change of 16A equipment; ---GB/T 17626:12-2023 Electromagnetic compatibility testing and measurement technology Part 12: Ringing wave immunity test; ---GB/T 17626:13-2006 Electromagnetic compatibility testing and measurement technology AC power port harmonics, interharmonic waves and power grid signals Low-frequency immunity test of the signal; ---GB/T 17626:14-2005 Electromagnetic compatibility testing and measurement technology voltage fluctuation immunity test; ---GB/T 17626:15-2011 Electromagnetic compatibility test and measurement technology scintillator function and design specifications; ---GB/T 17626:16-2007 Electromagnetic compatibility test and measurement technology 0Hz~150kHz common mode conducted disturbance immunity test; ---GB/T 17626:17-2005 Electromagnetic compatibility testing and measurement technology DC power input port ripple immunity test; ---GB/T 17626:18-2016 Electromagnetic compatibility testing and measurement technology damped oscillating wave immunity test; ---GB/T 17626:19-2022 Electromagnetic compatibility testing and measurement technology Part 19: AC power port 2kHz~ 150kHz differential mode conducted disturbance and communication signal immunity test ---GB/T 17626:20-2014 Electromagnetic compatibility test and measurement technology Emission and immunity in transverse electromagnetic waves (TEM) waveguides degree test; ---GB/T 17626:21-2014 Electromagnetic compatibility testing and measurement technology mixing chamber test method; ---GB/T 17626:22-2017 Electromagnetic compatibility testing and measurement technology Radiated emissions and immunity in fully anechoic chambers Measurement; ---GB/T 17626:24-2012 Electromagnetic compatibility test and measurement technology HEMP conducted disturbance protection device test method; ---GB/T 17626:27-2006 Electromagnetic compatibility testing and measurement technology three-phase voltage imbalance immunity test; ---GB/T 17626:28-2006 Electromagnetic compatibility test and measurement technology power frequency frequency change immunity test; ---GB/T 17626:29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage sag, short-term Immunity tests for interruptions and voltage changes; ---GB/T 17626:31-2021 Electromagnetic compatibility testing and measurement technology Part 31: Broadband conduction emissions at AC power ports Interference immunity test; ---GB /Z 17626:33-2023 Electromagnetic compatibility testing and measurement technology Part 33: High power transient parameter measurement method ---GB/T 17626:34-2012 Electromagnetic compatibility testing and measurement technology for equipment with main power supply current greater than 16A per phase Voltage dips, short interruptions and voltage changes immunity testing: ---GB/T 17626:39-2023 Electromagnetic compatibility testing and measurement technology Part 39: Close range radiated field immunity test This document replaces GB/T 17626:30-2012 "Electromagnetic compatibility test and measurement technology power quality measurement method" and is consistent with Compared with GB/T 17626:30-2012, in addition to structural adjustments and editorial changes, the main technical changes are as follows: a) Adjust the content related to current measurement from informative appendices to standard text (see 5:13, A:6 of the:2012 edition); b) Added rapid voltage change (RVC) measurement methods and performance verification related content (see 5:11); c) Adjust the content related to negative deviation and positive deviation to Appendix D (see Appendix D, 5:12 of the:2012 version); d) Adjust the relevant content of Class B measurement methods to Appendix E (see Appendix E, Chapter 5 of the:2012 edition); e) Deleted the content related to the influence range and steady-state verification (see Chapter 5 of the:2012 edition): This document is modified to adopt IEC 61000-4-30:2021 "Electromagnetic Compatibility (EMC) Part 4-30: Testing and Measurement Technology Power Quality Measurement methods": The technical differences between this document and IEC 61000-4-30:2021 and their reasons are as follows: ---The original standard IEC 61000-4-30:2021 takes into account the corresponding measurement time interval requirements under different 50Hz/60Hz power grid conditions: They are 10/12 cycles and 150/180 cycles respectively: This document only retains the requirements corresponding to 50Hz to adapt to my country's national conditions; ---IEC 61000-4-7:2002/AMD1:2008 is listed in the normative reference document of IEC 61000-4-30:2021: This document uses Replaced by GB/T 17626:7-2017 (IEC 61000-4-7:2009, IDT); ---IEC 61000-4-15:2010 is listed in the normative reference document of IEC 61000-4-30:2021, and in many places in other chapters of the text: IEC 61000-4-15 is quoted without adding a date: In order to maintain consistency with the normative reference documents, this document is quoted in other chapters of the text: Use IEC 61000-4-15 to add the date:2010: The following editorial changes have been made to this document: ---In order to adapt to my country's standard system, the standard name is modified to "Electromagnetic Compatibility Testing and Measurement Technology Part 30: Electrical Energy Quality" Quantity Measurement Methods"; ---Introductory words are added before category A and category S items; --- Regarding the term "flash" (see 3:6), combined with the actual situation in my country, add a note "In the field of power quality, this term is also called 'flash':" Change'"; ---The first and third sentences of the fourth paragraph of 4:7 in IEC 61000-4-30:2021 are highly repetitive: This document merges them into paragraph 4:7: Three sections: Please note that some content in this document may be subject to patents: The publisher of this document assumes no responsibility for identifying patents: This document is proposed and coordinated by the National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC246): This document was drafted by: China Electric Power Research Institute Co:, Ltd:, State Grid Zhejiang Electric Power Co:, Ltd: Electric Power Research Institute, State Grid Jiangsu Electric Power Co:, Ltd:, State Grid Hunan Electric Power Co:, Ltd: Electric Power Research Institute, the Fifth Research Institute of the Ministry of Industry and Information Technology, China Electric Power Sub-Technical Standardization Research Institute, Shenzhen Power Supply Bureau Co:, Ltd:, Wuhan University, State Grid Hubei Electric Power Co:, Ltd: Wuhan Power Supply Company: The main drafters of this document: Liu Xingfa, Wan Baoquan, Zhang Jiangong, Li Pei, Yin Ting, Ma Zhiquan, Li Ni, Ning Zhihao, Yu Peng, Liu Jian D, Lu Hailiang, Qian Zheyuan, Zhu Feibai, Tian Jie, Dong Dianshuai, Guo Haozhou, Kang Wenbin, Zhu Wenli, Chen Shigang, Xu Jilai, Lu Yao, Huang Fen, Dai Shaojun: The previous versions of this document and the documents it replaces are as follows: ---First published in:2012 as GB/T 17626:30-2012; ---This is the first revision:

Introduction

Electromagnetic compatibility is the ability of electrical and electronic equipment or systems to function normally in their electromagnetic environment without causing any adverse effects on anything in that environment: The ability to withstand electromagnetic disturbance: Electromagnetic compatibility is one of the important factors affecting the environment and product quality, and its standardization work has led to It has attracted widespread attention at home and abroad: In this regard, the IEC 61000 series of standards formulated by the International Electrotechnical Commission (IEC ) are important for manufacturing and information industries: Common standards in the fields of industry, electrical engineering and energy, transportation industry, social undertakings and health, consumer product quality and safety, etc:, are divided into comprehensive There are six categories: description, environment, limits, test and measurement technology, installation and mitigation guidelines, and general standards: Our country has already launched a series of standards for this series of standards Domestic transformation work has been carried out and the corresponding national standard system has been established: In this standard system, GB/T (Z) 17626 "Electromagnetic Compatibility Test and Measurement Technology" is about testing and measurement in the field of electromagnetic compatibility: Basic technical standards, intended to describe immunity tests and other contents of electromagnetic compatibility phenomena such as conducted disturbance and radiated disturbance, are planned to be composed of 39 Partial composition: ---Part 1: General introduction to immunity testing: The purpose is to provide usability guidance on relevant test and measurement techniques in electromagnetic compatibility standards: guide and provide general advice on selecting relevant tests: ---Part 2: Electrostatic discharge immunity test: The purpose is to establish a common and reproducible benchmark for evaluating electrical and electronic devices: Performance when subjected to electrostatic discharge: ---Part 3: Radio frequency electromagnetic field radiation immunity test: The purpose is to establish when electrical and electronic equipment is exposed to radio frequency electromagnetic field radiation basis for immunity evaluation: ---Part 4: Electrical fast transient burst immunity test: The aim is to establish a common and reproducible benchmark for evaluating electrical Immunity of power supply ports, signal, control and ground ports of electronic equipment to interference from electrical fast transient bursts performance: ---Part 5: Surge (impact) immunity test: The aim is to establish a common and reproducible benchmark for evaluating electrical and electronic The immunity performance of the equipment when subjected to surges (shocks): ---Part 6: Conducted disturbance immunity induced by radio frequency fields: The aim is to establish a common and reproducible benchmark for evaluating electrical and immunity performance of electronic equipment when receiving conducted disturbances induced by radio frequency fields: ---Part 7: Measurement of harmonics and interharmonics of power supply systems and connected equipment and guidelines for measuring instruments: The purpose is to provide for root Test equipment item by item according to the emission limits given by certain standards, and measure harmonic currents and voltages in actual power supply systems: instrument: ---Part 8: Power frequency magnetic field immunity test: The aim is to establish common and reproducible benchmarks for evaluating household, commercial and Immunity performance of industrial electrical and electronic equipment in power frequency (continuous and short-time) magnetic fields: ---Part 9: Pulse magnetic field immunity test: The aim is to establish common and reproducible benchmarks for assessing residential, commercial and Immunity performance of industrial electrical and electronic equipment exposed to pulsed magnetic fields: ---Part 10: Damped oscillating magnetic field immunity test: The aim is to establish a common and reproducible benchmark for evaluating medium and high voltage Immunity performance of electrical and electronic equipment in substations exposed to damped oscillating magnetic fields: ---Part 11: Immunity to voltage sags, short interruptions and voltage changes for equipment with an input current less than or equal to 16A per phase test: The aim is to establish a common and reproducible benchmark for evaluating the performance of electrical and electronic equipment subjected to voltage dips, short-term and medium-term immunity to interruptions and voltage changes: ---Part 12: Ringing wave immunity test: The aim is to establish a common and reproducible benchmark to evaluate the The immunity performance of electrical and electronic equipment used in residential, commercial and industrial applications also applies to equipment in power stations and substations: ---Part 13: Low-frequency immunity test for AC port harmonics, interharmonic waves and power grid signals: The aim is to establish a common and reproducible Reproducible benchmark to evaluate the low-frequency immunity performance of electrical and electronic equipment to harmonics, inter-harmonics and grid signal frequencies: ---Part 14: Voltage fluctuation immunity test: The aim is to establish a common and reproducible benchmark for evaluating electrical and electronic Immunity performance of a device when subjected to positive and negative low-amplitude voltage fluctuations: ---Part 15: Scintillation meter functions and design specifications: The aim is to display the correct flicker for all actual voltage fluctuation waveforms perceived level: ---Part 16: 0Hz~150kHz common mode conducted disturbance immunity test: The purpose is to establish electrical and electronic equipment to withstand common General and repeatability guidelines for mode conducted disturbance testing: ---Part 17: DC power input port ripple immunity test: The purpose is to establish a common and reproducible benchmark for Superimposed direct current on electrical and electronic equipment under laboratory conditions from sources such as rectifier systems and/or battery charging: Immunity test for ripple voltage on the source: ---Part 18: Damped oscillating wave immunity test: The aim is to establish a common and reproducible benchmark for evaluating electrical and Immunity performance of sub-devices when subjected to damped oscillating waves: ---Part 19: AC power port 2kHz~150kHz differential mode conduction disturbance and communication signal immunity test: The purpose is Verify that electrical and electronic equipment operating on the utility grid can withstand interference from systems such as power electronics and power line communications (PLC) Differential mode conduction disturbance: ---Part 20: Emission and immunity tests in transverse electromagnetic (TEM) waveguides: The purpose is to give the performance of TEM waveguide, Confirmation method of TEM waveguide for electromagnetic compatibility test, test of radiated emission and immunity test in TEM waveguide inspection layout, procedures and requirements: ---Part 21: Mixed wave chamber test method: The purpose is to establish the use of mixed wave chambers to evaluate electrical and electronic equipment in radio frequency electromagnetic fields: General specification for the performance and determination of radiated emission levels of electrical and electronic equipment: ---Part 22: Radiated emission and immunity measurements in a fully anechoic chamber: The purpose is to provide for the entry into the same full anechoic chamber General verification procedures for radiated emissions and radiated immunity, test layout requirements for the equipment under test, and full anechoic chamber measurement methods: ---Part 23: Test methods for HEMP and other radiation disturbance protection devices: The purpose is to describe the HEMP test by Basic principles, as well as the theoretical basis (test concept), test configuration, required equipment, test procedures, and data processing of protective component tests: important concepts such as theory: ---Part 24: Test methods for HEMP conducted disturbance protection devices: The purpose is to specify HEMP conducted disturbance protection devices Test methods, including tests of voltage breakdown and voltage limiting characteristics, as well as tests of residual voltage when voltage and current change rapidly Measurement methods: ---Part 25: Equipment and system HEMP immunity test methods: The aim is to establish a common and reproducible benchmark for Evaluate exposure to the HEMP radiation environment and the conducted transient disturbances it creates on power supplies, antennas, I/O signal lines, and control lines performance of electrical and electronic equipment: ---Part 27: Three-phase voltage imbalance immunity test: The purpose is to provide electrical and electronic equipment with unbalanced power supplies: Establish a reference for immunity evaluation at high pressure: ---Part 28: Power frequency frequency change immunity test: The purpose is to provide protection for electrical and electronic equipment when subjected to power frequency changes: Provide a basis for immunity evaluation: ---Part 29: Immunity test for voltage sag, short interruption and voltage change at DC power input port: The purpose is to establish an evaluation General criteria for the immunity of DC electrical and electronic equipment when subjected to voltage sags, short interruptions and voltage changes: ---Part 30: Power quality measurement methods: The purpose is to specify the measurement method of power quality parameters in 50Hz AC power supply system and interpretation of measurement results: ---Part 31: AC power port broadband conducted disturbance immunity test: The purpose is to establish a common benchmark for evaluating electrical and immunity of AC power ports of electronic equipment to conducted disturbances generated by intentional and/or unintentional broadband signal sources: ---Part 32: High Altitude Nuclear Electromagnetic Pulse (HEMP) Simulator Overview: The purpose is to provide internationally existing system-level HEMP Simulators and related information required for their use as immunity test and verification equipment: ---Part 33: High-power transient parameter measurement methods: The purpose is to provide measurement methods and methods for high-power electromagnetic transient response waveforms: Information about characteristic parameters: ---Part 34: Voltage sag, short interruption and voltage change immunity test for equipment with main power supply current greater than 16A per phase: The purpose is to establish a common method for evaluating the immunity of electrical and electronic equipment when subjected to voltage sags, short interruptions and voltage changes: guidelines: ---Part 35: High Power Electromagnetic (HPEM) Simulator Overview: The purpose is to provide the internationally existing system-level HPEM narrow Band (narrow spectrum) and broadband (wide spectrum, sub-ultra-wide spectrum and ultra-wide spectrum) simulators and their use as immunity test and verification equipment Relevant information required: ---Part 36: Intentional electromagnetic interference immunity testing of equipment and systems: The purpose is to provide equipment and systems for the evaluation of intentional electromagnetic The immunity of the interference source provides a means of determining the test level: ---Part 37: Harmonic emission test system calibration and verification protocol: It is intended for manufacturers, end users, independent laboratories, Other organizations provide systematic guidance to specify the applicable compliance status within certain ranges of harmonic current emissions: ---Part 38: Testing, verification and calibration protocols for voltage fluctuation and flicker compliance test systems: The purpose is to provide type testing The system of equipment provides guidance and methods for periodic calibration and verification: ---Part 39: Near-field radiation immunity test: The aim is to establish a common benchmark for assessing exposure to radiation from close-range sources Immunity requirements for electrical and electronic equipment exposed to radio frequency electromagnetic fields: ---Part 40: Digital measurement methods of modulated or distorted signal power: The purpose is to introduce two methods suitable for fluctuation or non-periodic negative Download the numerical algorithm for power quantity measurement and explain how the proposed algorithm works: my country released GB/T 17626:30 in:2012, which corresponds to IEC 61000-4-30:2008: It has been 10 years since the release and implementation of the new version of the standard: The main technical content of IEC 61000-4-30:2021 has undergone important changes, such as adding rapid voltage change measurement methods and adding performance Verify relevant content, etc: In view of this, it is indeed necessary to revise GB/T 17626:30 to continuously adapt to new changes in relevant technical content at home and abroad: This revision of GB/T 17626:30 adds content related to rapid voltage change measurement methods and performance verification and 2kHz to Conducted emission related content within the 150kHz range, etc:, thereby improving the accuracy of power quality measurement methods and further standardizing domestic electric energy Quality measurement: Electromagnetic compatibility test and measurement technology Part 30: Power quality measurement methods

1 Scope

This document specifies the measurement method and measurement results of power quality parameters in an AC power supply system with a nominal fundamental frequency of 50Hz: deal with: The measurement methods of each relevant parameter are described in terms that provide reliable and repeatable results, but do not involve the implementation of the measurement method: means: This document deals with on-site measurement methods: The measurement of parameters covered in this document is limited to conductive phenomena in power systems: The power quality parameters involved in this document refer to the grid frequency rate, supply voltage amplitude, flicker, supply voltage sags and swells, voltage interruptions, transient voltages, supply voltage imbalances, voltage harmonics and interharmonics waves, carrier signals in the supply voltage, rapid voltage changes, and currents: Considerations for conducted emissions in the range 2 kHz to 150 kHz see Appendix C: See Appendix D for considerations of positive and negative deviations: Depending on the purpose of measurement, all or part of the above parameters can be measured: Measurement: Note 1: See IEC 62586-2 for the compliance test methods of this document: Note 2: The role of sensors between the power supply system and the instrument is well known and therefore is not described in detail in this document: Related in IEC TR61869-103 Guidance on sensor applications:

2 Normative reference documents

The contents of the following documents constitute essential provisions of this document through normative references in the text: Among them, the dated quotations For undated referenced documents, only the version corresponding to that date applies to this document; for undated referenced documents, the latest version (including all amendments) applies to this document: GB/T 17626:7-2017 Electromagnetic compatibility testing and measurement technology, measurement and analysis of harmonics and interharmonics of power supply systems and connected equipment Guidelines for measuring instruments (IEC 61000-4-7:2009, IDT) Note: There are no technical differences between GB/T 17626:7-2017 and IEC 61000-4-7:2002/AMD1:2008: Note: GB/T 2900 (all parts) electrical terminology [IEC 60050 (all parts), IDT] IEC 61000-2-4 Electromagnetic compatibility (EMC) Part 2-4: Compatibility level for low-frequency conducted disturbances in environmental factories (Electro- Note: GB/T 18039:4-2017 Compatibility level of low-frequency conducted disturbance in factories in electromagnetic compatibility environment (IEC 61000-2-4:2002, IDT) IEC 61000-4-4 Electromagnetic compatibility (EMC) Part 4-4: Test and measurement techniques Electrical fast transient/burst immunity testing transient/burstimmunitytest] Note: GB/T 17626:4-2018 Electromagnetic compatibility test and measurement technology Electrical fast transient pulse group immunity test (IEC 61000-4-4:2012, IDT) IEC 61000-4-15:2010 Electromagnetic compatibility (EMC) Part 4-15: Test and measurement technology scintillator function and design

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