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GB/T 17626.36-2024: Electromagnetic compatibility - Testing and measurement techniques - Part 36: Intentional electromagnetic interference immunity test methods for equipment and systems
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Electromagnetic compatibility - Testing and measurement techniques - Part 36: Intentional electromagnetic interference immunity test methods for equipment and systems
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Basic data | Standard ID | GB/T 17626.36-2024 (GB/T17626.36-2024) | | Description (Translated English) | Electromagnetic compatibility - Testing and measurement techniques - Part 36: Intentional electromagnetic interference immunity test methods for equipment and systems | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L06 | | Classification of International Standard | 33.100.20 | | Word Count Estimation | 94,951 | | Date of Issue | 2024-11-28 | | Date of Implementation | 2025-06-01 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 17626.36-2024: Electromagnetic compatibility - Testing and measurement techniques - Part 36: Intentional electromagnetic interference immunity test methods for equipment and systems
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ICS 33.100.20
CCSL06
National Standard of the People's Republic of China
Electromagnetic compatibility test and measurement technology
Part 36.Intentional electromagnetic disturbances in equipment and systems
Immunity test method
Published on 2024-11-28 Implemented on 2025-06-01
State Administration for Market Regulation
The National Standardization Administration issued
Table of Contents
Preface V
Introduction VII
1 Scope 1
2 Normative references 1
3 Terms, definitions and abbreviations 1
3.1 Terms and Definitions 1
3.2 Abbreviations 4
4 Overview 5
5 IEMI environment and role 6
5.1 Overview 6
5.2 IEMI Environment 6
5.2.1 Technical capability grouping 6
5.2.2 IEMI deployment plan 6
5.2.3 Radiated IEMI Environment Summary 7
5.2.4 Published Conducted IEMI Environment 7
5.3 Effects on disturbed equipment, systems and devices 8
5.3.1 Overview 8
5.3.2 Protection level 8
6 Test methods 9
6.1 Derivation of applicable test methods 9
6.2 Derivation of transfer function 10
6.3 Radiation testing using IEMI simulator 10
6.4 Radiation test using a mixing chamber 10
6.5 Complex Waveform Injection (CWI) 11
6.6 Damped Sine Wave Injection (DSI) 11
6.7 Electrostatic Discharge (ESD) 11
6.8 Electrical Fast Transient (EFT) 11
6.9 Antenna Port Injection 11
7 Test parameters 12
7.1 Derivation of immunity test parameters 12
7.2 Radiation test parameters 12
7.2.1 General UWB test parameters (for skilled personnel) 12
7.2.2 General broadband test parameters (for skilled personnel) 13
7.2.3 General narrowband test parameters (for skilled personnel) 15
7.3 General Conducted IEMI Test Parameters 16
7.3.1 General requirements 16
7.3.2 Characteristics and performance of fast damped oscillatory wave generator 17
7.4 Derivation of specific test levels 18
7.5 Relevance of EMC Immunity Data 19
Appendix A (Informative) Failure mechanism and performance criteria 20
A.1 Overview 20
A.2 Failure mechanism 20
A.2.1 Overview 20
A.2.2 Noise 20
A.2.3 Parameter offset and drift 21
A.2.4 System failure or crash 21
A.2.5 Component damage 21
A.3 Effect of pulse width 22
A.4 Performance criteria 23
A.5 References 23
Appendix B (Informative) Development of IEMI Source Environment 25
B.1 Overview 25
B.2 IEMI Environment 26
B.3 IEMI Sources 27
B.4 Published Radiated IEMI Environment 30
B.4.1 IEC 61000-2-13[B.14] 30
B.4.2 Mil-Std-464C 30
B.4.3 Parameter selection for broadband immunity test 31
B.4.4 International Telecommunication Union (ITU) 33
B.5 Summary 33
B.6 References 34
Appendix C (Informative) Interaction with Buildings 36
C.1 Attenuation of buildings 36
C.2 Coupling with cables 37
C.3 Low voltage cable attenuation 38
C.4 References 38
Appendix D (Informative) Relationship between plane wave immunity test and reverberation chamber immunity test 40
D.1 Overview 40
D.2 Relationship between shielding effectiveness measurements in two environments 40
D.3 Relationship between immunity tests in two environments 42
D.4 Supplementary content 43
D.5 References 44
Appendix E (Informative) Complex waveform injection-test method 46
E.1 Overview 46
E.2 Prediction 46
E.2.1 Overview 46
E.2.2 Example 49
E.3 Structure 51
E.4 Injection test 54
E.5 Summary 56
E.6 References 56
Appendix F (Informative) Importance of test method margin 57
F.1 Overview 57
F.2 Example 57
F.2.1 Overview 57
F.2.2 Negative Contribution 57
F.2.3 Positive contribution 60
F.2.4 Summary 61
F.3 References 61
Appendix G (Informative) Intentional EMI---The Problem of Jammers 62
G.1 Overview 62
G.2 Effect 62
G.3 Public reports of interference62
G.4 Risk Assessment63
G.5 Mitigation measures63
G.6 References 63
Appendix H (Normative) Ultra-wideband and broadband radiated transient immunity test method 65
H.1 Overview 65
H.2 Test equipment 65
H.2.1 Overview 65
H.2.2 Test facilities 65
H.2.3 Ultra-wideband transient pulse radiation test system 65
H.2.4 Broadband transient pulse radiation test system 66
H.2.5 Measurement chain 66
H.3 Field uniformity assessment 67
H.3.1 Field uniformity assessment in a darkroom 67
H.3.2 Field uniformity in a GTEM waveguide 69
H.4 Test Arrangement 69
H.4.1 General 69
H.4.2 Desktop equipment layout 70
H.4.3 Floor-standing equipment layout 71
H.4.4 Cable layout 71
H.5 Test procedures 71
H.5.1 Overview 71
H.5.2 Laboratory reference conditions 71
H.5.3 Execution of the test 72
H.5.4 Evaluation of test results 73
H.6 Test report 73
H.7 References 73
Appendix I (Informative) Sensor calibration methods and measurement uncertainties for measuring ultra-wideband and broadband radiated transient fields 74
I.1 Overview 74
I.2 IEC 61000-4-20.2010, Annex E [I.1] Calibration methods in TEM waveguides 74
I.2.1 Overview 74
I.2.2 Probe calibration requirements 74
I.2.3 Field strength probe calibration procedure for single-port TEM waveguide 76
I.3 D-dot sensor time domain calibration procedure 76
I.3.1 Overview 76
I.4 Measurement uncertainty 77
I.5 References 78
References 79
Foreword
This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents"
Drafting.
This document is part 36 of GB/T (Z) 17626 "Electromagnetic compatibility test and measurement technology". GB/T (Z) 17626 has been published
The following parts.
---GB /Z 17626.1-2024 Electromagnetic compatibility test and measurement technology Part 1.General introduction to immunity test;
---GB/T 17626.2-2018 Electromagnetic compatibility test and measurement technology Electrostatic discharge immunity test;
---GB/T 17626.3-2023 Electromagnetic compatibility test and measurement technology Part 3.Radio frequency electromagnetic field radiated immunity
test;
---GB/T 17626.4-2018 Electromagnetic compatibility test and measurement technology Electrical fast transient pulse group immunity test;
---GB/T 17626.5-2019 Electromagnetic compatibility test and measurement technology surge (impact) immunity test;
---GB/T 17626.6-2017 Electromagnetic compatibility test and measurement technology Radio frequency field induced conducted disturbance immunity;
---GB/T 17626.7-2017 Electromagnetic compatibility test and measurement technology Power supply system and connected equipment harmonic and interharmonic measurement
Guidelines for volume and measuring instruments;
---GB/T 17626.8-2006 Electromagnetic compatibility test and measurement technology Power frequency magnetic field immunity test;
---GB/T 17626.9-2011 Electromagnetic compatibility test and measurement technology pulse magnetic field immunity test;
---GB/T 17626.10-2017 Electromagnetic compatibility test and measurement technology Damped oscillating magnetic field immunity test;
---GB/T 17626.11-2023 Electromagnetic compatibility test and measurement technology Part 11.For each phase input current less than or equal to
Voltage sag, short interruption and voltage variation immunity test for 16A equipment;
---GB/T 17626.12-2023 Electromagnetic compatibility test and measurement techniques Part 12.Ringing wave immunity test;
---GB/T 17626.13-2006 Electromagnetic compatibility test and measurement technology AC power port harmonics, interharmonics and power grid signal
Low frequency immunity test of signal;
---GB/T 17626.14-2005 Electromagnetic compatibility test and measurement technology Voltage fluctuation immunity test;
---GB/T 17626.15-2011 Electromagnetic compatibility test and measurement technology Flicker meter function and design specification;
---GB/T 17626.16-2007 Electromagnetic compatibility test and measurement technology 0Hz~150kHz common mode conducted disturbance immunity
test;
---GB/T 17626.17-2005 Electromagnetic compatibility test and measurement technology DC power supply input port ripple immunity test;
---GB/T 17626.18-2016 Electromagnetic compatibility test and measurement technology Damped oscillation wave immunity test;
---GB/T 17626.19-2022 Electromagnetic compatibility test and measurement technology Part 19.AC power port 2kHz~
150kHz differential mode conducted disturbance and communication signal immunity test;
---GB/T 17626.20-2014 Electromagnetic compatibility test and measurement technology Transverse electromagnetic wave (TEM) emission and immunity in waveguide
Degree test;
---GB/T 17626.21-2014 Electromagnetic compatibility test and measurement technology mixing chamber test method;
---GB/T 17626.22-2017 Electromagnetic compatibility test and measurement technology Radiated emission and immunity in full anechoic chamber
Measurement;
---GB/T 17626.24-2012 Electromagnetic compatibility test and measurement technology Test of HEMP conducted disturbance protection device
method;
---GB/T 17626.27-2006 Electromagnetic compatibility test and measurement technology Three-phase voltage unbalance immunity test;
---GB/T 17626.28-2006 Electromagnetic compatibility test and measurement technology Power frequency change immunity test;
---GB/T 17626.29-2006 Electromagnetic compatibility test and measurement technology DC power input port voltage drop, short-term
Interference immunity test of interruption and voltage variation;
---GB/T 17626.30-2023 Electromagnetic compatibility test and measurement technology Part 30.Power quality measurement method;
---GB/T 17626.31-2021 Electromagnetic compatibility test and measurement technology Part 31.Broadband conducted harassment of AC power ports
Interference immunity test;
---GB /Z 17626.33-2023 Electromagnetic compatibility test and measurement technology Part 33.High power transient parameter measurement method;
---GB/T 17626.34-2012 Electromagnetic compatibility test and measurement technology Equipment with main power supply current greater than 16A per phase
Voltage sag, short interruption and voltage variation immunity test;
Interference immunity test method;
---GB/T 17626.39-2023 Electromagnetic compatibility test and measurement technology Part 39.Close-range radiated field immunity
test.
This document is equivalent to IEC 61000-4-36.2020 "Electromagnetic compatibility (EMC) Part 4-36.Test and measurement technology equipment and
"Test method for immunity to intentional electromagnetic disturbance of systems".
The following minimal editorial changes were made to this document.
--- In order to coordinate with the existing standards, the name of the standard is changed to "Electromagnetic compatibility test and measurement technology Part 36.Equipment and system
Intentional electromagnetic interference immunity test method";
--- To be consistent with the references, the reference to IEC 60050-161.2018 in Chapter 3 is corrected to IEC 60050-161.
1990, the international standard is wrong.
Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents.
This document is proposed and coordinated by the National Electromagnetic Compatibility Standardization Technical Committee (SAC/TC246).
This document was drafted by. China Electronics Standardization Institute, China Electric Power Research Institute Co., Ltd., Xiamen Hainoda Scientific Instrument
Co., Ltd., Zhejiang Qianjiang Robot Co., Ltd., Shenzhen Taolue Technology Co., Ltd., Suzhou Test Electronic Technology Co., Ltd., Industrial
The Fifth Institute of Electronics of the Ministry of Information Technology, China Institute of Metrology, China Automotive Engineering Research Institute Co., Ltd., Beijing University of Posts and Telecommunications,
China Automotive Technology and Research Center Co., Ltd., Shanghai Electrical Equipment Testing Institute Co., Ltd., Zhejiang Nuoyi Technology Co., Ltd., Guangzhou Chengzhen
Electronic Technology Co., Ltd., China National Accreditation Service for Conformity Assessment, Shanghai Institute of Metrology and Testing Technology, Southeast University, Hangke Quality Inspection
(Xi'an) Technology Co., Ltd., State Grid Zhejiang Electric Power Co., Ltd. Electric Power Research Institute, Beijing University of Chemical Technology, Jiangsu Electronic Information Products
Quality Supervision and Inspection Institute (Jiangsu Information Security Evaluation Center), Daming Electronics Co., Ltd., Chongqing Qingshan Industrial Co., Ltd.
Shanghai Aircraft Design and Research Institute of Commercial Aircraft Corporation of China, Guangdong Hanwei Information Technology Co., Ltd., Shenzhen Xiangfan Technology Co., Ltd.
Limited company.
The main drafters of this document are. Cui Qiang, Chen Zhengyu, Xie Huichun, Fu Jun, Zhang Jiangong, Zhu Wenli, Huang Pan, Huang Xuemei, Li Zhipeng, Shi Dan,
Ji Guotian, Hu Xiaojun, Xing Lin, Zheng Yimin, Li Nan, Jin Dong, Liang Jiming, Liu Chang, Kang Yaqiang, Li Jinlong, Zhou Zhongyuan, Li Haiyang, Yang Zhichao,
Wang Yifan, Han Yunan, Meng Fanjun, Zhou Yuan, Wu Xing, Hu Yueyun, Yan Hanliang, Zeng Xumin.
Introduction
Electromagnetic compatibility refers to the ability of electrical and electronic equipment or systems to work properly in their electromagnetic environment and not cause any adverse effects on anything in the environment.
The electromagnetic compatibility problem is one of the important factors affecting the environment and product quality. Its standardization work has attracted
In this regard, the IEC 61000 series of standards developed by the International Electrotechnical Commission (IEC) is a key standard for the manufacturing and information industries.
General standards in the fields of industry, electrical engineering and energy, transportation, social services and health, consumer product quality and safety, etc.
There are six categories. description, environment, limit, test and measurement technology, installation and mitigation guidelines, and general standards. my country has carried out research on this series of standards.
Domestic transformation work has been carried out and a corresponding national standard system has been established.
In this standard system, GB/T (Z) 17626 "Electromagnetic compatibility test and measurement technology" is about the test and measurement in the field of electromagnetic compatibility.
The basic technical standards are intended to describe the immunity test of electromagnetic compatibility phenomena such as conducted disturbance and radiated disturbance, etc., and are planned to be composed of 39
Partial composition.
--- Part 1.General introduction to immunity test. The purpose is to provide usability guidance on the test and measurement techniques in the electromagnetic compatibility standard.
guidance and provides general advice on the selection of relevant tests.
--- Part 2.Electrostatic discharge immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic devices.
The performance of the device when subjected to electrostatic discharge.
--- Part 3.Radio frequency electromagnetic field radiation immunity test. The purpose is to establish the electrical and electronic equipment when it is subjected to radio frequency electromagnetic field radiation.
The basis for immunity assessment.
--- Part 4.Electrical fast transient burst immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical
Immunity of power supply ports, signal, control and ground ports of electronic equipment when subjected to electrical fast transient pulse group interference
performance.
--- Part 5.Surge (impact) immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic
The immunity performance of the equipment when subjected to surge (impact).
--- Part 6.Immunity to conducted disturbances induced by radio-frequency fields. The purpose is to establish a common and reproducible benchmark to evaluate electrical
And the immunity performance of electronic equipment when it receives conducted disturbances induced by radio frequency fields.
--- Part 7.Measurement and measurement instruments for harmonics and interharmonics of power supply systems and connected equipment. The purpose is to specify
The equipment is tested item by item according to the emission limits given in certain standards, and the harmonic current and voltage in the actual power supply system are tested.
Instrument for measuring.
--- Part 8.Power frequency magnetic field immunity test. The purpose is to establish a common and reproducible benchmark to evaluate household, commercial and
Immunity performance of industrial electrical and electronic equipment in power frequency (continuous and short-term) magnetic fields.
--- Part 9.Pulse magnetic field immunity test. The purpose is to establish a common and reproducible benchmark to evaluate residential, commercial and
Immunity performance of industrial electrical and electronic equipment in pulsed magnetic fields.
--- Part 10.Damped oscillatory magnetic field immunity test. The purpose is to establish a common and reproducible benchmark to evaluate medium and high voltage
Immunity performance of electrical and electronic equipment in substations exposed to damped oscillating magnetic fields.
--- Part 11.Voltage dips, short interruptions and voltage variations immunity test for equipment with input current less than or equal to 16A per phase
The purpose is to establish a common and reproducible benchmark for evaluating the performance of electrical and electronic equipment when subjected to voltage dips, short interruptions,
and voltage variation immunity performance.
--- Part 12.Ring wave immunity test. The purpose is to establish a common and reproducible benchmark to evaluate the
The immunity performance of electrical and electronic equipment for residential, commercial and industrial use also applies to equipment in power stations and substations.
--- Part 13.Low frequency immunity test for harmonics, interharmonics and power grid signals at AC power ports. The purpose is to establish a common
and reproducible benchmark to evaluate the low frequency immunity performance of electrical and electronic equipment to harmonics, interharmonics and mains signal frequencies.
--- Part 14.Voltage fluctuation immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic
The immunity of a device when subjected to positive and negative low amplitude voltage fluctuations.
--- Part 15.Flicker meter function and design specifications. The purpose is to display the correct flicker for all practical voltage fluctuation waveforms
Perception level.
--- Part 16.0Hz~150kHz common mode conducted disturbance immunity test. The purpose is to establish electrical and electronic equipment to withstand common
General and repeatability criteria for mode conducted disturbance testing.
--- Part 17.DC power input port ripple immunity test. The purpose is to establish a common and reproducible benchmark for
Under laboratory conditions, electrical and electronic equipment are tested on a DC power supply when the self-rectifying system and/or battery charging is superimposed
Ripple voltage immunity test on the
--- Part 18.Damped oscillatory wave immunity test. The purpose is to establish a common and reproducible benchmark to evaluate electrical and electronic
The immunity performance of a sub-device when subjected to a damped oscillatory wave.
--- Part 19.AC power port 2kHz ~ 150kHz differential mode conducted disturbance and communication signal immunity test. The purpose is to
Confirm that electrical and electronic equipment can withstand the loads from power electronics and power line communication systems (PLC) when operating in the public power grid.
Differential mode conducted interference.
--- Part 20.Transverse electromagnetic (TEM) waveguide emission and immunity test. The purpose is to give the performance of TEM waveguide,
Method for confirming TEM waveguides for electromagnetic compatibility tests, test of radiated emission and immunity tests in TEM waveguides
Test arrangements, procedures and requirements.
--- Part 21.Reverberation chamber test method. The purpose is to establish the use of reverberation chamber to evaluate electrical and electronic equipment in radio frequency electromagnetic fields
General specification for the performance and determination of the radiated emission levels of electrical and electronic equipment.
--- Part 22.Radiated emission and immunity measurements in a fully anechoic chamber. The purpose is to specify
The general confirmation procedures for radiated emissions and radiated immunity, test layout requirements for the equipment under test and full anechoic chamber measurement methods are provided.
--- Part 23.Test methods for HEMP and other radiation disturbance protection devices. The purpose is to describe the HEMP test
Basic principles, as well as the theoretical basis (test concept), test configuration, required equipment, test procedures, data processing of protective element tests.
Important concepts such as theory.
--- Part 24.Test methods for HEMP conducted disturbance protection devices. The purpose is to specify the test methods for HEMP conducted disturbance protection devices.
The test method includes the voltage breakdown and voltage limiting characteristics test, as well as the residual voltage test when the voltage and current change rapidly.
Measurement method.
--- Part 25.Test methods for HEMP immunity of equipment and systems. The purpose is to establish a common and reproducible benchmark for
When evaluating the HEMP radiation environment and the conducted transient disturbances it generates on power supply, antenna, I/O signal lines and control lines
performance of electrical and electronic equipment.
--- Part 27.Three-phase voltage unbalance immunity test. The purpose is to test the electrical and electronic equipment under the condition of unbalanced power supply.
It establishes a reference for the immunity evaluation under pressure.
--- Part 28.Power frequency change immunity test. The purpose is to test the immunity of electrical and electronic equipment to power frequency changes.
Provide basis for immunity evaluation.
--- Part 29.Immunity test for voltage dips, short interruptions and voltage variations at DC power input ports. The purpose is to establish
General criteria for evaluating the immunity of DC electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations.
--- Part 30.Power quality measurement methods. The purpose is to specify the measurement methods of power quality parameters in 50 Hz AC power supply systems
and interpretation of measurement results.
--- Part 31.AC power port broadband conducted disturbance immunity test. The purpose is to establish a common benchmark to evaluate electrical
Immunity of AC power ports of electronic equipment to conducted disturbances generated by intentional and/or unintentional broadband signal sources.
--- Part 32.Overview of High Altitude Electromagnetic Pulse (HEMP) Simulators. The purpose is to provide the current international system-level HEMP
Simulators and the relevant information needed when they are used as immunity test and verification equipment.
--- Part 33.High power transient parameter measurement method. The purpose is to provide the measurement method and
Information about feature parameters.
--- Part 34.Voltage dips, short interruptions and voltage variations immunity test for equipment with mains current greater than 16A per phase.
The purpose is to establish a general method for evaluating the immunity of electrical and electronic equipment to voltage dips, short interruptions and voltage variations.
Guidelines.
--- Part 35.Overview of High Power Electromagnetic (HPEM) Simulators. The purpose is to provide an overview of the existing system-level HPEM
Wideband (narrow spectrum) and broadband (broad spectrum, sub-ultra-broad spectrum and ultra-broad spectrum) simulators and their use as immunity test and verification equipment
Required relevant information.
--- Part 36.Test methods for the immunity of equipment and systems to intentional electromagnetic disturbances.
Immunity to sources of electromagnetic disturbance provides a means of determining the test level.
--- Part 37.Calibration and verification protocol for harmonic emission compliance test systems.
Laboratories and other organizations provide systematic guidance to define applicable compliance status within a certain range of harmonic current emissions.
--- Part 38.Test, verification and calibration protocol for voltage fluctuation and flicker compliance test systems.
Provide guidance and methods for regular calibration and verification of systems composed of equipment.
--- Part 39.Close-range radiated field immunity test. The purpose is to establish a common benchmark to evaluate exposure to close-range sources.
Immunity requirements for electrical and electronic equipment from radiated radio frequency electromagnetic fields.
--- Part 40.Digital measurement methods for modulated or distorted signal power. The purpose is to introduce two methods that are applicable to fluctuating or non-periodic loads.
A digital algorithm for measuring power quantity under load is proposed and the working principle of the proposed algorithm is explained.
Electromagnetic compatibility test and measurement technology
Part 36.Intentional electromagnetic disturbances in equipment and systems
Immunity test method
1 Scope
This document describes the method for determining test levels used to evaluate the immunity of equipment and systems to intentional electromagnetic interference (IEMI) sources.
This paper discusses general IEMI issues, IEMI source parameters, derivation of test limits, and summarizes practical test methods.
2 Normative references
This document has no normative references.
3 Terms, definitions and abbreviations
3.1 Terms and Definitions
The following terms and definitions apply to this document.
3.1.1
Attenuation
The reduction in the amplitude of the electric field, magnetic field, current or voltage due to absorption and scattering. The attenuation value is usually expressed in decibels (dB).
[Source. IEC 61000-2-13.2005[3]1),3.1]
1) Numbers in square brackets refer to reference numbers.
3.1.2
Bandratio
The ratio of the upper frequency limit to the lower frequency limit in the frequency band containing 90% of the energy.
Note. If the spectrum contains a large amount of DC components, the lower frequency limit is defined as 1 Hz.
[Source. IEC 61000-2-13.2005[3], 3.2, modified]
3.1.3
Band ratio of decades
Frequency band ratio expressed in decades. decade frequency band ratio = lg (frequency band ratio).
[Source. IEC 61000-2-13.2005[3], 3.3]
3.1.4
Burst
A finite number of clearly distinguishable trains of pulses or oscillations of limited duration.
NOTE When multiple bursts occur, the time between bursts is usually defined.
[Source. IEC 60050-161.1990[19], 161-02-07, with modifications]
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