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GB/T 21636-2021: Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
Status: Valid GB/T 21636: Evolution and historical versions
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Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
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Microbeam analysis -- Electron Probe Micro Analysis (EPMA) -- Vocabulary
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Basic data | Standard ID | GB/T 21636-2021 (GB/T21636-2021) | | Description (Translated English) | Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | G04 | | Word Count Estimation | 41,481 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 21636-2021: Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Microbeam analysis -- Electron probe microanalysis (EPMA) -- Vocabulary
ICS 01:040:71;71:040:99
CCSG04
National Standards of People's Republic of China
Replacing GB/T 21636-2008
Microbeam Analysis
Electron Probe Microanalysis (EPMA) Terminology
Vocabulary
(ISO 23833:2013, IDT)
Published on 2021-12-31
2022-07-01 Implementation
State Administration for Market Regulation
Released by the National Standardization Administration
directory
Preface III
Introduction IV
1 Scope 1
2 Normative references 1
3 Abbreviations 1
4 Definition of general terms for electron probe microanalysis 1
5 DEFINITIONS OF TERMS Describing Electron Probe Microanalysis Instruments 7
6 Definitions of terms used in electron probe microanalysis methods 16
Reference 24
Index 25
foreword
This document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules of Standardization Documents"
Drafting:
This document replaces GB/T 21636-2008 "Microbeam Analysis Electron Probe Microanalysis (EPMA) Terminology", and GB/T 21636-
Compared with:2008, Chapter 2 normative reference documents have been added: Except for structural adjustment and editorial changes, the main technical changes are as follows:
a) Added some terms and definitions (see 4:5:5 and 5:6:4:5:3);
b) Changed the terms and definitions of backscattered electron image, secondary electron image, absorption current image and characteristic X-ray (see 4:4:1, 5:4:2,
5:4:11, 5:4:12, 3:4:1, 4:4:2, 4:4:11, 4:4:12 of the:2008 edition);
c) Changed some terms (see 5:4:7, 5:4:8, 5:5:1, 5:6:8, 5:6:14:2, 6:6:8, 4:4:7, 4:4:8, 4:5:1,
4:6:8, 4:6:14:2, 5:6:8)
d) Added annotations and contents of some terms (see 4:5:5, 5:1:2, 5:2:2, 5:4:7, 5:6:2):
This document is equivalent to ISO 23833:2013 "Microbeam Analysis Electron Probe Microanalysis (EPMA) Terminology":
This document adds a chapter "Normative References":
Please note that some content of this document may be patented: The issuing agency of this document assumes no responsibility for identifying patents:
This document is proposed and managed by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38):
This document was drafted by: Shanghai Institute of Ceramics, Chinese Academy of Sciences:
The main drafters of this document: Zeng Yi, Li Xiangting:
This document was first published in:2008 and this is the first revision:
Introduction
Electron Probe Microanalysis (EPMA) is a modern technique that is widely used in the field of Microbeam Analysis (MBA): Electron Probe
Microscopic analysis enables elemental analysis on the micron scale of solid materials (including metals, alloys, ceramics, glasses, minerals, polymers, powders, etc:)
Qualitative, quantitative analysis and microstructural analysis have been widely used in material science, high-tech industry, basic industry, agriculture, metallurgy, geology, biotechnology, etc:
materials, medicine and health, environmental protection, commodity inspection and trade, and even criminal courts: The terminology standard for each technical field is the standardization development in the field
One of the prerequisites of this document is the terminology related to electron probe microscopic analysis:
Electron probe microanalysis is a comprehensive technique, and its terms involve a wide range of disciplines such as physics, chemistry, and electronics: this document
Limited to the definition of terms used and directly related to the standardization practice of Electron Probe Microanalysis (EPMA), including:
--- Electron probe microanalysis defined in general terms;
--- Definitions of terms describing Electron Probe Microanalysis Instruments;
--- Definition of terms used in electron probe microanalysis methods:
Microbeam Analysis
Electron Probe Microanalysis (EPMA) Terminology
1 Scope
This document defines the terminology used in the practice of Electron Probe Microanalysis (EPMA), including terms of general concepts and
A term for a specific concept of a method classification:
This document applies to definitions of common terms in all standard and practice documents in the relevant field (SEM, AEM, EDX, etc:):
2 Normative references
There are no normative references in this document:
3 Abbreviations
The following abbreviations apply to this document:
BSE: backscattered electrons
CRM: certified reference material, standard sample (certified reference material)
EDS: energy-dispersivespectrometer
EDX: energy-dispersiveX-rayspectrometry
EPMA: Electron Probe Microanalysis
Electron probe microanalyzer (electronprobemicroanalyzer)
eV: electron volt (electronvolt)
keV: kiloelectronvolt (kiloelectronvolt)
SE: secondary electron (secondary electron)
SEM: scanning electron microscope (scanning electron microscope)
WDS: Wavelength-dispersivespectrometer
WDX: Wavelength-dispersiveX-rayspectrometry
4 Definition of general terms used in electron probe microanalysis
4:1
electron probe microanalysis; EPMA
According to the spectroscopic principle of X-ray excitation by the interaction between the focused electron beam and the volume of the sample at the micron to submicron scale, the electron exciter
A technique for analyzing elements within a product:
4:1:1
Qualitative Electron Probe Microanalysis qualitativeEPMA
Electron probe microanalysis is an electron probe microanalysis method to identify the elemental composition in the electronically excited volume of a sample by identifying the peaks of the X-ray spectrum:
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