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Std ID |
Description (Standard Title) |
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SJ/T 10043-1991
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Detail specification for electronic components. Semiconductor integrated circuit. CT54LS112/CT74LS112 dual J-K negative-edge flip-flop with preset and clear
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SJ/T 10044-1991
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Detail specification for electronic components. Semiconductor integrated circuit. CT54LS283/CT74LS283 4-bit binary full adder
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SJ/T 10045-1991
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Detail Specification for electronic components. Semiconductor integrated circuit CT54LS138/CT74LS138 3-to-8 line decoder
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SJ/T 10046-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54LS151/CT74LS151 1-of-8 data selector
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SJ/T 10047-1991
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Detail Specification for electronic components. Semiconductor integrated circuit CT54LS195/CT74LS195 4-bit parallel-access shift register
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SJ/T 10048-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54LS169/CT74LS169 4-bit binary up/down synchronous counter
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SJ/T 10068-1991
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Detail specification for electronic component. Semiconductor integrated circuit. Type CH2005 dual J-K negative-edge triggered flip-flop
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SJ/T 10069-1991
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Detail specification for electronic component. Semiconductor integrated circuit. Type CH2019 4-line to 10-line decoder (with BCD-in)
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SJ/T 10070-1991
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Detail specification for electronic component. Semiconductor integrated circuit. Type CH2021 4-bit up down synchronous binary counter (dual clock)
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SJ/T 10071-1991
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Detail Specification for electronic component. Semiconductor integrated circuit. Type CH2022 4-bit shift register
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SJ/T 10072-1991
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Detail specification for electronic component. Semiconductor integrated circuit-type CE8602 500MHz÷divider
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SJ/T 10073-1991
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Detail specification for electronic component. Semiconductor integrated circuits-CW7915 three terminal negative voltage regulator
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SJ/T 10074-1991
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Detail specification for electronic components. Semiconductor integrated circuit Quad line driver type CJ 75188
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SJ/T 10075-1991
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Detail specification for electronic components. Semiconductor integrated circuit CJ 75361 dual TTL-MOS driver
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SJ/T 10076-1991
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Detail specification for electronic components. Semiconductor integrated circuit Voltage comparator type CJ 710
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SJ/T 10077-1991
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Detail specification for electronic components. Semiconductor integrated circuit MOS-LED displaydriver type CJ 75491
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SJ/T 10078-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54107/CT74107dual J-K flip-flop with clear
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SJ/T 10079-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54182/CT74182 look-ahead carry generator
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SJ/T 10080-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT5442/CT7442 4-line-to-10-line decoder (BCD-to-decimal)
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SJ/T 10081-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54153/CT74153 dual 4-line to 1-line data selectors
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SJ/T 10082-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54195/CT74195 4-bit parallel-access shift register
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SJ/T 10083-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54161/CT74161 4-bit synchronous binary counter (direct clear)
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SJ/T 10084-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54H20/CT74H20 dual 4-input positive-NAND gate
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SJ/T 10085-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54H74/CT74H74 dual D-type positive edge-triggred flip-flop with preset and clear
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SJ/T 10086-1991
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Detail specification for electronic components. Semiconductor integrated circuit CT54H183/CT74H183 dual carry-save full adders
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SJ/T 10147-1991
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Detail specification for electronic components. Semiconductor integrated circuits--CT54LS195/CT74LS195 4-bit parallel-access shift register
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SJ/T 10152-1991
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Terms relating to main equipment for integrated circuit technologies
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SJ/T 10175-1991
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Detail specification of multilayer ceramic dual in-line package for semiconductor integrated circuits
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SJ/T 10176-1991
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Detail specification of metal rhomb package for semiconductor integrated circuits
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SJ/T 10252-1991
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Detail specification for electronic components--Semiconductor integrated circuits, Type CB7660 CMOS supply voltape converter
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SJ/T 10253-1991
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Detail specification for electronic components--Semiconductor integrated circuits, Type CC4046 CMOS digital phase-locked loop
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SJ/T 10254-1991
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Detail specification for electronic components--Semiconductor integrated circuits, Type CB301 CMOS analogue switch
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SJ/T 10255-1991
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Detail specification for electronic components. Semiconductor integrated circuit-CW1403 type precision energy-gap voltage reference
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SJ/T 10257-1991
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Detail specification for electronic component. Semiconductor integrated circuit-type CD3220CP dual preamplifier with ALC
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SJ/T 10258-1991
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Detail specification for electronic component. Semiconductor integrated circuit-type CD1405CP 5 LED level display driver
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SJ/T 10259-1991
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Detail specification for electronic component. Semiconductor integrated circuit-type CD 2822 CP dual audio power amplifiers
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SJ/T 10260-1991
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Detail specification for electronic component. Semiconductor integrated circuit-type CD 7232 CS dual audio power amplifiers
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SJ/T 10261-1991
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Detail specification for electronic component. Semiconductor integrated circuit-type CD 7343 GS phaselocked loop FM stereo decoder
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SJ/T 10262-1991
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Detail specification for electronic components--Semiconductor integrated circuits--Type CD7640GP FM/AM IF amplifier
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SJ/T 10263-1991
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Detail specification for electronic component. Semiconductor integrated circuit-type CD 7666 GP dual 5 LED level display drivers
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SJ/T 10264-1991
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Detail specification for electronic component. Semiconductor integrated circuit-type CD 3161 CS dual preamplifiers
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SJ/T 10265-1991
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Detail specification for electronic component. Semiconductor integrated circuit-type CD 7668 GP dual preamplifiers with ALC
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SJ/T 10266-1991
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Detail specification for electronic components. Semiconductor integrated circuit-CF714 type precision operational amplifier
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SJ/T 10267-1991
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Detail specification for electronic components. Semiconductor integrated circuit-CF715 type high-speed operational amplifier
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SJ/T 10268-1991
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Detail specification for electronic components. Semiconductor integrated circuit-CF253 type low power operational amplifier
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SJ/T 10269-1991
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Detail specification for electronic components. Semiconductor integrated circuit-CF 155/CF255/CF355 type JFET input operational amplifier
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SJ/T 10270-1991
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Detail specification for electronic components. Semiconductor integrated circuit-CF3080 type transconductance operational amplifier
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SJ/Z 9015.2-1987
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Semiconductor devices--Integrated circuits--Part 2: Digital integrated circuits
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SJ 20253-1993
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Verification regulation of model HP435B power meter
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SJ 21473.6-2021
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(Methods of measuring electromagnetic immunity of military integrated circuits - Part 6: Impulse immunity measurement - Synchronous transient injection method)
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SJ 21473.7-2021
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(Methods of measuring electromagnetic immunity of military integrated circuits - Part 7: Measurement of pulse immunity - non-synchronous transient injection method)
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SJ 21614-2021
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(Anti-oxidation control requirements for SMC/SMD devices used in military electronic equipment)
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SJ 21565.1-2020
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(Hydrogen control requirements for microwave multi-chip components - Part 1: General)
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SJ 21565.2-2020
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(Hydrogen control requirements for microwave multi-chip modules - Part 2: Test method for hydrogen release)
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SJ/T 10805-2018
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Semiconductor integrated circuits Measuring methods for voltage comparators
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SJ/T 11699-2018
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Guidelines for design for testability of IP cores
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SJ/T 11700-2018
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A format for representing intellectual property(IP) core quality information
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SJ/T 11703-2018
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Crosstalk test method for digital microelectronic device packages
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SJ/T 11704-2018
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Digital signal transmission test method for microelectronic packages
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SJ/T 11705-2018
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Ground and power supply impedance test method for microelectronics device packages
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SJ/T 11706-2018
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Semiconductor integrated circuits test methodof field programmable gate array
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SJ/T 11708-2018
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Test methods for motor power drive module
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SJ/T 2406-2018
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Designation of type for microwave circuits
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SJ/Z 21354-2018
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Design guidelines for assemblability of SiP products
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SJ/Z 21355-2018
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Design guidelines for hermetic package of SiP products
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SJ/Z 21356-2018
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Design guidelines for flip chip bonding process of SiP products
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SJ/Z 21357-2018
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Design guidelines for chip stacking process of SiP products
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SJ 20938A-2018
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(Testing method of microwave frequency converter)
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SJ 21473.1-2018
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(Measurement methods of electromagnetic immunity for military integrated circuits. Part 1: General conditions and definitions)
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SJ 21473.2-2018
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(Military integrated circuit electromagnetic immunity measurement method. Part 2: Radiation immunity measurement-TEM cell and broadband TEM cell method)
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SJ 21473.3-2018
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(Military integrated circuit electromagnetic immunity measurement method. Part 3: Conducted immunity measurement-large current injection (BCI) method)
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SJ 21473.4-2018
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(Military integrated circuit electromagnetic immunity measurement method. Part 4: Conducted immunity measurement-RF power direct injection method)
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SJ 21473.5-2018
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(Measurement method of electromagnetic immunity for military integrated circuits. Part 5: Conducted immunity measurement-workbench Faraday cage)
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SJ 21147.1-2016
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(Military integrated circuits - Electromagnetic emission measurement methods - Part 1: General conditions and definitions)
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SJ 21147.2-2016
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(Military integrated circuits - Electromagnetic emission measurement methods - Part 2: Radiation emission measurements - TEM cells and broadband TEM chamber)
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SJ 21147.3-2016
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(Methods of measurement for electromagnetic emission of military integrated circuits - Part 3: Radiation emission measurements - Surface scanning)
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SJ 21147.4-2016
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(Methods of measurement for electromagnetic emission of military integrated circuits - Part 4: Conducted emission measurements - 1Ω/150Ω direct coupling method)
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SJ 21147.5-2016
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(Methods of measurement for electromagnetic emission of military integrated circuits - Part 5: Conducted emission measurements - Workbench Faraday cage method)
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SJ 20954-2006
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Integrated circuits latch-up test
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SJ 20961-2006
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General principles of measuring methods of A/D and D/A converters for integrated circuits
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SJ 20938-2005
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Microwave circuits. Measuring methods for frequency converters
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SJ 20802-2001
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Visual inspection criteria for integrated circuits metal packages
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SJ 20668-1998
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General specification for microcircuit modules
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SJ 20645-1997
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Microwave circuits Measuring methods for amplifiers
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SJ 20610-1996
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Microwave circuits Measuring methods for microwave switches
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SJ 20611-1996
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Microwave circuits Measuring methods for solid noise sources
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SJ 20612-1996
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Microwave circuits Letter symbols for characteristics
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SJ/T 10805-1996
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Semiconductor integrated circuits used as interface circuits--General principles of measuring methods of voltage comparators
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SJ 20077-1992
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Guide of thermal design for microcircuit application
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SJ 2559-1984
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Specification for S-100 bus
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SJ 21551-2020
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(General specification for high-power semiconductor laser chips)
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SJ 50033/197-2018
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(Semiconductor optoelectronic device GH3202Z type optocoupler detailed specification)
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SJ 50033/198-2018
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(Semiconductor optoelectronic device GH3201Z-2 optocoupler detailed specification)
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SJ 50033/199-2018
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(Semiconductor optoelectronic device GH4420Z type optocoupler detailed specification)
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SJ 58119/1-2018
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(Semiconductor optoelectronic device GD3561T indium gallium arsenide photodiode detailed specification)
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SJ 58119/2-2018
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Semiconductor optoelectronic devices Detail specification for InGaAs photodiode of GD3562T
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SJ 58119/3-2018
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Semiconductor optoelectronic devices Detail specification for photodetector of GT322D-60-SM-FCIAPC
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SJ/T 2214-2015
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Measuring methods for semiconductor photodiode and phototransistor
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SJ/T 2216-2015
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Technical specification for photodiode of silicon
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SJ/T 2354-2015
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Measuring methods for photodiodes of PIN、APD
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