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SJ 21147.4-2016 English PDF

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SJ 21147.4-2016: (Methods of measurement for electromagnetic emission of military integrated circuits - Part 4: Conducted emission measurements - 1Ω/150Ω direct coupling method)
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SJ 21147.4-2016English499 Add to Cart 4 days [Need to translate] (Methods of measurement for electromagnetic emission of military integrated circuits - Part 4: Conducted emission measurements - 1Ω/150Ω direct coupling method) Valid SJ 21147.4-2016

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Standard similar to SJ 21147.4-2016

SAMR 76   SJ/T 11460.6.4   GB/T 35010.6   SJ 21147.2   SJ 21147.3   SJ 21147.1   

Basic data

Standard ID SJ 21147.4-2016 (SJ21147.4-2016)
Description (Translated English) (Methods of measurement for electromagnetic emission of military integrated circuits - Part 4: Conducted emission measurements - 1��/150�� direct coupling method)
Sector / Industry Electronics Industry Standard
Classification of Chinese Standard L55
Word Count Estimation 20,275
Issuing agency(ies) Ministry of Industry and Information Technology


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