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SJ/T 2214-2015 English PDF

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SJ/T 2214-2015: Measuring methods for semiconductor photodiode and phototransistor
Status: Valid

SJ/T 2214: Evolution and historical versions

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
SJ/T 2214-2015English579 Add to Cart 5 days [Need to translate] Measuring methods for semiconductor photodiode and phototransistor Valid SJ/T 2214-2015
SJ 2214.1-1982English199 Add to Cart 2 days [Need to translate] General procedures of measurement for semiconductor photodiodes and phototransistors Obsolete SJ 2214.1-1982

PDF similar to SJ/T 2214-2015


Standard similar to SJ/T 2214-2015

SAMR 76   SJ/T 11460.6.4   GB/T 35010.6   SJ/T 2354   SJ/T 2216   SJ/T 2217   

Basic data

Standard ID SJ/T 2214-2015 (SJ/T2214-2015)
Description (Translated English) Measuring methods for semiconductor photodiode and phototransistor
Sector / Industry Electronics Industry Standard (Recommended)
Classification of Chinese Standard L54
Classification of International Standard 31.08
Word Count Estimation 25,221
Date of Issue 2015-04-30
Date of Implementation 2015-10-01
Older Standard (superseded by this standard) SJ 2214.1-1982; SJ 2214.2-1982; SJ 2214.3-1982; SJ 2214.4-1982; SJ 2214.5-1982; SJ 2214.6-1982; SJ 2214.7-1982; SJ 2214.8-1982; SJ 2214.9-1982; SJ 2214.10-1982
Quoted Standard GB/T 2421.1-2008; GB/T 11499-2001
Regulation (derived from) Ministry of Industry and Information Technology Announcement (2015 No. 28)
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This Standard specifies the test method for a semiconductor photodiode and a phototransistor (hereinafter referred to as "devices") of optical parameters. This Standard applies to testing semiconductor photodiode and phototransistor photoelectric parameters. This Standard is not applicable PIN, avalanche photodiode testing.

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