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Std ID |
Description (Standard Title) |
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GB/T 37031-2018
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Semiconductor lighting terminology
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GB/T 18310.48-2007
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-48: Tests -- Temperature-humidity cycling
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GB/T 18311.16-2007
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-16: Examinations and measurements -- End face radius of spherically polished ferrules
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GB/T 18311.20-2007
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-20: Examinations and measurements -- Directivity of fibre optic branching devices
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GB/T 18311.26-2007
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-26: Examinations and measurements -- Measurement of the angular misalignment between fibre and ferrule axes
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GB/T 18311.28-2007
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-28: Examinations and measurements -- Transient loss
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GB/T 18311.30-2007
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-30: Examinations and measurements -- Polish angle and fibre position on single ferrule multi-fibre connectors
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GB/T 18311.31-2007
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-31: Examinations and measurements -- Coupled power ratio measurement for fibre optic sources
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GB/T 21022.1-2007
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Fibre optic connector interfaces -- Part 1: General and guidance
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GB/T 15651.2-2003
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Discrete semiconductor devices and integrated circuits -- Part 5-2: Optoelectronic devices Essential ratings and characteristics
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GB/T 15651.3-2003
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Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic devices Measuring methods
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GB/T 18310.10-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-10: Testing anti-extrusion
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GB/T 18310.11-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-11: Tests axial compression
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GB/T 18310.14-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-14: Tests -- Maximum input power
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GB/T 18310.17-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-17: Tests -- Cold
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GB/T 18310.22-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-22: Tests -- Change of temperature
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GB/T 18310.26-2003
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Fibre optic interconnecting devices and passive components Basic test and measurement procedures -- Part 2-26: Tests -- Salt mist
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GB/T 18310.42-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-42: Test -- Static side load for connectors
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GB/T 18310.45-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-45: Tests -- Durability test by water immersion
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GB/T 18310.8-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-8: Testing collision
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GB/T 18310.9-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-9: Tests -- Shock
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GB/T 18311.1-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-1: Examinations and measurements -- Visual examination
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GB/T 18311.34-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-34: Examinations and measurements -- Attenuation of random mated connectors
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GB/T 18311.40-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-40: Examinations and measurements -- Extinction ratio of a polarization maintaining (pm) fibre pigtailed connector
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GB/T 18311.4-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-4: Examinations and measurements -- Attenuation
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GB/T 18311.5-2003
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-5: Examinations and measurements -- Wavelength dependence of attenuation
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GB/T 18310.1-2002
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-1: Test -- Vibration (sinusoidal)
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GB/T 18310.12-2002
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-12: Tests -- Impact
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GB/T 18310.19-2002
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-19: Tests -- Damp heat (steady state)
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GB/T 18310.21-2002
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-21: Tests -- Composite temperature-humidity cyclic test
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GB/T 18310.5-2002
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-5: Tests -- Torsion/twist
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GB/T 18310.7-2002
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-7: Tests -- moment
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GB/T 18309.1-2001
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 1: General and guidance
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GB/T 18310.18-2001
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-18: Tests -- Dry heat -- High temperature endurance
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GB/T 18310.2-2001
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-2: Tests -- Mating durability
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GB/T 18310.3-2001
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-3: Tests -- Static shear load
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GB/T 18310.39-2001
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-39: Tests -- Susceptibility to external magnetic fields
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GB/T 18310.4-2001
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-4: Tests -- Fibre/cable retention
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GB/T 18310.6-2001
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 2-6: Tests -- Tensile strength of coupling mechanism
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GB/T 18311.2-2001
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Fibre optic interconnecting devices and passive component -- Basic test and measurement procedures -- Part 3-2: Examinations and measurements -- Polarization dependence of a single-mode fibre optic device
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GB/T 18311.3-2001
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-3: Examinations and measurements -- Monitoring change in attenuation and in return loss (multiple paths)
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GB/T 18311.6-2001
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Fibre optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-6: Examinations and measurements -- Return loss
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GB/T 12565-1990
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Semiconductor devices. Sectional specification for optoelectronic devices
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GB/T 4654-1984
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The general technical specifications on silicon carbide and zircon ceramic infrared heater
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GB/T 4799-1984
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The denominating method of type for gas lasers
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GB/T 42209-2022
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Point to Point(P2P) signal interface for liquid crystal display panels - Transport protocols
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GB/T 42210-2022
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Point to Point (P2P) signal interface for liquid crystal display panels - Electrical parameters
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GB/T 38001.11-2020
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Flexible display devices - Part 1-1: Terminology and letter symbols
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GB/T 38001.62-2020
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Flexible display devices - Part 6-2: Environmental testing methods
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GB/T 18910.62-2019
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Liquid crystal display devices -- Part 6-2: Measuring methods for liquid crystal display modules -- Reflective type
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GB/T 38001.61-2019
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Flexible display devices -- Part 6-1: Mechanical stress test methods
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GB/T 22181.24-2016
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Plasma display panels -- Part 2-4: Methods for measuring the characteristics of devices for digital television sets
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GB/T 22181.5-2015
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Plasma display panels -- Part 5: Generic specification
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GB/T 22181.6-2015
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Plasma display panels -- Part 6: Blank detail specification for plasma display panels used for digital TV sets
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GB/T 20871.61-2013
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Organic light emitting diode (OLED) displays -- Part 6-1: Measuring methods of optical and electro-optical parameters
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GB/T 18910.1-2012
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Liquid crystal display devices -- Part 1: Generic specification
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GB/T 18910.61-2012
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Liquid crystal display devices -- Part 6-1: Measuring methods for liquid crystal display devices -- Photoelectric parameter
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GB/T 22181.23-2012
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Plasma display panels -- Part 2-3: Measuring methods for module quality
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GB/T 18910.3-2008
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Liquid crystal and solid-state display devices -- Part 3: Sectional specification for liquid crystal display (LCD) cells
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GB/T 18910.5-2008
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Liquid crystal and solid-state display devices -- Part 5: Environmental, endurance and mechanical test methods
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GB/T 22181.1-2008
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Plasma display panels -- Part 1: Terminology and letter symbols
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GB/T 22181.21-2008
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Plasma display panels -- Part 2-1: Measuring Method -- Optical
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GB/T 22181.22-2008
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Plasma display panels -- Part 2-2: Measuring Methods -- Optoelectrical
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GB/T 18910.21-2007
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Liquid crystal and solid-state display devices -- Part 2-1: Passive matrix monochrome LCD modules -- Blank detail specification
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GB/T 18910.4-2007
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Liquid crystal and solid-state display devices -- Part 4: Liquid crystal display modules and cells -- Essential ratings and characteristics
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GB/T 20871.2-2007
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Organic light emitting diode display -- Part 2: Terminology and letter symbols
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GB/T 18680-2002
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The transparent conductive glass with indium-tin oxide films used in liquid crystal display
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GB/T 4619-1996
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Measuring methods for liquid crystal display devices
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GB/T 15655-1995
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Sectional specification for super-twisted nematic liquid crystal display devices
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GB/T 15656-1995
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Blank detail specification of super-twisted nematic liquid crystal display devices
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GB/T 15167-1994
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General specification for light source of semiconductor lasers
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GB/T 14116-1993
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Photomentric and colorimetric methods of methods of measurement of color liquid crystal displays
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GB/T 14117-1993
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Blank detail specification of color liquid crystal displays
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GB/T 13811-1992
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Electrotechnical terminology Superconductivity
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GB/T 12848-1991
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Generic specification of twisted nematic liquid crystal display devices
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GB/T 12849-1991
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Blank detail specification of twisted nematic liquid crystal displays for watches
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GB/T 12850-1991
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Blank detail specification of twisted nematic liquid crystal displays for calculators
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GB/T 12851-1991
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Blank detail specification of twisted nematic liquid crystal displays for instruments
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GB/T 36361-2018
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Accelerated life test method for LED
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GB/T 36362-2018
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Point estimation and interval estimation for reliability testing of LED applied products (exponential distribution)
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GB/T 36613-2018
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Probe test method for light emitting diode chips
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GB/T 16468-1996
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Series programmes for static induction transistors
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GB/T 15449-1995
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Blank detail-specification for field-effect transistors for case-rated swatching application
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GB/T 15450-1995
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Blank detail specification for silicon dual-qute field-effect transistors
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GB/T 6351-1998
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Semiconductor devices. Discrete devices. Part 2: Rectifier diodes Section One. Blank detail specification for rectifier diodes(including avalanche recti-fier diodes)1, ambient and case-rated, up to 100A
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GB/T 6352-1998
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Semiconductor devices Discrete devices. Part 6: Thyristors Section One. Blank detail specification for reverse blocking triode thyristors, ambient or case-rated, up to 100A
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GB/T 6590-1998
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Semiconductor devices Discrete devices. Part 6: Thyristors Section Two. Blank detail specification for bidirectional triode thyristors(triacs), ambient or case-rated, up to 100A
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GB/T 16894-1997
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Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100A
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GB/T 4023-1997
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Semiconductor devices Discrete devices and integrated circuits Part 2: Rectifier diodes
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GB/T 11595-1989
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Interface between data terminal equipment (DTE) and data circuit-terminating equipment (DCE) for terminals operating in the packet mode and connected to public data networks by dedicated circuit
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GB/T 11598-1989
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Terminal and transit call control procedures and data transfer system on international circuits between packet-switched data networks
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GB/T 9436-1988
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Letter symbols of parameter for liquid crystal display devices
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GB/T 6351-1986
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Blank detail specification for rectifier diodes (including avalanche rectifier diodes) ambient and case-rated, up to 100A
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GB/T 6352-1986
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Blank detail specification for reverse blocking triode thyristors ambient and case-rated, up to 100A
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GB/T 6590-1986
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Blank detail specification for bi-directional triode thyristors (triacs) ambient and case-rated, up to 100A
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GB/T 29332-2012
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Semiconductor devices -- Discrete devices -- Part 9: Insulated-gate bipolar transistors (IGBT)
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GB/T 6217-1998
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Semiconductor Devices. Discrete devices. Part 7: Bipolar transistors. Section One. Blank detail specification for ambient-rated bipolar transistors for low and high frequency amplification
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GB/T 6219-1998
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Semiconductor devices Discrete devices. Part 8: Field-effect transistors. Section One. Blank detail specification for singe-gate field-effect transistors up to 5W and 1GHz
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GB/T 7576-1998
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Semiconductor devices. Discrete devices. Part 7: Bipolar transistors. Section Four. Blank detail specification for case-rated bipolar transistors for high-frequency amplification
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GB/T 6218-1996
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Blank detail specification for bipolar transistors for switching applications
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