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Database: 189759 (26 Oct 2025)
SJ 20844-2002 English PDF
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SJ 20844-2002
: Test method for microzone homogeneity of semi-insulating monocrystal gallium arsenide
Status: Obsolete
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Standard Title (Description)
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SJ 20844-2002
English
519
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Test method for microzone homogeneity of semi-insulating monocrystal gallium arsenide
Obsolete
SJ 20844-2002
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Basic data
Standard ID
SJ 20844-2002 (SJ20844-2002)
Description (Translated English)
Test method for microzone homogeneity of semi-insulating monocrystal gallium arsenide
Sector / Industry
Electronics Industry Standard
Classification of Chinese Standard
H83;L90
Word Count Estimation
13,182
Date of Issue
2002-10-30
Date of Implementation
2003-03-01
Summary
This standard specifies the semi-insulating GaAs wafer resistivity, carbon concentration, EL2 concentration and uniformity of micro- PL spectra measurement method. This standard applies to semi-insulating GaAs wafer resistivity, carbon concentration, EL2 concentration and micro- PL spectra Determination of uniformity.
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