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Database: 189759 (19 Oct 2025)
GB 3444-1982 English PDF
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Standard Title (Description)
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GB 3444-1982
English
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General principles of measuring methods of bipolar random access memory for semiconductor integrated circuits
Obsolete
GB 3444-1982
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Basic data
Standard ID
GB 3444-1982 (GB3444-1982)
Description (Translated English)
General principles of measuring methods of bipolar random access memory for semiconductor integrated circuits
Sector / Industry
National Standard
Classification of Chinese Standard
L56
Word Count Estimation
33,324
Date of Issue
12/31/1982
Date of Implementation
10/1/1983
Adopted Standard
IEC 147-2, NEQ