| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB 3444-1982 | English | RFQ |
ASK
|
Days<=9
|
General principles of measuring methods of bipolar random access memory for semiconductor integrated circuits
|
GB 3444-1982
| Obsolete |
GB 3444-1982
|