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Database: 189759 (26 Oct 2025)
SJ 20842-2002 English PDF
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SJ 20842-2002
: Test method for Ga/As ratio of surface of gallium arsenide
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SJ 20842-2002
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Test method for Ga/As ratio of surface of gallium arsenide
Valid
SJ 20842-2002
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Basic data
Standard ID
SJ 20842-2002 (SJ20842-2002)
Description (Translated English)
Test method for Ga/As ratio of surface of gallium arsenide
Sector / Industry
Electronics Industry Standard
Classification of Chinese Standard
H83;L90
Word Count Estimation
5,536
Date of Issue
2002-10-30
Date of Implementation
2003-03-01
Summary
This standard specifies the ratio of gallium arsenide GaAs surface X-ray photoelectron spectroscopy test methods. This standard applies to GaAs devices for monitoring various surface treatment during the manufacturing process of the gallium arsenide GaAs wafer surface than the impact, but also suitable for wafer processing in a variety of surface treatment.
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