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SJ 20233-1993 English PDF

Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusPDF
SJ 20233-1993EnglishRFQ ASK 6 days [Need to translate] Verification regulation of model IMPACT-II semiconductor discrete device test sysytem Obsolete SJ 20233-1993

PDF similar to SJ 20233-1993


Standard similar to SJ 20233-1993

JJF 1234   JJF 1396   GB/T 20247   

Basic data

Standard ID SJ 20233-1993 (SJ20233-1993)
Description (Translated English) Verification regulation of model IMPACT-II semiconductor discrete device test sysytem
Sector / Industry Electronics Industry Standard
Classification of Chinese Standard A56;L86
Word Count Estimation 29,272

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