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Std ID |
Description (Standard Title) |
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SJ/T 1519-1979
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(KW4 Micro Switch)
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SJ/T 1520-1979
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(KW5 Micro Switch)
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SJ/T 1563-1980
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Coaxial radio-frequency cables with solid polytrafluoroethylene dielectric
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SJ/T 1563-2014
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Coaxial radio-frequency cables with solid polytetrafluoroethylene (PTFE) insulation
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SJ/T 16000-2016
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(A Guide to Social Responsibility in the Electronic Information Industry)
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SJ/T 1635-1996
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Basic identification colours and code indications for electronics industrial pipelines
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SJ/T 1670-2001
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Terms and definitions related to electronic power supplies
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SJ/T 1752-1981
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(Thumbwheel switches total technical conditions)
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SJ/T 1753-1981
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(KL1 type thumbwheel switch)
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SJ/T 1754-1981
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(KL3 type thumbwheel switch)
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SJ/T 1766-1997
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Soft ferrite material classification
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SJ/T 1766-2013
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Soft ferrite material classification
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SJ/T 1826-2016
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(Semiconductor discrete device 3DK100 silicon NPN low power switching transistor detailed specification)
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SJ/T 1830-2016
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(Semiconductor discrete device 3DK101 silicon NPN low power switching transistor detailed specification)
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SJ/T 1831-2016
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(Semiconductor discrete device 3DK28 silicon NPN low power switching transistor detailed specification)
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SJ/T 1832-2016
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(Semiconductor discrete device 3DK102 silicon NPN low power switching transistor detailed specification)
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SJ/T 1833-2016
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(Semiconductor discrete device 3DK103 silicon NPN low power switching transistor detailed specification)
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SJ/T 1834-2016
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(Semiconductor discrete device 3DK104 silicon NPN low power switching transistor detailed specification)
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SJ/T 1838-2016
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(Semiconductor discrete device 3DK29 silicon NPN low power switching transistor detailed specification)
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SJ/T 1839-2016
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(Semiconductor discrete device 3DK108 silicon NPN low power switching transistor detailed specification)
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SJ/T 198-1980
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General specification for counting tubes
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SJ/T 198-2001
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General specification for counter tubes
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SJ/T 207.1-1999
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Management system for design documents. Part 1: Classification and compositon of design documents
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SJ/T 207.2-1999
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Management system for design documents. Part 2: Formats of design documents
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SJ/T 207.3-1999
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Management system for design documents. Part 3: Preparation od design documents in the texture content and tables form
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SJ/T 207.4-1999
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Management system for design documents. Part 4: Numbering for design documents
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SJ/T 207.5-1999
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Management system for design documents. Part 5: Revisions of design documents
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SJ/T 207.6-2001
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Management system for design documents. Part 6: Item designation
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SJ/T 207.7-2001
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Management system for design documents. Part 7: Preparation of electrical diagrams
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SJ/T 207.8-2001
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Management system for design documents. Part 8: Preparation of pictorial form
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SJ/T 2085-2016
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Polyvinyl chloride insulated flexible wires and cables for interal wiring of equipment
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SJ/T 2086-2016
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Polyvinyl chloride insulated wires and cables for internal wiring of equipment
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SJ/T 2089-1982
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Type designation for electronic measuring instruments
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SJ/T 2089-2001
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Type designation for electronic measuring instruments
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SJ/T 2089-2015
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Type designation for electronic measuring instruments
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SJ/T 211.1-1996
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Design documents for special equipment for electronic industry. Part 1: Completeness of design documents
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SJ/T 211.2-1996
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Design documents for special equipment for electronic industry. Part 2: Titles blocks, addition list and item list of drawing
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SJ/T 211.3-1996
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Design documents for special equipment for electronic industry. Part 3: Format of design documents
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SJ/T 211.4-1996
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Design documents for special equipment for electronic industry. Part 4: Drafting of design documents
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SJ/T 211.5-1997
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Design documents for special equipment for electronic industry. Part 5: Numbering methods
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SJ/T 211.6-1999
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Design documents for special equipment for electronic industry. Part 6: Revision of design documents
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SJ/T 2196-1982
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Test method for electrical characteristics of terrestrial silicon solar cells
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SJ/T 2197-1982
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Calibration for terrestrial standard silicon solar cells
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SJ/T 2214-2015
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Measuring methods for semiconductor photodiode and phototransistor
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SJ/T 2215-2015
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Measuring methods for semiconductor photocouplers
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SJ/T 2216-2015
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Technical specification for photodiode of silicon
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SJ/T 2217-1982
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Silicon phototransistors
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SJ/T 2217-2014
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Technical specification for phototransistor of silicon
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SJ/T 2307.1-1997
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Detial specification for electronic components Surge suppression varistors Type MYL1 zinc oxide varistors for use in lightning arrester Assessment level E
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SJ/T 2318-2016
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AI-Ni-Co permanent magnets for speaker
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SJ/T 2354-2015
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Measuring methods for photodiodes of PIN、APD
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SJ/T 2421-1996
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Tinned copper clad wire for electronic components
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SJ/T 2428-1983
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Clibration for astronautic standard monocrystal silicon solar cells
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SJ/T 2429-1983
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Test method for electrical characteristics of astronautic monocrystal silicon solar cells
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SJ/T 2573-1985
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(Chinese Industry Standard)
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SJ/T 2658.10-2015
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Measuring method for semiconductor infrared-emitting diode. Part 10: Modulation bandwidth
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SJ/T 2658.11-2015
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Measuring method for semiconductor infrared-emitting diode. Part 11: Response time
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SJ/T 2658.1-2015
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Measuring method for semiconductor infrared-emitting diode. Part 1: General
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SJ/T 2658.12-2015
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Measuring method for semiconductor infrared-emitting diode. Part 12: Peak-emission wavelength and spectral radiant bandwidth
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SJ/T 2658.13-2015
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Measuring method for semiconductor infrared-emitting diode. Part 13: Temperature coefficient for radiant power
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SJ/T 2658.14-2016
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Measuring method for semiconductor infrared-emitting diode - Part 14: Junction temperature
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SJ/T 2658.15-2016
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Measuring method for semiconductor infrared-emitting diode - Part 15: Thermal resistance
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SJ/T 2658.16-2016
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Measuring method for semiconductor infrared-emitting diode - Part 16: Photo-electric conversion efficiency
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SJ/T 2658.2-2015
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Measuring method for semiconductor infrared-emitting diode. Part 2: Forward voltage
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SJ/T 2658.3-2015
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Measuring method for semiconductor infrared-emitting diode - Part 3: Reverse voltage and reverse current
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SJ/T 2658.4-2015
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Measuring method for semiconductor infrared-emitting diode. Part 4: Total capacitance
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SJ/T 2658.5-2015
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Measuring method for semiconductor infiared-emitting diode. Part 5: Series connection resistance
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SJ/T 2658.6-2015
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Measuring method for semiconductor infrared-emitting diode. Part 6: Radiant power
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SJ/T 2658.7-2015
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Measuring method for semiconductor infrared-emitting diode. Part 7: Radiant flux
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SJ/T 2658.8-2015
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Measuring method for semiconductor infrared-emitting diode. Part 8: Radiant intensity
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SJ/T 2658.9-2015
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Measuring method for semiconductor infiared-emitting diode. Part 9: Spatial distribution of radiant intensity and half-intensity angle
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SJ/T 2709-2016
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Methods of measurement for temperature of printed board assemblies
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SJ/T 2735-1986
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Drawing rules for electronic products
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SJ/T 2743-1987
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Dimensions for magnetic oxide cores intended for use in power supplies (EC-cores)
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SJ/T 2743-2013
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Test method for electrical characteristics of astronautic monocrystal silicon solar cells
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SJ/T 2744-2002
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Dimensions of spuare cores (RM cores) made of magnetic oxides and associated parts
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SJ/T 2749-2016
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(The semiconductor laser diode test)
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SJ/T 2885-2003
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Finxed inductors for use in electronic equipment. Part1: General specification
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SJ/T 2932-2016
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(Flame-retardant PVC insulated wire and cable installation)
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SJ/T 2936-2013
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General specification of medium power meter
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SJ/T 2938-2015
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Technical requirements and test methods for signal generator of television video
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SJ/T 2960.1-2013
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Piezoelectric ceramic traps. A specification in the quality assessment system for electronic components. Part 1: Generic specification. Qualification approval
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SJ/T 2960.2.1-2013
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Piezoelectric ceramic traps-A specification in the quality assessment system for electronic components. Part 2-1: Blank detail specification-Assessment level E
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SJ/T 2960.2-2013
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Piezoelectric ceramic traps-A specification in the quality assessment system for electronic components. Part 2: Sectional specification-Qualification approval
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SJ/T 2964.1-2013
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Piezoelectric ceramic discriminators. A specification in the quality assessment system for electronic components. Part 1: Generic specification. Qualification approval
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SJ/T 2964.2.1-2013
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Piezoelectric ceramic discriminators. A specification in the quality assessment system for electronic components Part 2.1: Blank detail specification. Assessment level E
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SJ/T 2964.2-2013
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Piezoelectric ceramic discriminators. A specification in the quality assessment system for electronic components. Part 2: Sectional specification. Qualification approval
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SJ/T 30003-1993
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Code for construction and acceptance of electronic computer room
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SJ/T 31001-1994
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General rules for equipment readiness
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SJ/T 31001-2016
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(Equipment availability requirements and guidelines for the preparation method of assessment for)
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SJ/T 31002-1994
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General rules for equipment maintenance
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SJ/T 31002-2016
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(General business equipment maintenance)
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SJ/T 31003-1994
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Requirements of readiness and methods of inspection and assessment for turret, automatic and semiautomatic lathes
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SJ/T 31004-1994
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Requirements of readiness and methods of inspection and assessment for engine lathes
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SJ/T 31005-1994
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Requirements of readiness and methods of inspection and assessment for drilling machines
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SJ/T 31006-1994
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Requirements of readiness and methods of inspection and assessment for horizontal boring machines
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SJ/T 31007-1994
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Requirements of readiness and methods of inspection and assessment for knee-and-column millers and universal tool millers
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SJ/T 31008-1994
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Requirements of readiness and methods of inspection and assessment for engraving millers
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SJ/T 31009-1994
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Requirements of readiness and methods of inspection and assessment for planing machines, slotting machines and broaching machines
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SJ/T 31010-1994
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Requirements of readiness and methods of inspection and assessment for grinding machines
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