SJ/T 2354-2015 PDF English
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SJ/T 2354: Historical versions
| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ/T 2354-2015 | English | 739 | Add to Cart | 6 days [Need to translate] | Measuring methods for photodiodes of PIN、APD |
| SJ 2354.1-1983 | English | 199 | Add to Cart | 2 days [Need to translate] | General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes |
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Basic data
| Standard ID | SJ/T 2354-2015 (SJ/T2354-2015) |
| Description (Translated English) | Measuring methods for photodiodes of PIN��APD |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | L54 |
| Classification of International Standard | 31.18 |
| Word Count Estimation | 32,376 |
| Date of Issue | 2015-04-30 |
| Date of Implementation | 2015-10-01 |
| Older Standard (superseded by this standard) | SJ/T 2354.1-1983; 2354.2-1983; 2354.3-1983; 2354.4-1983; 2354.5-1983; 2354.6-1983; 2354.7-1983; 2354.8-1983; 2354.9-1983; 2354.10-1983; 2354.11-1983; 2354.12-1983; 2354.13-1983; 2354.14-1983 |
| Quoted Standard | GB/T 2421.1-2008; GB/T 11499-2001; GB/T 15651 |
| Regulation (derived from) | Ministry of Industry and Information Technology Announcement (2015 No. 28) |
| Issuing agency(ies) | Ministry of Industry and Information Technology |
| Summary | This Standard specifies the test methods PIN, avalanche photodiode (hereinafter referred to as "diode") photovoltaic parameters. |