SJ/T 2658.10-2015 PDF English
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SJ/T 2658.10: Historical versions
| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ/T 2658.10-2015 | English | 149 | Add to Cart | 3 days [Need to translate] | Measuring method for semiconductor infrared-emitting diode. Part 10: Modulation bandwidth |
| SJ 2658.10-1986 | English | 199 | Add to Cart | 3 days [Need to translate] | Methods of measurement for semiconductor infrared diodes Methods of measurement for modulated wideband |
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Basic data
| Standard ID | SJ/T 2658.10-2015 (SJ/T2658.10-2015) |
| Description (Translated English) | Measuring method for semiconductor infrared-emitting diode. Part 10: Modulation bandwidth |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | L53 |
| Classification of International Standard | 31.08 |
| Word Count Estimation | 5,598 |
| Date of Issue | 2015-10-10 |
| Date of Implementation | 2016-04-01 |
| Older Standard (superseded by this standard) | SJ/T 2658.10-1986 |
| Quoted Standard | GB/T 2900.65-2004; SJ/T 2658.1 |
| Regulation (derived from) | PRC MIIT Announcement 2015 No.63 |
| Issuing agency(ies) | Ministry of Industry and Information Technology |
| Summary | This standard specifies the measuring principle, measurement procedures and conditions for the modulation bandwidth of a semiconductor infrared emitter diode. This standard applies to semiconductor infrared emitting diodes. |