SJ/T 2658.7-2015 English PDF

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SJ/T 2658.7-2015: Measuring method for semiconductor infrared-emitting diode. Part 7: Radiant flux
Status: Valid

SJ/T 2658.7: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
SJ/T 2658.7-2015	149	Add to Cart	3 days	Measuring method for semiconductor infrared-emitting diode. Part 7: Radiant flux	Valid
SJ 2658.7-1986	199	Add to Cart	3 days	Methods of measurement for semiconductor infrared diodes Methods of measurement for radiant flux	Obsolete

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SAMR 75   SJ/T 11460.6.4   SAMR 76   SJ/T 2658.15   SJ/T 2658.16   SJ/T 2658.14   

Basic data

Standard ID: SJ/T 2658.7-2015 (SJ/T2658.7-2015)
Description (Translated English): Measuring method for semiconductor infrared-emitting diode. Part 7: Radiant flux
Sector / Industry: Electronics Industry Standard (Recommended)
Classification of Chinese Standard: L53
Classification of International Standard: 31.08
Word Count Estimation: 4,466
Date of Issue: 2015-10-10
Date of Implementation: 2016-04-01
Older Standard (superseded by this standard): SJ/T 2658.7-1986
Quoted Standard: SJ/T 2658.1
Regulation (derived from): PRC MIIT Announcement 2015 No.63
Issuing agency(ies): Ministry of Industry and Information Technology
Summary: This standard specifies the measurement principle, measurement procedure and specified conditions for the radiation flux of semiconductor infrared emitting diodes (hereinafter referred to as devices). This standard applies to semiconductor infrared emitting diodes.

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