SJ/T 2214-2015 English PDF

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SJ/T 2214-2015: Measuring methods for semiconductor photodiode and phototransistor
Status: Valid

SJ/T 2214: Historical versions

Standard ID	USD	BUY PDF	Lead-Days	Standard Title (Description)	Status
SJ/T 2214-2015	579	Add to Cart	5 days	Measuring methods for semiconductor photodiode and phototransistor	Valid
SJ 2214.1-1982	199	Add to Cart	2 days	General procedures of measurement for semiconductor photodiodes and phototransistors	Obsolete

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Basic data

Standard ID: SJ/T 2214-2015 (SJ/T2214-2015)
Description (Translated English): Measuring methods for semiconductor photodiode and phototransistor
Sector / Industry: Electronics Industry Standard (Recommended)
Classification of Chinese Standard: L54
Classification of International Standard: 31.08
Word Count Estimation: 25,221
Date of Issue: 2015-04-30
Date of Implementation: 2015-10-01
Older Standard (superseded by this standard): SJ 2214.1-1982; SJ 2214.2-1982; SJ 2214.3-1982; SJ 2214.4-1982; SJ 2214.5-1982; SJ 2214.6-1982; SJ 2214.7-1982; SJ 2214.8-1982; SJ 2214.9-1982; SJ 2214.10-1982
Quoted Standard: GB/T 2421.1-2008; GB/T 11499-2001
Regulation (derived from): Ministry of Industry and Information Technology Announcement (2015 No. 28)
Issuing agency(ies): Ministry of Industry and Information Technology
Summary: This Standard specifies the test method for a semiconductor photodiode and a phototransistor (hereinafter referred to as "devices") of optical parameters. This Standard applies to testing semiconductor photodiode and phototransistor photoelectric parameters. This Standard is not applicable PIN, avalanche photodiode testing.

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