| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| SJ 20636-1997 | English | 359 |
Add to Cart
|
Days<=3
|
Test method for oxygen and carbon contents of large diameter thin silicon wafer in microzone for use in IC
|
SJ 20636-1997
| |
SJ 20636-1997
|