| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 39145-2020 | English | 189 |
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Days<=3
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Test method for the content of surface metal elements on silicon wafers - Inductively coupled plasma mass spectrometry
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GB/T 39145-2020
| Valid |
GB/T 39145-2020
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