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SJ/T 11394-2009 PDF English

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SJ/T 11394-2009: Measure methods of semiconductor light emitting diodes
Status: Valid
Std IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)Status
SJ/T 11394-2009English789 Add to Cart 6 days [Need to translate] Measure methods of semiconductor light emitting diodes Valid

Standard similar to SJ/T 11394-2009

SJ/T 11141 | SJ/T 11281 | GB/T 18910.2 | SJ/T 11398 | SJ/T 11399 | SJ/T 11393 |

Basic data

Standard ID SJ/T 11394-2009 (SJ/T11394-2009)
Description (Translated English) Measure methods of semiconductor light emitting diodes
Sector / Industry Electronics Industry Standard (Recommended)
Classification of Chinese Standard L45
Classification of International Standard 31.260
Word Count Estimation 32,382
Date of Issue 2009-11-17
Date of Implementation 2010-01-01
Older Standard (superseded by this standard) SJ/T 2355.1-1983; SJ/T 2355.2-1983; SJ/T 2355.3-1983; SJ/T 2355.4-1983; SJ/T 2355.5-1983; SJ/T 2355.6-1983; SJ/T 2355.7-1983
Quoted Standard GB/T 3977-2001; GB/T 4365-2003; GB/T 5698-2001; GB/T 5702-2003; GB/T 7921-1997; GB/T 7922-2003; GB/T 11499-2001; GB/T 15651-1995; CIE 127-1997; ANSI/ESD STM 5.1-2001; ANSI/ESD STM 5.2-1999
Regulation (derived from) MIIT (2009) No. 62; industry standard filing Notice 2010 No. 1 (No. 121 overall)
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This standard specifies the electrical characteristics of the semiconductor light-emitting diode test method, the optical characteristics of test methods, optical characteristics test method, the color characteristics of test methods, test methods and thermal characteristics of electrostatic discharge sensitivity testing methods.
SJ/T 11394-2009 English cover page

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