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Database: 189759 (26 Oct 2025)
SJ/T 10745-1996 English PDF
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Standard Title (Description)
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SJ/T 10745-1996
English
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Mechanical and climatic test methods for semiconductor integrated circuits
Obsolete
SJ/T 10745-1996
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Basic data
Standard ID
SJ/T 10745-1996 (SJ/T10745-1996)
Description (Translated English)
Mechanical and climatic test methods for semiconductor integrated circuits
Sector / Industry
Electronics Industry Standard (Recommended)
Classification of Chinese Standard
L56
Classification of International Standard
31.2
Word Count Estimation
52,549
Date of Implementation
1/1/1997
Older Standard (superseded by this standard)
GB 4590-1984
Adopted Standard
IEC 60147-4, MOD; IEC 60147-5, MOD
Regulation (derived from)
Industry-Science (2010) No. 77
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