| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| SJ/T 10745-1996 | English | RFQ |
ASK
|
Days<=11
|
Mechanical and climatic test methods for semiconductor integrated circuits
|
SJ/T 10745-1996
| Obsolete |
SJ/T 10745-1996
|