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JY/T 0006-2011: (Transistor Characterization Grapher)
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(Transistor Characterization Grapher)
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Technical specifications of vertical electrolysers with the block membrane
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Basic data | Standard ID | JY/T 0006-2011 (JY/T0006-2011) | | Description (Translated English) | (Transistor Characterization Grapher) | | Sector / Industry | Education Industry Standard (Recommended) | | Classification of Chinese Standard | Y51 | | Word Count Estimation | 10,126 | | Date of Issue | 2013-07-11 | | Date of Implementation | 2013-07-11 | | Older Standard (superseded by this standard) | JY 6-1985 | | Issuing agency(ies) | Ministry of Education of the People's Republic of China | JY/T 0006-2011: (Transistor Characterization Grapher)---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
(Transistor Characterization Grapher)
Replacing JY 6-1985
ICS 03.180
Y51
Record number 46894-2014
Education Industry Standard of the People's Republic of China
JY
Transistor Characterization Grapher
Transistor characteristic curve tracer
2013-07-11 Release
2013-07-11 Implementation
Published by the Ministry of Education of the People's Republic of China
Foreword
This standard was drafted in accordance with the rules given in GB/T 1.1-2009.
This standard replaces JY 6-1985. In addition to editorial changes, the main technical requirements of this standard have changed as follows.
-Deleted the 2461-1 type requirement in the original standard;
-The basic requirements are in accordance with the J2461 technical requirements in the original standard, and there is room for development, for example; the peak voltage range of the scanning voltage and
The ladder signal and the number of stages can reach the J2461-1 type in the original standard;
-Added relevant safety requirements.
Please note that some content of this standard may involve patents, and the issuing authority of this standard is not responsible for identifying these patents.
This standard was proposed by the National Technical Committee for Standardization of Teaching Instruments (SAC/TC125).
This standard is under the jurisdiction of the National Technical Committee for Standardization of Teaching Instruments (SAC/TC125).
The main drafting organization of this standard. Hangzhou Jiuliang Technology Development Co., Ltd.
The main drafter of this standard. He Zhenhua.
This standard replaces JY 6-1985.
The standard JY 6 was first published in 1978 and first revised in 1985.
Transistor Characterization Grapher
1 Scope
This standard specifies the type designation, requirements, test methods, inspection rules and marks, packaging, transportation, and storage of the transistor characteristic diagramming instrument.
Save.
This standard is applicable to the transistor characteristic graphing instrument with teaching oscilloscope as the display device.
2 Normative references
The following documents are essential for the application of this document. For dated references, only the dated version applies to this document.
For undated references, the latest version (including all amendments) applies to this document.
GB 8898-2001 audio, video and similar electronic equipment safety requirements
JY 0001-2003 General quality requirements for teaching instrument products
JY 0002 Inspection rules for teaching instrument products
JY 0009-1990 Environmental requirements and test methods for electronic equipment for teaching
JY 0026-1991 teaching instrument and teaching equipment product model naming method
3 Model designation
3.1 Naming rules
Press JY 0026-1991.
3.2 Nomenclature
The model of the transistor characteristic grapher is named.
D ― JTT ― 7J ―-50
Specifications. scanning peak voltage, unit. V
Product feature code, level of characteristic curve family, level 7 (or level 10)
Product name Pinyin prefix, transistor characteristics graph
Product model classification code, electrical special instrument
Model example.
D-JTT-7J-50 means a transistor characteristic graphing instrument with a scanning peak voltage of 50V and seven stages of the characteristic curve family
D-JTT-10J-200 means a transistor characteristic grapher with a scanning peak voltage of.200V and ten levels of the characteristic curve family
4 Requirements
4.1 Working environmental conditions
Temperature. -10 ℃ ～ 40 ℃.
Relative humidity. not more than 90% RH.
4.2 Using power
Should use AC, voltage 220V ± 22V, frequency 50Hz ± 0.5Hz.
4.3 Safety requirements
The safety requirements shall comply with the relevant requirements in chapters 5, 9, 10, 15, 16 of GB 8898, and the contents and test methods shall be as shown in Table 1.
Table 1 Contents of safety requirements and test methods
Test method of safety content
1 Marking and instructions for use Chapter 5 of GB 8898
2 Hazard of electric shock under normal working conditions Chapter 9 of GB 8898
3 Insulation Requirements Chapter 10 of GB 8898
Chapter 15 in GB 8898, Chapter 15
5 Chapter 16 of External Flexible Cord GB 8898
4.4 Appearance and structure requirements
It should meet the requirements of chapters 6 and 7 of the JY 0001-2003 standard.
4.5 Sweep voltage
4.5.1 Voltage polarity. positive and negative can be changed.
4.5.2 Peak voltage range. 0V ～ 50V, continuously adjustable.
4.5.3 Current peak value. not less than.200mA.
4.5.4 Scanning frequency. It should be 100Hz, which is a multiple of the power frequency.
4.5.5 The nominal value of the power consumption limiting resistor shall be divided into 11 levels according to one and five decimal places. 0Ω, 5Ω, 10Ω, 50Ω, 100Ω, 500Ω, 1k
Ω, 5kΩ, 10kΩ, 50kΩ, 100kΩ.
4.6 Ladder signal
4.6.1 Ladder polarity. positive and negative can be changed.
4.6.2 Ladder current range. It should be divided into 0 microamperes/level, 5 microamperes/level to 5 milliamps/level, and there are 11 levels in one, two, and five bases.
The difference should be no more than 10%.
4.6.3 Levels of each family. should be seven (or ten).
4.7 Y-axis display range
4.7.1 Current display range. It should be divided into 0.05mA/div ~ 20mA/div, according to nine levels of one, two, and five.
More than 10%.
4.7.2 Ladder calibration. one division per level, the relative error should not be greater than 10%.
4.7.3 Y-axis calibration signal (peak-to-peak). should be 500mV ± 25mV.
4.8 X-axis display range
4.8.1 Voltage display range. should be divided into 0.1 volts/division to 10 volts/division. There are seven levels in one, two, and five decimal places, and the relative error is not greater than 10%.
4.8.2 X-axis calibration signal (peak-to-peak). should be 500mV ± 25mV.
4.9 Requirements for external oscilloscope during use
4.9.1 The Y-axis deflection factor of the oscilloscope should not be greater than 100 millivolts/div, and the input resistance should be 1MΩ.
4.9.2 The X-axis deflection factor of the oscilloscope should not be greater than 100 millivolts/div, and the input resistance should be 1MΩ.
4.10 Environmental test requirements
Should be able to withstand 4.3 (all items) according to JY 0009-1990.
5 Test method
5.1 Appearance and structural inspection
Visual inspection of the appearance and structure of the instrument shall meet the requirements of 4.4 of this standard.
5.2 Safety requirements inspection
Product safety requirements test method according to Table 1.
5.3 Scanning voltage inspection
5.3.1 Measuring instruments
Oscilloscope. Y-axis display error is not greater than 3%; sliding rheostat. 1kΩ, 0.3A; digital multimeter. 3-1/2 digits.
5.3.2 Test method
Set the power consumption limiting resistance of the instrument under test to 0, and adjust the resistance of the sliding rheostat to 240Ω ～ 250Ω (measured with a digital multimeter).
To the transistor sockets C and E of the instrument under test, to ensure that the peak current of the scanning voltage peak-value 50V is not less than.200mA, and connected to the oscilloscope Y
Input terminal, as shown in Figure 1. Turn on the power of the instrument under test and increase the scanning voltage. The full-wave rectified waveform is displayed on the oscilloscope.
4.5.1 requirements; the voltage peak range shall meet the requirements of 4.5.2.
Figure 1 Scanning voltage test equipment connection diagram
5.4 Power Limiting Resistance Test
Use visual inspection to check the power consumption limit on the panel of the graph of the transistor characteristics. The resistor is a step-adjustable switch. The nominal value of the resistor should meet the requirements of 4.5.5.
begging.
5.5 Ladder signal test
5.5.1 Measuring instruments
Comparison signal generator (or equivalent function instrument). output pulse amplitude error is not greater than 1%; oscilloscope. Y-axis display error is not large
At 3%; resistance box. 0.2. Before the test, use the comparison signal generator to calibrate the oscilloscope deflection factor “0.1V/div”.
5.5.2 Ladder calibration inspection
The Y-axis display range switch of the instrument under test is set to "step calibration", and the Y input of the oscilloscope is connected to the "connect Y" and "ground" terminals of the instrument under test;
The oscilloscope is in the state of stopping scanning, the Y input coupling switch is set to "DC", the deflection factor is set to the "0.1 volt/div" level, and the power switch is turned on
After that, eight (or 11) bright spots should be displayed on the oscilloscope phosphor screen, and each bright spot should be exactly 1 division, and the error should be less than 0.1 division. When changed
For step polarity, the bright point moves symmetrically to the X axis, but the position of the zero step should be unchanged, that is, the position of the bottom bright point of the positive polarity should be negative.
The position of the top bright spot coincides with the requirements of 4.6.1 and 4.7.2. If each bright spot is 1 square, the error is greater than 0.1 square, or zero-step
There is a change in position. You can repeatedly adjust the "step calibration" and "step zero" semi-adjustable potentiometers on the instrument panel, which should meet the requirements.
5.5.3 Ladder current error test
Connect the 0.2-level resistance box between the transistor socket B and E of the instrument under test, and connect the Y input of the oscilloscope at the same time, as shown in Figure 2;
Stop the scanning working state, set the Y input coupling switch to “DC”, set the deflection factor to “0.1 volts/div”, the ladder current level of the instrument under test and the power
When the resistance value of the resistance box is placed according to Table 2, the product of the nominal value of each step of the ladder and the resistance value of the resistance box should be 0.7V (or 1V).
The third item is the nominal voltage value, and the actual voltage value can be measured with an oscilloscope. After the instrument under test is connected to the power switch, read the oscilloscope display.
Show the measured voltage value between eight (or 11) bright spots, record it in Table 2, and calculate the error δ according to formula (1).
δ = [(measured voltage value-nominal voltage value)/nominal voltage value] × 100% (1)
In the formula.
Measured voltage value-the voltage value measured by the oscilloscope, the unit is volt (V);
Nominal voltage value-take 0.7V (when the step is seven steps), or 1V (when the step is 10 steps).
Should meet the requirements of 4.6.2.
Figure 2 Connection diagram of ladder current error checking instrument
Table 2 Ladder signal inspection records
Resistance value of ladder current gear box
Nominal voltage value
Oscilloscope displays the measured voltage value
error
5 microamps/level 20.4k 0.7V (or 1V)
10 microamps/level 10.1k 0.7V (or 1V)
20 microamps/level 5k 0.7V (or 1V)
50 μA/level 2k 0.7V (or 1V)
0.1mA/level 1k 0.7V (or 1V)
0.2 mA/class 500 0.7V (or 1V)
0.5 mA/class.200 0.7V (or 1V)
1 mA/level 100 0.7V (or 1V)
2 mA/level 50 0.7V (or 1V)
5mA/level 20 0.7V (or 1V)
Note. In order to reduce the error caused by the oscilloscope input resistance of 1MΩ in parallel, the resistance value of the resistance box is modified to 20.4kΩ and 10.1kΩ in two levels. 5μA/level and 10μA/level.
After 20 microamperes/level, the error caused by the 1MΩ input resistance of each oscilloscope in parallel is less than 0.5%, and the resistance value of the resistance box does not need to be corrected.
5.6 Y-axis display range inspection
5.6.1 Measuring instruments
Comparison signal generator (or equivalent function instrument). output pulse amplitude error is not greater than 1%; oscilloscope (two). Y axis display
The error is not greater than 3%; resistance box. 0.2 level.
Before the test, use the comparison signal generator to set the deflection factor of No.1 oscilloscope to “1V/div” for calibration, and deflection of No.2 oscilloscope.
Set the factor to "0.1 volts/division" for calibration.
5.6.2 Current display error test
Measured instrument transistor sockets C and E are connected to a 0.2-level electrical group box, and connected to the Y input terminal of oscilloscope No. 1
The input terminal is connected to the “connected to Y” and “ground” terminals of the instrument under test, as shown in Figure 3.
The in-coupling switches are all set to "DC", the deflection factor of No. 1 oscilloscope is set to "1 V/div", and the deflection factor of No. 2 oscilloscope is set to "0.1 V/div". Be
The Y-axis current display scale of the measuring instrument and the resistance value of the resistance box are set according to Table 3. When the power consumption limit resistance is set to 0, the current is connected to the transistor of the measured instrument.
The current of the resistance box between sockets C and E is equal to the voltage on the resistance box divided by the resistance value of the resistance box; when the resistance value of the resistance box is set according to Table 3,
As long as the voltage applied to the resistance box is 5V (that is, the oscilloscope is displayed as five divisions), the nominal value of the current flowing through the resistance box should be the table
The Y-axis current display scale value in 3 is multiplied by the number of grids displayed on the No. 1 oscilloscope. The measured current value can be measured by the number of grids displayed on the No. 2 oscilloscope.
Table 3 Y-axis current display error inspection record
Y-axis current display scale
Resistance box resistance
No.1 oscilloscope display
No. 2 oscilloscope display
error
0.05mA/div 20.4k 5
0.1 mA/div 10.1k 5
0.2 mA/div 5k 5
0.5 mA/div 2k 5
1 mA/div 1k 5
2 mA/div 500 5
5 mA/div.200 5
10 mA/div 100 5
20 mA/div 50 5
Note. See note in Table 2.
Figure 3 Connection diagram of current display error checking instrument
After the instrument under test is connected to the power switch, increase the scanning voltage so that the vertical display of No. 1 oscilloscope is exactly five divisions, and record No. 2 oscilloscope
The number of grids displayed by the monitor is shown in Table 3. Based on the five grids displayed by No.1 oscilloscope, the error δ is calculated according to formula (2).
δ = [(display value of No. 2 oscilloscope-display value of No. 1 oscilloscope)/display value of No. 1 oscilloscope] × 100% (2)
In the formula.
The units of the No. 1 and No. 2 oscilloscope display units are all divisions.
Should meet the requirements of 4.7.1.
5.6.3 Y-axis calibration signal test
The Y-axis display range switch of the instrument under test is set to the “Y-axis calibration” position. The calibrated No. 2 oscilloscope Y input is connected to the instrument under test “connect to Y”,
"Ground" terminal, Y input coupling switch is set to "DC", deflection factor is set to "0.1 V/div", test the voltage peak displayed in the vertical direction-
The peak value shall meet the requirements of 4.7.3.
5.7 X-axis display range inspection
5.7.1 Measuring instruments
Comparison signal generator. output pulse amplitude error is not greater than 1%; oscilloscope (two). Y-axis display error is not greater than 3%;
Before the test, use the comparison signal generator to calibrate the deflection factor of the No. 2 oscilloscope to the “0.1V/div” range.
5.7.2 Voltage display error test
Connect the Y input terminal of oscilloscope No. 1 to the transistor socket C and E of the instrument under test, and connect the Y input terminal of oscilloscope No. 2 to the instrument under test "connect X",
The "ground" terminal is shown in Figure 4; the Y input coupling switches of the oscilloscope are set to "DC", and the deflection factor of the second oscilloscope is set to "0.1 volt/div". Be
The power consumption limit resistance of the measuring instrument is set to 0. The X-axis display range switch is placed according to Table 4. After turning on the power switch, slowly increase the scanning voltage to
The oscilloscope display is exactly five divisions, then the nominal voltage added between the transistor sockets C and E of the instrument under test is the X-axis voltage display scale multiplied by
Five divisions, and the actual voltage can be directly measured by the No. 1 oscilloscope; record the measured value of the No. 1 oscilloscope in Table 4, and calculate according to formula (1)
The error δ shall meet the requirements of 4.8.1.
Figure 4 Connection diagram of voltage display error checking instrument
Table 4 X-axis voltage display error inspection record
X-axis voltage display scale
No. 2 oscilloscope displays the nominal voltage value
No.1 oscilloscope displays the measured voltage
error
0.1 volt/div 5 divisions × 0.1 volt/div = 0.5
0.2 volts/div 5 divisions × 0.2 volts/div = 1.0
0.5 volt/div 5 divisions × 0.5 volt/div = 2.5
1 volt/division 5 divisions × 1 volt/division = 5.0
2 volts/div. 5 divisions × 2 volts/div. = 10.0
5V/div 5div × 5V/div = 25.0
10 volts/div. 5 divisions × 10 volts/div. = 50.0
5.7.3 X-axis calibration signal test
The X-axis display range switch of the instrument under test is set to the “X-axis calibration” position. The calibrated No. 2 oscilloscope Y input is connected to the instrument under test “connect to X”,
"Ground" terminal, Y input coupling switch is set to "DC", deflection factor is set to "0.1V/div", turn on the power switch, and test the vertical
The displayed peak-to-peak voltage shall meet the requirements of 4.8.2.
5.8 Power supply voltage adaptation range test
According to JY 0009-1990 4.4.5. Should comply with 4.2.
5.9 Environmental test methods
According to the methods specified in 4.5, 4.6, 4.7, 4.8 and 4.9 of JY 0009-1990. Should comply with 4.10.
6 Inspection rules
6.1 Inspection classification
Product inspection should be divided into factory inspection, type inspection and quality supervision inspection.
6.2 Inspection items
The inspection items and inspection methods for factory inspection and type inspection shall comply with Table 5.
Table 5 Inspection items and inspection methods for factory inspection and type inspection
Item No. Inspection Item Standard Provisions Factory Inspection Type Inspection
1 Product appearance and structure 4.4 ● ●
2 Safety requirements 4.3 ○ ●
3 Scanning voltage 4.5 ● ●
4 Power consumption limiting resistance 4.5.5 ○ ●
5 Ladder signal check 4.6.1, 4.7.2 ● ●
6 Ladder current error test 4.6.2 ○ ●
7 Y-axis current display range 4.7.1 ○ ●
8 Y-axis calibration signal 4.7.3 ● ●
9 X-axis voltage display range 4.8.1 ○ ●
10 X-axis calibration signal 4.8.2 ● ●
11 Product packaging quality 7.1 ● ●
12 Power supply voltage adaptation range test 4.2 ○ ●
13 Temperature test 4.10-●
14 Humidity test 4.10-●
15 Vibration test 4.10-●
16 Shock and tilt drop test 4.10-●
17 Transport test 4.10-●
Note. “●” in the table is the full inspection item, “〇” is the sampling inspection item, and “-” is not the inspection item.
6.3 Sampling method
6.3.1 The factory inspection shall be based on the natural batch of delivery, and the type inspection shall be based on the inventory array.
6.3.2 During the factory inspection, all the inspection items should be inspected first, and then the sample inspection items should be inspected among the qualified products for all inspection items.
Check.
6.3.3 The samples for type inspection shall be taken from the products that passed the factory inspection.
6.3.4 The sampling methods for factory inspection and type inspection shall be in accordance with JY 0002.
6.4 Non-conformance determination
6.4.1 The judgment of sampling inspection shall be in accordance with JY 0002.
6.4.2 The failure criterion of a single sample shall be in accordance with JY 0002.
6.4.4 During the inspection of all inspection items, it shall be determined according to the unqualified criterion of a single sample.
6.4.5 The main performance indicators are items 2, 3, 5, 8, and 10 in Table 5.
6.5 Review rules
6.5.1 Unqualified products can be submitted for re-inspection after rework.
6.5.2 If the cause of the batch disqualification is a sampling inspection item, the item shall be fully inspected during the re-inspection.
6.6 Quality supervision inspection
Quality supervision and inspection shall be in accordance with JY 0002.
7 Marking, packaging, transportation, storage
7.1 After the storage period of the product exceeds 365 days, it should be re-inspected.
7.2 Marks, labels, instruction manuals, packaging, transportation and storage shall meet the requirements of Chapters 11 and 12 of JY 0001-2003.
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