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JJG 853-2013 English PDF

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JJG 853-2013: Verification Regulatio of the Low Background Alpha/Beta Measuring Instruments
Status: Valid

JJG 853: Evolution and historical versions

Standard ID	Contents [version]	USD	STEP2	[PDF] delivered in	Standard Title (Description)	Status	PDF
JJG 853-2013	English	369	Add to Cart	3 days [Need to translate]	Verification Regulatio of the Low Background Alpha/Beta Measuring Instruments	Valid	JJG 853-2013
JJG 853-1993	English	319	Add to Cart	3 days [Need to translate]	Verification Regulation of Low Background Alpha and/or Beta Measuring Instrument	Obsolete	JJG 853-1993

PDF similar to JJG 853-2013

Standard similar to JJG 853-2013

GB/T 3222.1 JJG 188 JJF 1396 JJG 377 JJG 852 JJG 393

Basic data

Standard ID	JJG 853-2013 (JJG853-2013)
Description (Translated English)	Verification Regulatio of the Low Background Alpha/Beta Measuring Instruments
Sector / Industry	Metrology & Measurement Industry Standard
Classification of Chinese Standard	A58
Classification of International Standard	17.240
Word Count Estimation	16,138
Older Standard (superseded by this standard)	JJG 853-1993
Quoted Standard	JJF 1035-2006; GB/T 11682-2008; ISO 9697-2008; ISO 18589-6-2009
Regulation (derived from)	AQSIQ Announcement No. 114, 2013
Issuing agency(ies)	General Administration of Quality Supervision, Inspection and Quarantine
Summary	This standard applies to: the use of solid scintillation detectors and semiconductor detectors low background a, �� gauge initial verification, testing and use of the follow-up inspection, does not apply to gas flow proportional counter and a liquid scinti

JJG 853-2013: Verification Regulatio of the Low Background Alpha/Beta Measuring Instruments

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Verification Regulatio of the Low Background Alpha/Beta Measuring Instruments State verification procedures People's Republic of China Low background α, β measuring instrument Issued on. 2013-08-15 2014-02-15 implementation The State Administration of Quality Supervision, Inspection and Quarantine released Low background α, β measuring instrument verification regulation Instruments Alternative JJG 853-1993 Focal point. the National Technical Committee of ionizing radiation metrology Drafting units. China Institute of Metrology Shanghai Measurement and Testing Technology Research Institute This procedure commissioned the National Technical Committee is responsible for ionizing radiation measurement interpretation The drafters of the regulations. Chun Long (China Institute of Metrology) Liang Jun Cheng (China Institute of Metrology) He Linfeng (Shanghai Institute of Measurement and Testing) Chen Jing (China Institute of Metrology)

Introduction (Ⅱ) 1 Scope (1) 2. References (1) 3 terminology and units of measurement (1) 3.1 The term (1) 3.2 units of measurement (1) 4 Overview (2) 5 metering performance requirements (2) 5.1 Instrument background (2) 5.2 detection efficiency (2) 5.3 Repeatability (2) 5.4 cross track ratio (2) 6 General Requirements (2) 6.1 Appearance and identification (2) 7 control of measuring instruments (2) 7.1 verification Conditions (2) 7.2 Verification Project (3) 7.3 Verification Methods (3) 7.4 Verification Results Processing (5) 7.5 test cycle (5) A test pattern recording format Appendix (6) Appendix B test certificates/test results notice the third page style (7) Appendix C Statistical uncertainty calculation method (9)

Introduction

JJF1002-2010 "national verification procedures write rules", JJF1001-2011 "common terminology and measurement Definitions ", JJF1059.1-2012" Evaluation and Expression of Uncertainty in Measurement "constitute support the revision of this Regulation The basic series of specifications. Compared with JJG 853-1993, in addition to editorial changes, the present regulations the main technical changes are as follows. --- Cancel low background α, β measuring instrument rating; --- Cancellation request subject to provide users with 10 times the 24-hour background measurements; --- Cancellation stability test project; --- Increase repeatability test item (see 5.3); --- Emphasize the background, efficiency and reproducibility of the measurement verification counting statistics requirement (see 7.3.2,7.3.3, 7.3.4). Low background α, β measuring instrument verification regulation

1 Scope

The order applies to the use of solid scintillation detectors and semiconductor detectors Low background α, β meter first seizure Set, and use the subsequent verification check, does not apply to gas flow proportional counter, liquid scintillation counter and other types of measurements Instrument calibration. 2. References This procedure references the following documents. JJF1035-2006 ionizing radiation measurement terms and definitions GB/T 11682-2008 low background α and/or β measuring instrument ISO 9697.2008 Quality no saline total β activity measurement Thick source method (Waterquality-Measure- mentofgrossbetaactivityinnon-salinewater-Thicksourcemethod) ISO 18589-6.2009 Measurement of radioactivity in the environment - Soil - Part 6. total α and total β activity Measurement (Measurementofradioactivityintheenvironment-Soil-Part 6. Measurementof grossalphaandgrossbetaactivities) For dated references, only the dated edition applies to this procedure; undated reference documents Member, the latest edition (including any amendments) applies to this procedure.

3 terminology and units of measurement

3.1 Terms 3.1.1 Instrument background instrumentalbackground Under normal operating conditions the instrument, measured value shown no radioactive contamination of the empty sample pan when. 3.1.2 surface emissivity surfaceemissionrate Sources within 2π steradian emissivity. 3.1.3 standard flat source referenceplanesources Nature and activity within a defined period of time are known, and can be used as a reference plane of a solid-state sources. 3.1.4 detection efficiency detectionefficiency Under certain conditions the detection ratio of the measured detector count rate measured source emission rates. 3.1.5 cross track than interfereratio (crosstalk) Instrument measuring single α or β standard source, α or β Road Road ratio α and β count the total number of channels. 3.2 units of measurement 3.2.1 [Source] surface emissivity 2π steradian per minute, the symbol. (min · 2πsr) -1. 3.2.2 unit area average background count rate Minute per square centimeter, symbol. cm-2 · min-1.

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