Standard Briefing:Stadard ID: JJG 1137-2017
Stadard Title: High Voltage Relative Dielectric Loss and Capacitance Testers
Price (USD): 399
Lead day (Deliver True-PDF English version): 4 days [Need to translate]
Status: Valid
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| JJG 1137-2017 | English | 399 |
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High Voltage Relative Dielectric Loss and Capacitance Testers
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JJG 1137-2017
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Basic Data: | Standard ID | JJG 1137-2017 (JJG1137-2017) | | Description (Translated English) | High Voltage Relative Dielectric Loss and Capacitance Testers | | Sector / Industry | Metrology & Measurement Industry Standard | | Classification of Chinese Standard | A55 | | Classification of International Standard | 17.220 | | Word Count Estimation | 17,196 | | Date of Issue | 2017-02-28 | | Date of Implementation | 2017-05-28 | | Regulation (derived from) | General Administration of Quality Supervision, Inspection and Quarantine No. 23 of 2017 | | Issuing agency(ies) | State Administration of Quality Supervision, Inspection and Quarantine | | Summary | This standard applies to all types of high-pressure relative dielectric loss and capacitance tester of the first test, follow-up test and use of the inspection. This procedure is not suitable for the verification of dielectric pressure testers or other dielectric loss testers with built-in high voltage test power supplies. | Contents, Scope, and Excerpt:JJG 1137-2017
High Voltage Relative Dielectric Loss and Capacitance Testers
National Metrological Verification Regulation of the People's Republic of China
High Pressure Relative Dielectric Loss and Capacitance Tester
2017-02-28 released
2017-05-28 Implementation
State Administration of Quality Supervision, Inspection and Quarantine issued
High voltage relative dielectric loss and capacitance
Test instrument verification procedures
Unit. National Electromagnetic Metrology Technical Committee High Pressure Metering Subcommittee
Major drafting unit. National high voltage metering station
State Grid Corporation of Sichuan Electric Power Company Electric Power Research Institute
Participated in the drafting unit. State Grid Hebei Electric Power Company Electric Power Research Institute
State Grid Shandong Electric Power Company Electric Power Research Institute
China Institute of Metrology
This procedure is entrusted to the National Electromagnetic Metrology Technical Committee of the High Pressure Metrology Subcommittee.
The main drafters of this procedure.
Zhang jun (national high voltage metering station)
Wang Siqi (National High Voltage Metering Station)
Gan Degang (State Grid Sichuan Electric Power Company Electric Power Research Institute)
Participate in the drafters.
Guo Zijuan (National High Voltage Metering Station)
Pan Jin (State Grid Hebei Electric Power Company Electric Power Research Institute)
Wang Andong (State Grid Shandong Electric Power Company Electric Power Research Institute)
Dai Dongxue (China Institute of Metrology)
table of Contents
Introduction (II)
1 range (1)
2 terms and units of measurement (1)
3 Overview (1)
4 Measurement performance requirements (1)
4.1 Measuring range (1)
4.2 Accuracy class (2)
4.3 Maximum permissible error (2)
5 General technical requirements (2)
5.1 appearance and power check (2)
5.2 Insulation resistance (2)
5.3 Dielectric strength (2)
6 Metering device control (2)
6.1 Test conditions (2)
6.2 Metrological standards and auxiliary equipment (3)
6.3 Test items and test methods (3)
6.4 Processing of test results (5)
6.5 Test cycle (5)
Appendix A Verification of the original record format (6)
Appendix B Verification Certificate/Verification Result Notification Page Format (Page 2) (8)
Appendix C Certificate of Verification/Verification Result Verification Result Page Format (Page 3) (9)
introduction
This procedure is based on JJF1002-2010 "national measurement procedures for the preparation of rules", JJF1001-2011 "pass
Using Metrology Terms and Definitions "and JJF1059.1-2012" Measurement Uncertainty Assessment and Representation ".
This order is the first release.
Verification Regulation of High Pressure Relative Dielectric Loss and Capacitance Tester
ScopeThis procedure applies to all types of high-pressure relative dielectric loss and capacitance tester of the first test, follow-up test and the use of
an examination.
This procedure is not applicable to various high pressure dielectric loss testers or other dielectric losses with built-in high voltage test power
Test of the tester.
2 terms and units of measurement
The following terms and definitions apply to this Code.
2.1 relative media loss relativedielectricloss
The difference between the dielectric loss factors between two capacitive devices in the same phase running state.
3 Overview
High pressure relative dielectric loss and capacitance tester (hereinafter referred to as the tester) is the power industry/system state maintenance work
A measuring instrument for measuring the insulation of a capacitive device.
The tester consists of two current sampling units and a portable host. The measurement principle is shown in Fig.
Figure 1 Schematic diagram of relative dielectric loss
CX-test equipment; CN-reference equipment; IX-test equipment current signal; IN-reference device current signal
For two capacitive devices, CX and CN, in the in-phase operating state, the tester measures the flow of CX and CN
CN of the power frequency current IX and IN phase relationship and amplitude, calculate the current base wave signal phase difference and amplitude ratio,
Thereby obtaining a relative dielectric loss value and a capacitance ratio between the CX and CN.
4 Measurement performance requirements
4.1 Measuring range
--- Power frequency current measurement range. 1mA ~ 1A;
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