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JJF 2000-2022: Calibration Specification for Loop Impedance/Prospective Short-circuit Current Testers
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Calibration Specification for Loop Impedance/Prospective Short-circuit Current Testers
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JJF 2000-2022
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Basic data | Standard ID | JJF 2000-2022 (JJF2000-2022) | | Description (Translated English) | Calibration Specification for Loop Impedance/Prospective Short-circuit Current Testers | | Sector / Industry | Metrology & Measurement Industry Standard | | Classification of Chinese Standard | A55 | | Word Count Estimation | 24,225 | | Date of Issue | 2022-12-07 | | Date of Implementation | 2023-06-07 | | Issuing agency(ies) | State Administration for Market Regulation | JJF 2000-2022: Calibration Specification for Loop Impedance/Prospective Short-circuit Current Testers
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National Metrology Technical Specifications of the People's Republic of China
Loop Impedance/Prospective Short Circuit Current Tester
Calibration specification
Released on 2022-12-07
2023-06-07 Implementation
Released by the State Administration for Market Regulation
Loop Impedance/Prospective Short Circuit Current Tester
Calibration specification
Responsible unit. National Electromagnetic Metrology Technical Committee
Main drafting unit. Shenzhen Institute of Metrology and Quality Inspection
Participating in the drafting unit. Fluke Testing Instruments (Shanghai) Co., Ltd.
Liaoning Institute of Metrology
Shaanxi Institute of Metrology
Guangzhou Institute of Metrology and Testing Technology
This specification entrusts the National Electromagnetic Metrology Technical Committee to be responsible for interpretation
The main drafters of this specification.
Wang Jingxi (Shenzhen Institute of Metrology and Quality Inspection)
Chao Huang (Shenzhen Institute of Metrology and Quality Inspection)
Zhou Jiao (Shenzhen Institute of Metrology and Quality Inspection)
Participating drafters.
Yang Shengli [Fluke Testing Instruments (Shanghai) Co., Ltd.]
Liang Guoding (Liaoning Institute of Metrology)
Tang Yuanhui (Shaanxi Institute of Metrology)
Ma Qingliang (Guangzhou Institute of Metrology and Testing Technology)
Table of contents
1 Scope(1)
2 References(1)
3 terms(1)
4 Overview(1)
5 Metrological characteristics(2)
5.1 Indication error of loop impedance (2)
5.2 Prospective short-circuit current indication error (2)
5.3 AC voltage indication error (2)
5.4 Frequency Indication Error(2)
6 Calibration conditions(2)
6.1 Environmental conditions (2)
6.2 Measuring standards and other equipment (2)
7 Calibration Items and Calibration Methods(3)
7.1 Calibration items(3)
7.2 Calibration method(3)
8 Calibration result expression(6)
8.1 Calibration certificate(6)
8.2 Data processing (7)
9 Recalibration interval(7)
Appendix A Examples of Calibration Uncertainty Evaluation of Loop Impedance and Prospective Short-Circuit Current (8)
Appendix B Calibration Raw Record Format(14)
Appendix C Calibration Certificate Inner Page Format (16)
Introduction
JJF 1001-2011 "General Metrology Terms and Definitions", JJF 1071-2010 "National Metrology Calibration Specification Compilation"
"Rules" and JJF 1059.1-2012 "Assessment and Expression of Measurement Uncertainty" jointly constitute the support for the formulation of this specification
basic documents.
This specification is published for the first time.
Loop Impedance/Prospective Short Circuit Current Tester
Calibration specification
1 Scope
This specification is applicable to the loop impedance/expected short-circuit current tester and multi-function tester whose measurement principle is the impedance voltage drop method.
Calibration of the loop impedance/prospective short-circuit current function part of the tester.
2 References
This specification references the following documents.
JJF 1587-2016 Digital Multimeter Calibration Specification
GB/T 15544.1-2013 Three-phase AC system short-circuit current calculation part 1.current calculation
GB/T 18216.3-2021 AC 1000V and DC 1500V and below low-voltage power distribution system electrical safety
Fully protected testing, measuring or monitoring equipment - Part 3.Loop impedance
For dated references, only the dated version applies to this specification; for undated references
document, its latest version (including all amendments) applies to this specification.
3 terms
The terms defined in GB/T 18216.3-2012 and the following terms apply to this specification.
3.1 loop impedance loopimpedance
In the current loop, the current source impedance is related to the line conductor (such as protective conductor, grounding conductor) from the measurement point to the other terminal of the current source.
The sum of the impedance of the ground electrode and the ground.
[Source. GB/T 18216.3-2021, 3.5]
3.2 Prospective short-circuit current prospectiveshort-circuitcurrent
The current flowing through the short-circuit point when the power supply remains unchanged and the short-circuit point is replaced by an ideal connection with negligible impedance.
[Source. GB/T 15544.1-2013, 1.3.3]
4 Overview
Loop impedance/expected short-circuit current tester (hereinafter referred to as "tester") is used to measure the circuit under test
Instrumentation for loop impedance and prospective short-circuit current. The tester is mainly composed of signal input unit, control circuit, signal processing circuit
circuit, A/D converter, processor, load module, voltage and current measurement module, display, key input unit, etc.
Composition, its working principle block diagram is shown in Fig. 1.The tester uses the impedance voltage drop method to measure the loop impedance, and passes the measured
The prospective short-circuit current is calculated from the loop measuring terminal voltage and loop impedance. The tester generally has a large current measurement and an anti-trigger test.
There are two modes of measurement.
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