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JJF 1256-2010 English PDF

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JJF 1256-2010: Calibration specification for X-ray monocrystal orientation equipment
Status: Valid

JJF 1256: Evolution and historical versions

Standard ID	Contents [version]	USD	STEP2	[PDF] delivered in	Standard Title (Description)	Status	PDF
JJF 1256-2010	English	299	Add to Cart	3 days [Need to translate]	Calibration specification for X-ray monocrystal orientation equipment	Valid	JJF 1256-2010
JJF 1256-1990	English	319	Add to Cart	3 days [Need to translate]	(160 to 900 ml capacity reference operating technical specifications)	Obsolete	JJF 1256-1990

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Basic data

Standard ID	JJF 1256-2010 (JJF1256-2010)
Description (Translated English)	Calibration specification for X-ray monocrystal orientation equipment
Sector / Industry	Metrology & Measurement Industry Standard
Classification of Chinese Standard	A52
Classification of International Standard	17.040
Word Count Estimation	13,187
Date of Issue	2010-06-10
Date of Implementation	2010-09-10
Quoted Standard	GB 18871-2002; JB/T 5482-2003; JB/T 8764-1998; JJF 1059-1999; JJF 1001-1998; JJF 1094-2002
Regulation (derived from)	AQSIQ Announcement No. 59 of 2010
Issuing agency(ies)	General Administration of Quality Supervision, Inspection and Quarantine
Summary	This standard applies to the actual copper target focus ((1X4) mmX ray tube processing single crystal X-ray monochromator crystal orientation instrument pairs (hereinafter referred to as directional meter) calibration.

JJF 1256-2010: Calibration specification for X-ray monocrystal orientation equipment

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration specification for X-ray monocrystal orientation equipment People's Republic of China National Metrology Technical Specifications X-ray single crystal orientation analyzer calibration specification Issued on. 2010-06-10 2010-09-10 implementation The State Administration of Quality Supervision, Inspection and Quarantine released X-ray single crystal orientation analyzer calibration specification ment This specification by the State Administration of Quality Supervision, Inspection and Quarantine approved on June 10, 2010, and from From September 10, 2010 implementation. Focal point. the National Technical Committee of length measurement Main drafting unit. Dandong City, Liaoning Province Institute of Measurement and Testing Technology Participated in the drafting. Dandong-ray equipment testing center Fengcheng Quality and Technical Supervision Liaodong-ray machines Limited This specification by the responsible National Technical Committee to explain the length measurement The main drafters of this specification. Tan Li (Dandong City, Liaoning Province Institute of Measurement and Testing Technology) Yu Changjiang (Dandong-ray equipment testing center) Tian Ping (Dandong City, Liaoning Province Institute of Measurement and Testing Technology) Liuwen Zheng (Dandong City, Liaoning Province Institute of Measurement and Testing Technology) Wu Mingzhu (Fengcheng Quality and Technical Supervision) Drafters participate. Liu Desheng (Dandong-ray equipment testing center) Wang Yongli (Liaodong-ray machines Limited)

1 Scope (1) 2. Referenced Documents (1) 3 Terms (1) 4 Overview (2) 5 metering performance requirements (3) 5.1 air kerma rate (3) 5.2 goniometer axis angle shows sample error (3) 5.3 integrated error (3) 5.4 Leakage scatter air kerma rate (3) 5.5 Measurement repeatability (3) 6 calibration conditions (3) Environmental conditions 6.1 (3) 6.2 Standard (3) 7 calibration items and calibration methods (4) 7.1 air kerma rate (4) 7.2 goniometer axis angle shows sample error (4) 7.3 integrated error (5) 7.4 scattered radiation leakage air kerma rate (5) 7.5 Measurement repeatability (6) 8 calibration results (6) 9 calibration cycle (6) A calibration crystal appendix (7) B axis angle orientation instrument samples indication error of measurement uncertainty Examples Appendix (8) X-ray single crystal orientation analyzer calibration specification

1 Scope

This calibration specifications for copper target actual focus (1 × 4) mmX ray tube and processing single crystal monochromator crystal double X-ray direction finder (hereinafter referred to as direction finder) calibration.

2 Citations

This specification references the following documents. GB 18871-2002 ionizing radiation protection and safety of radiation sources basic standards JB/T 5482-2003 X-ray crystal orientation instrument technical condition JB/T 8764-1998 industrial flaw detection X-ray tube general technical conditions JJF 1059-1999 Evaluation and Expression of Uncertainty in Measurement JJF 1001-1998 common measurement terms and definitions Characteristics of measuring instruments JJF 1094-2002 Evaluation When using the citations, it should be taken in the current valid version.

3 Terms

3.1 leak scatter scattandleakageray Leakage radiation leakage and scattered radiation is scattered rays collectively. Ray transmission radiation leakage is a substance or through Crystals Radiation with a wavelength equal to the wavelength. Scattered radiation is a ray radiation to the substance, the substance produced by the secondary radiation Emitted rays, changing the direction and energy of a radiation having a wavelength longer than the first wavelength. 3.2 goniometer "0" line "0" lineofgoniometer Goniometer single crystal X-ray direction finder actual focus copper target (1 × 4) mmX ray tube "0" line, is A line with the axis of rotation coincides with the axis of the counter window and the sample holder through the slit center line (see Figure 1). Figure 1 Schematic diagram of the direction finder 1-X-ray tube anode target; 2- slits (4 ', 5', 6 '); 3- incident rays; 4- diffraction crystal surface, this figure is a SiO2 (1011) crystal plane; 5- detected single crystal; 6- sample axis; 7- diffraction line; 8- counter; 9- Microammeter; 10-θ angle of the display window Note. The figure θ angle of 13 ° 20 '.

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