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JJF 1252-2010 English PDF

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JJF 1252-2010: Calibration specification for measuring instrument for laser paralleism of micrometers
Status: Valid

JJF 1252: Evolution and historical versions

Standard ID	Contents [version]	USD	STEP2	[PDF] delivered in	Standard Title (Description)	Status	PDF
JJF 1252-2010	English	489	Add to Cart	4 days [Need to translate]	Calibration specification for measuring instrument for laser paralleism of micrometers	Valid	JJF 1252-2010
JJF 1252-1990	English	199	Add to Cart	2 days [Need to translate]	O.T.C. of the Primary Standard for the Micro-hardness	Obsolete	JJF 1252-1990

PDF similar to JJF 1252-2010

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Basic data

Standard ID	JJF 1252-2010 (JJF1252-2010)
Description (Translated English)	Calibration specification for measuring instrument for laser paralleism of micrometers
Sector / Industry	Metrology & Measurement Industry Standard
Classification of Chinese Standard	A52
Classification of International Standard	17.040
Word Count Estimation	21,249
Date of Issue	2010-05-11
Date of Implementation	2010-11-11
Older Standard (superseded by this standard)	JJG 828-1993
Quoted Standard	JJF 1001-1998; JJF 1094-2002; JJF 1088-2002; JJF 1130-2005; JJG 21-2008
Regulation (derived from)	AQSIQ Announcement No. 50 of 2010
Issuing agency(ies)	General Administration of Quality Supervision, Inspection and Quarantine
Summary	This standard applies to parallel laser micrometer inspection instrument calibration.

JJF 1252-2010: Calibration specification for measuring instrument for laser paralleism of micrometers

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration specification for measuring instrument for laser paralleism of micrometers People's Republic of China National Metrology Technical Specifications Laser micrometer parallel tester calibration specification Issued on. 2010-05-11 2010-11-11 implementation The State Administration of Quality Supervision, Inspection and Quarantine released Laser micrometer parallel tester calibration specification Instead of JJG828-1993 This specification by the State Administration of Quality Supervision, Inspection and Quarantine approved on May 11, 2010, and from From November 11, 2010 into effect. NFP. National Engineering Geometrical Parameters Measurement Technology Committee Main drafting unit. Tianjin Institute of Metrological Supervision Inspection Participated in the drafting. Zigong Dongfang Boiler (Group) Co., Ltd. China Shipbuilding Industry Wuhan Integrated Metrology and Inspection Station This specification by the National Engineering Geometrical parameter measurement technology committee responsible for the interpretation The main drafters of this specification. Liu Jiali (Tianjin Supervision and Inspection Institute of Metrology) Luray Jun (Tianjin Supervision and Inspection Institute of Metrology) Tian Yong (Tianjin Supervision and Inspection Institute of Metrology) Drafters participate. Chen Yongling (Zigong Dongfang Boiler (Group) Co., Ltd.) Mei Lijiang (China Shipbuilding Industry Wuhan Integrated Metrology and Inspection Station)

1 Scope (1) 2. Referenced Documents (1) 3 Overview (1) 4 Metrological characteristics (2) 4.1 Indication error activity scale (2) 4.2 scale activity center of rotation and offset tolerances center of the circle (2) 4.3 Indication error (2) 4.4 Measurement repeatability (2) Calibration Condition 5 (2) 5.1 environmental conditions (2) 5.2 Calibration standard device and other equipment (3) 6 calibration items and calibration methods (3) 6.1 Indication error activity scale (3) 6.2 Activity ruler rotational center of the center of the circle tolerance offset (3) 6.3 Indication Error (4) 6.4 Measurement repeatability (5) 7 Calibration Results The expression (6) 8 recalibration intervals (6) Appendix A laser micrometer parallel tester indication error measurement Uncertainty Evaluation (7) Appendix B with indexing is 1 "from the collimator test parallelism Calibrator indication error example of data processing (13) Appendix CD, d value and the mask at the event scale conversion table (14) Appendix D calibration certificate contents (16) Laser micrometer parallel tester calibration specification

1 Scope

This instruction applies to parallel laser micrometer to check the calibration.

2 Citations

This specification references the following documents. JJF 1001-1998 common measurement terms and definitions JJF 1094-2002 measuring instrument characteristics evaluation JJF 1088-2002 outside micrometer (measuring range 500mm ~ 3000mm) calibration specification JJF 1130-2005 geometric measurement equipment calibration Uncertainty Evaluation Guide JJG21-2008 micrometer When using this specification it should be noted that using the currently valid version of the documents cited.

3 Overview

Laser micrometer parallel tester (referred to as the parallel tester) is the use of laser interference principle, outside micrometer measurements Micrometer (measuring range 150mm ~ 2000mm) measured parallel to the surface of the two special instruments. Instrument through an optical system The laser emits light irradiation were measured in two micrometer measuring surface successively formed on the mask at two interference Ring, two sets of interference by measuring the distance from the center of the ring to determine the measured two micrometer measuring surface parallelism. Instruments schematic outline Figure 1, the optical instrument system diagram shown in Figure 2. Figure 1 a schematic outline parallel tester 1- fixed mirrors; 2- mask at; 3-D feet; 4- movable mirror; 5- table; 6-d feet; 7- standard prisms; 8- measured outside micrometer; 9- Laser

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