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GB/T 5095.2504-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4: Test 25d: Propagation delay
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Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4: Test 25d: Propagation delay
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GB/T 5095.2504-2021
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Basic data | Standard ID | GB/T 5095.2504-2021 (GB/T5095.2504-2021) | | Description (Translated English) | Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4: Test 25d: Propagation delay | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | L23 | | Word Count Estimation | 14,129 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 5095.2504-2021: Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4: Test 25d: Propagation delay
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Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 25-4.Test 25d. Propagation delay
ICS 31.220.10
L23
National Standards of People's Republic of China
Electromechanical components for electronic equipment
Basic test procedures and measurement methods
Part 25-4.Test 25d. Transmission Delay
(IEC 60512-25-4.2001,Connectorsforelectronicequipment-Testsand
Released on 2021-03-09 Implemented on 2021-10-01
State Administration of Market Supervision and Administration
Issued by the National Standardization Management Committee
Table of contents
Foreword Ⅲ
1 General 1
1.1 Scope and purpose 1
1.2 Terms and definitions 1
2 Test facility 1
2.1 Equipment 1
2.2 Device 1
3 Test sample 2
3.1 Description 2
4 Test procedure 3
4.1 Probe Method 3
4.2 Insertion method 3
4.3 Standard Device Method 3
5 Rules to be stipulated by relevant standards 3
6 Test record file 4
Appendix A (Normative Appendix) Diagram of Plants and Equipment 6
Appendix B (Informative Appendix) Practical Guide 9
Foreword
GB/T 5095 "Basic test procedures and measurement methods for electromechanical components for electronic equipment" is divided into several parts according to the test methods.
Part 25 of GB/T 5095 is a signal integrity test. The parts that have been released or planned to be released are as follows.
---Part 25-1.Test 25a. Crosstalk ratio;
---Part 25-2.Test 25b. Attenuation (insertion loss);
---Part 25-3.Test 25c. Rise time decay;
---Part 25-4.Test 25d. Transmission delay;
---Part 25-5.Test 25e. Return loss;
---Part 25-6.Test 25f. Eye diagram and jitter;
---Part 25-7.Test 25g. impedance, reflection coefficient and voltage standing wave ratio (VSWR);
--- Part 25-9.Signal Integrity Test Test 25i. Alien Crosstalk.
This part is part 25-4 of GB/T 5095.
This section was drafted in accordance with the rules given in GB/T 1.1-2009.
The translation method used in this part is equivalent to the IEC 60512-25-4.2001 "Connector Test and Measurement for Electronic Equipment Part 25-4"
Minutes. Test 25d. Transmission delay.
This section has made the following editorial changes.
---The name of the standard is changed from "Test and Measurement of Connectors for Electronic Equipment Part 25-4.Test 25d. Transmission Delay" to "Electrical
Basic test procedures and measurement methods for electromechanical components for sub-equipment. Part 25-4.Test 25d. Transmission delay.
Please note that some of the contents of this document may involve patents. The issuing agency of this document is not responsible for identifying these patents.
This part was proposed by the Ministry of Industry and Information Technology of the People's Republic of China.
This part is under the jurisdiction of the National Standardization Technical Committee of Electromechanical Components for Electronic Equipment (SAC/TC166).
Drafting organizations of this section. Sichuan Huafeng Enterprise Group Co., Ltd., China Electronics Standardization Institute.
The main drafters of this section. Pang Bin, Zhu Ming, Xiao Miao, Liu Jun, Wang Qilong.
Electromechanical components for electronic equipment
Basic test procedures and measurement methods
Part 25-4.Test 25d. Transmission Delay
1 General
1.1 Scope and purpose
This part of GB/T 5095 applies to electrical connectors, sockets, cable assemblies or interconnecting systems.
This section describes the method of measuring the time required for a digital signal to be transmitted from a specified location to a second specified location.
1.2 Terms and definitions
The following terms and definitions apply to this document.
1.2.1
Measurement system rise time measurement system rise time
Rise time measured by a device with no sample installed and with filtering (or normalization) function. Usually, the measurement is 10%~
90% level rise time (see Figure 1).
1.2.2
Sampleenvironmentimpedance
The impedance caused by the device on the sample signal wire. The impedance is determined by the transmission line, terminal resistance, attached receiver or signal source
And the parasitic effects of the device.
1.2.3
Transmission delay
The time required for the signal to travel between two specified locations in the interconnected system (see Figure 2).
2 Test facility
2.1 Equipment
2.1.1 Pulse generator and oscilloscope, time domain reflectometer (TDR) or a measuring system whose rise time is less than or equal to the measured transmission delay
Other suitable equipment.
2.1.2 Probe
If a probe is used, the probe should have suitable rise time performance and circuit load characteristics (resistance and capacitance).
2.2 Device
Unless otherwise specified in the reference document, the environmental impedance of the sample should match the impedance of the test equipment. Generally, for single-ended measurements, the resistance
The impedance is 50Ω, and the differential measurement is 100Ω. The schematic diagram of the device and equipment is shown in Appendix A.
2.2.1 Method A, single-ended
The device should be able to excite one signal line at a time. The excitation circuit should be terminated with the sample environmental impedance according to one of the methods in Figure A.2.except
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