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GB/T 46973-2026: Technical specifications for high temperature superconducting thin films of microwave passive devices
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Technical specifications for high temperature superconducting thin films of microwave passive devices
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Standard similar to GB/T 46973-2026
GB/T 42512 | GB/T 41662 | GB/T 40004 | GB/T 26045 | GB/T 20424 | Basic data
| Standard ID | GB/T 46973-2026 (GB/T46973-2026) |
| Description (Translated English) | Technical specifications for high temperature superconducting thin films of microwave passive devices |
| Sector / Industry | National Standard (Recommended) |
| Classification of Chinese Standard | H62��L90 |
| Classification of International Standard | 29.050,31.030 |
| Word Count Estimation | 14,185 |
| Date of Issue | 2026-01-28 |
| Date of Implementation | 2026-08-01 |
| Issuing agency(ies) | State Administration for Market Regulation, Standardization Administration of China |
GB/T 46973-2026: Technical specifications for high temperature superconducting thin films of microwave passive devices
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 29.050;31.030
CCSH62;L90
National Standards of the People's Republic of China
Technical Specifications for High-Temperature Superconducting Thin Films for Microwave Passive Devices
Published on 2026-01-28
Implemented on August 1, 2026
State Administration for Market Regulation
The State Administration for Standardization issued a statement.
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents".
Drafting.
Please note that some content in this document may involve patents. The issuing organization of this document assumes no responsibility for identifying patents.
This document was proposed by the Chinese Academy of Sciences.
This document is under the jurisdiction of the National Technical Committee on Standardization of Superconductivity (SAC/TC265).
This document was drafted by. Tianjin Haixin Electronics Co., Ltd., Institute of Physics, Chinese Academy of Sciences, University of Electronic Science and Technology of China, and Songshan Lake Materials Laboratory.
The laboratory, Nankai University, and the 16th Research Institute of China Electronics Technology Group Corporation.
The main drafters of this document are. Ji Laiyun, Sun Yandong, Gao Zeyu, Wu Yun, Yang Jingting, Zeng Cheng, Tao Bowan, Ji Lu, and Xu Youping.
Technical Specifications for High-Temperature Superconducting Thin Films for Microwave Passive Devices
1 Scope
This document specifies the technical requirements, packaging, marking, transportation, and storage of high-temperature superconducting thin films for microwave passive devices, and describes the corresponding test procedures.
Verification method.
This document applies to high-temperature superconducting thin films used in microwave passive devices within the field of superconducting materials science.
2 Normative references
The contents of the following documents, through normative references within the text, constitute essential provisions of this document. Dated citations are not included.
For references to documents, only the version corresponding to that date applies to this document; for undated references, the latest version (including all amendments) applies.
This document.
GB/T 14140 Method for testing the diameter of semiconductor wafers
GB/T 17711 Test method for DC resistance of yttrium barium copper oxide (123 phase) superconducting thin films at critical temperature Tc
GB/T 22586 Electronic Properties Measurement - Surface Resistance of Superconductors at Microwave Frequencies
GB/T 28786-2012 Vacuum Technology - Method for Measuring the Bond Strength of Vacuum Coated Layers - Adhesive Tape Method
GB/T 30857 Test method for thickness and thickness variation of sapphire substrates
GB/T 33826 Stylus profilometer method for measuring the thickness of nanofilms on glass substrates
GB/T 36969 Method for determining the thickness of nanofilms using atomic force microscopy in nanotechnology
GB/T 39843-2021 Measurement of Electronic Properties. Local Critical Current Density and Its Distribution in Large-Area Superconducting Films
3 Terms and Definitions
The following terms and definitions apply to this document.
3.1
Thin-layer superconductors with an average thickness of less than 1 μm grown on a specific substrate material.
Note 1.The substrate material is usually a single crystal material.
Note 2.Superconducting thin films are usually prepared by physical vapor deposition, chemical vapor deposition or other processes.
3.2
critical temperature
Tc
The highest temperature at which a superconductor exhibits superconductivity is reached under zero current and zero magnetic field strength.
[Source. GB/T 2900.100-2017, 815-10-09]
3.3
Jc
The current density across the entire cross-section of a conductor when the current through it is the critical current.
[Source. GB/T 2900.100-2017, 815-12-03, with modifications]
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